2.008 -Spring 20041 2.008 Process Control. 2.008 -Spring 20042 Outline 1.Optimization 2.Statistical Process Control 3.In-Process Control.

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Presentation transcript:

Spring Process Control

Spring Outline 1.Optimization 2.Statistical Process Control 3.In-Process Control

Spring What is quality?

Spring Variation: Common and Special Causes Pieces vary from each other: But they form a pattern that, if stable, is called a distribution: Size

Spring Common and Special Causes (contd) Distributions can differ in… …or any combination of these Size LocationSpreadShape

Spring Common and Special Causes (contd) If only common causes of variation are present, the output of a process forms a distribution that is stable over time and is predictable: Size Prediction Time

Spring Common and Special Causes (contd) IF special causes of variation are present, the process output is not stable over time and is not predictable: Size Prediction Time

Spring Variation: Run Chart Specified diameter = / Diameter of part Run number Process change

Spring Process Control In Control (Special causes eliminated) Out of Control (Special causes present) Time Size

Spring Statistical Process Control 1.Detect disturbances (special causes) 2.Take corrective actions

Spring Central Limit Theorem A large number of independent events have a continuous probability density function that is normal in shape. Averaging more samples increases the precision of the estimate of the average.

Spring Shewhart Control Chart Average (of 10 samples) Diameter Run number Upper control limit Lower control limit

Spring Sampling and Histogram Creation Wheel of Fortune: Equal probability of outcome 1-10, P=0.1 Taking 100 random samples, the resulting histogram would look like this Taking random samples, the resulting histogram would look like this Frequency Outcome Frequency Outcome

Spring Sampling and Histogram Creation (contd) Wheel of Fortune: Equal probability of outcome 1-10, P=0.1 Take 10 random samples, calculate their average, and repeat 100 times, the resulting histogram would resemble Take 10 random samples, calculate their average, and repeat times, the resulting histogram would approach the continuous distribution shown Frequency Outcome

Spring Uniform Distributions Underlying Distribution Probability distribution Probability distribution Distribution resulting from averaging of 2 random values Distribution resulting from averaging of 3 random values Distribution resulting from averaging of 10 random values

Spring Normal Distribution Distribution resulting from averaging of 3 random values Distribution resulting from averaging of 10 random values Underlying Distribution Distribution resulting from averaging of 2 random values

Spring Precision Not precisePrecise Not accurate Accurate

Spring Shewhart Control Chart Upper Control Limit (UCL), Lower Control Limit (LCL) Subgroup size ( 5 < n < 20 )

Spring Shewhart Control Chart (contd) Control chart based on 100 samples Average (of 10 samples) Diameter Run number Upper control limit Lower control limit Step disturbance

Spring Shewhart Control Chart (contd) Average (of 10 samples) Diameter Run number Upper control limit Lower control limit Step disturbance Control chart based on average of 10 samples, note the step change that occurs at run 51

Spring Control Charts 1.Collection: Gather data and plot on chart. 2.Control Calculate control limits from process data, using simple formulae. Identify special causes of variation; take local actions to correct. 3.Capability Quantify common cause variation; take action on the system. These three phases are repeated for continuing process improvement. Upper control limit Process average Lower control limit Run number

Spring Setting the Limits Idea: Points outside the limits will signal that something is wrong-an assignable cause. We want limits set so that assignable causes are highlighted, but few random causes are highlighted accidentally. Convention for Control Charts: Upper control limit (UCL) = x + 3σ sg Lower control limit (LCL) = x-3σ sg (Where σ sg represents the standard deviation of a subgroup of samples)

Spring Setting the Limits (contd) Convention for Control Charts (contd): As n increases, the UCL and LCL move closer to the center line, making the control chart more sensitive to shifts in the mean.

Spring Benefits of Control Charts Properly used, control charts can: Be used by operators for ongoing control of a process Help the process perform consistently, predictably, for quality and cost Allow the process to achieve: –Higher quality –Lower unit cost –Higher effective capacity Provide a common language for discussing process performance Distinguish special from common causes of variation; as a guide to local or management action

Spring Process Capability Lower specification limit Upper specification limit In Control and Capable (Variation from common cause reduced) In Control but not Capable (Variation from common cause excessive) Size Time

Spring Process Capability Index 1.Cp = Range/6 2.Cpk

Spring Process Capability Take an example with: Mean =.738 Standard deviation, σ =.0725 UCL = LCL = Normalizing the specifications:

Spring Process Capability (contd) Using the tables of areas under the Normal Curve, the proportions out of specification would be: P UCL = P LCL = P total = The Capability Index would be: C PK = Z min /3 = 2.23 / 3 = 0.74

Spring Process Capability (contd) If this process could be adjusted toward the center of the specification, the proportion of parts falling beyond either or both specification limits might be reduced, even with no change in Standard deviation. For example, if we confirmed with control charts a new mean = 0.700, then:

Spring Process Capability (contd) The proportions out of specification would be: P UCL = P LCL = P total = The Capability Index would be: C PK = Z min /3 = 2.76 / 3 = 0.92

Spring Improving Process Capability To improve the chronic performance of the process, concentrate on the common causes that affect all periods. These will usually require management action on the system to correct. Chart and analyze the revised process: –Confirm the effectiveness of the system by continued monitoring of the Control Chart