Resistive Strips Preparation - with carbon sputtering -

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Presentation transcript:

Resistive Strips Preparation - with carbon sputtering - Atsuhiko Ochi, Kobe University 05/11/2013 MM General meeting@ CERN

Requirements for ATLAS NSW MM +HV Mesh (GND) High position resolution for one dimension <100 μm for eta direction. (Resolution of a few cm is allowed for second coordinate.) Tolerant for high rate HIP particles ~ 5kHz/cm2 Resistive layer should be formed as strips Resistivity: ~20MΩ/cm To protect from spark Mass production should be available, with large size (1m) ~2000 board should be produced in half year. Low cost A. Ochi, MM General Meeting 05/11/2013

Two option for resistive electrodes Screen printing Already several prototypes (@ CERN and Japan) has been produced. Made from carbon loaded polymer. Large size (>1m2) is available 400 μm pitch was available for MAMMA production. Sputtering with lift off process New technique. Just first two prototypes (10cm x 10cm MM) are available at June. Fine pattern (~10μm) is available. Large size (>1m2) is available in industrial facilities. Production quality is very well. It is not affected by production environment A. Ochi, MM General Meeting 05/11/2013

Liftoff process using sputtering Photo resist (reverse pattern of surface strips) Very fine structure (a few tens micro meter) can be formed using photo resist. (same as PCB) Surface resistivity can be controlled by sputtering material and their thickness @PCB company (Laytech inc.) Substrate (polyimide) Metal/Carbon sputtering @Sputtering company (Be-Sputter inc.) Substrate (polyimide) Developing the resists @PCB company (Laytech inc.) Substrate (polyimide) A. Ochi, MM General Meeting 05/11/2013

Sputtering facilities Large size sputtering is available 4.5m x 1m for flexible film Be-Sputter Co. Ltd. (Kyoto Japan) Vacuum chamber (with Ar gas) Rotating drum 4.5 m round Sample Sputtering target A. Ochi, MM General Meeting 05/11/2013

Prototype of small MicroMEGAS June, 2013 The readout board consists of Readout strips (Rigid PCB). Resistive strip foil (Polyimide film). Fine strip pitch of 200 μm is formed on 25μm polyimide foil. More fine structure will be available. Surface resistivity: 1M/sq. With 300Ǻ carbon+50Ǻ tungsten Substrate thickness : 60 μm. (25μm polyimide & 35μm bonding film) Mesh was formed by bulk MM technique. Carbon (300-600Å) Tungsten (10-50Å) Substrate (polyimide) Mesh Resistive strips (sputtered) Pillar 25μm Flexible foil (polyimide) 35μm Bonding film Readout strips Rigid PCB (epoxy) A. Ochi, MM General Meeting 05/11/2013

Fast neutron test (2013/6/1723) The first beamtest for sputtering MPGD Gain curve of 5.9 keV X-ray. Drift = -300V Drift spacing: 5mm Gas: Ar(93%) + CO2(7%) Fast Neutron test Spark probability @Kobe Univ. 17-23 Jun. 2013 HV current log under intense neutron. Neutron intense : ~ 105 cps/cm2. 0.01V correspond to 1 μA ~600nA of base current was found while beam ON. neutron Drift -HV (~-300V) Anode = ~500V A Very preliminary 1 μA Be(d, n)B A. Ochi, MM General Meeting 05/11/2013

Before and after test No destruction is observed on the resistive strips between before and after neutron test A. Ochi, MM General Meeting 05/11/2013

Cosmic test using 4 chambers MM x 4 + Scintillators + APV25 x 8 SRS system Cosmic test bench using 4 MMs Now taking data More tune needed … 2GeV electron beamtest is planed from 18th November At Spring-8 BL33 beamline A. Ochi, MM General Meeting 05/11/2013

Further improvements and tests for carbon sputtering Requirements for carbon strips Resistive control 20 MΩ/cm is required It correspond to 600kΩ/sq. (our first prototype has 10MΩ /sq.) Thicker carbon sputter is required Long time stability of resistivity The resistivity of early prototypes were growing up as time goes on (~2%/day) It was thought that the oxidation of metal (tungsten layer) Is the carbon sputtering without metal layer possible? Mechanical / chemical robustness test Peeling off property (cross cut method) Resistive stability against the bending of the foil Chemical stabilities For alkali and acid, used for PCB process. A. Ochi, MM General Meeting 05/11/2013

