Nanonics MultiView 2000™ Product Presentation. MultiView 2000 ™ Complete System MultiView 2000™ Product Presentation.

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Presentation transcript:

Nanonics MultiView 2000™ Product Presentation

MultiView 2000 ™ Complete System MultiView 2000™ Product Presentation

SPM modes: AFM contact AFM Intermittent contact mode Electrical Measurements Near Field Modes (NSOM): Reflection Transmission Collection Fluorescence Photo-Luminescence Far Field Methods: Standard Microscope Imaging Fluorescence Confocal Modes of Operation MultiView 2000™ Product Presentation

Modes of Operation Enabled by patented 3D- FlatScan TM Technology & Cantilevered NSOM/AFM probes MultiView 2000™ Product Presentation

Easy Integration with Optical Microscopes Dual - Upright /Inverted Optical Microscope MultiView 2000™ Product Presentation

Illumination Sources Illumination through the fiber using a Fiber Coupler Nd-YAG Laser (532 nm) Ar + -Laser (488 & 515 nm) HeCd-Laser (325 nm) Diode Laser (Vis – IR) Femtosecond Laser Fiber coupler and laser MultiView 2000™ Product Presentation

Detection System Reflection mode detector Transmission mode detector Detectors on the Microscope ports APD (Vis) PMT (UV – VIS) InGaAs (IR) Fiber adapter for the connection to a Spectrometer or Monochromator … Collection mode detector MultiView 2000™ Product Presentation

Tuning Fork Feedback Unique tuning fork technology using a tapered and cantilevered NSOM or AFM probe. Probes are premounted on the tuning fork. Tuning fork Probe Glue MultiView 2000™ Product Presentation

Standard NSOM/SPM Technology Cylindrical Piezo Probe is not Optical, microRaman or Electron/Ion Beam Friendly neither from the top nor bottom MultiView 2000™ Product Presentation

The MultiView 2000 ™ Technology Flat Scanner Probe is Optical, microRaman or Electron/Ion Beam Friendly from the top and the bottom MultiView 2000™ Product Presentation

Nanonics 3D-Flatscan™ 2 Flat Scanner: sample scanning and/or tip scanning Only 7 mm thick 140  m X-Y-Z scan range Central opening providing clear optical axis Inertial motion positioning of sample (6 mm) MultiView 2000™ Product Presentation

Nanonics 3D-Flatscan™ with Closed Loop Sensors Capacitive displacement sensors Precise positioning and scanning Additional Z-sensor available Central opening providing clear optical axis Inertial motion positioning of sample (6 mm) Nanonics 3D-Flatscan ™ with X-Y closed loop sensors MultiView 2000™ Product Presentation

Versions of the MultiView 2000 ™ Tip and sample scanning Scanning with the tip, the sample or tip and sample Tip scanning Scanning only with the tip. Free space setup, enabling imaging of large samples. MultiView 2000™ Product Presentation