Thick carbon (only) sputtering Early prototype: New prototype: (delivered at September) Tungsten (10-50Ǻ) +Carbon (300-600Ǻ) Lower resistivity (<1MΩ/sq.) was available using thickness control of the metal. Carbon only, 3600Ǻ Surface resistivity ~ 500kΩ/sq. No time variation founds after several days from sputtering Time variation founds (~2%/day) after several weeks from sputtering Carbon (3600Å) Carbon (300-600Å) Tungsten (10-50Å) Substrate (polyimide) Substrate (polyimide) No time variation founds ~2%/day A. Ochi, MM General Meeting 05/11/2013

Mechanical robustness for new sputtering carbon Cross-cut test (JIS k5400-8.5) Adhesion test Cross-cut test (JIS k5400-8.5 standard, similar to the ISO 2409) No peeled carbon founded Bending test Bending diameter > 4cm  No resistivity change found Jackknife bending  Conductivity is lost Bending diameter = 1.2cm  Outer wrap: resistivity is increased 10-20%  Inner wrap: no resistivity change Making cut lines as grid (11 x 11, 1mm pitch) Tape up the foils strongly 0.51MΩ/sq.  0.57M Ω/sq. (+12%) Peel off the tape at once After bending Before bending Observe the tape and foils. 0.44MΩ/sq.  0.44M Ω/sq. (0%) Before bending After bending A. Ochi, MM General Meeting 05/11/2013

Chemical robustness for new sputtering carbon Acid and alkali for PCB processing Hydrochloric acid Nitric acid Sulfuric acid Sodium carbonate  No damage on sputtered carbon Sodium hydroxide  No damage for short dip  Peeling is found after 90 minutes dipping Almost all process of PCB production will not affect to the sputtering carbon A. Ochi, MM General Meeting 05/11/2013

Prototype of large MMs Readout board We can divide the production process of resistive strip from that of readout board. Resistive strip is formed on thin foil We don’t need fine alignment between resistive strips and readout strips. Dividing those processes will make the yield of production growing up. We are preparing the large resistive strip foil. Size of foils: 500mm x 1000mm 4 foils are need for a quadruplet 8 Foils (4 foils and 4 spare) were delivered to us at 25th October. Some basic resistive parameters are checked. I brought them to CERN today. Resistive Strip foil A. Ochi, MM General Meeting 05/11/2013

For patterning process: Laytech inc. PCB company They are expert for FPC (Flexible Printed Circuit) production. Liftoff is basic process for FPC production Exposure machines in clean room Electro forming machines Etching machines A. Ochi, MM General Meeting 05/11/2013

Large resistive strip foil 866.4mm 425.3mm A. Ochi, MM General Meeting 05/11/2013

Enlarged picture of resistive strip foil 10 mm 1 mm 0.3 mm A. Ochi, MM General Meeting 05/11/2013

Resistivity check B We have no systematic way for resistivity test yet, so these results are based on rough measurements. However, we have check surface resistivity on several points for 8 foils as figure. The prove has about 2cm width. Distance between proves are, A,B,C: 1.5-2.5 cm, D: 30 cm, E: cross over a center line. “Inf” means more than 50MΩ. C A D E Unit: MΩ No. A B C D E 1 1.4 4 15 6 Inf 2 2.7 2.2 9.5 3 1.5 13.1 8.3 2.8 11 6.6 5 1.8 10.5 6.3 1.9 2.1 10 6.9 7 2.5 2.3 10.6 7.4 8 2.4 12.3 7.3 A. Ochi, MM General Meeting 05/11/2013

Resistivity check from Resistivity from edge to lattice point (10cm x 10cm) were measured. Prove shape is point like. Foil: No.1, Unit: MΩ 14.5 13.3 20.1 20.5 16.1 13.0 13.4 21.2 20.0 15.4 10.5 10.4 15.6 22.3 17.2 16.0 9.0 18.8 20.4 20.6 18.2 15.0 15.2 30.2 31.5 44.1 45.0 34.4 26.7 A. Ochi, MM General Meeting 05/11/2013

Conclusion Prototype of MicroMEGAS using sputtered resistive electrodes were produced and tested. It works as same as conventional resistive strip MicroMEGAS Gain curve, operation in HIP were tested. It’s OK. We are checking position/timing properties. Carbon sputtering process is improved for ATLAS MicroMEGAS Appropriate resistivity ~ 500kΩ/sq. Good mechanical/chemical properties Large resistive strip foils are produced for large quadruplet. Qualitative resistivity check is ok. Systematic check for QA is needed. A. Ochi, MM General Meeting 05/11/2013