1 (Company Confidential) XRF Metrology Tools for Solar Photovoltaic Manufacture Company Confidential

2 (Company Confidential) Age of Solid State Energy PV Efficiency Gains & Cost Reduction will achieve Convergence With Fossil Fuel Grid Costs Solar Metrology: The Convergence

3 (Company Confidential)  Low-cost solar PV factories of the future will utilize:  New Materials: R&D  Products: Process  Develop and commercialize new low cost solar PV panels through capacity ramp and yield management. Solar Metrology: The Market Driver

4 (Company Confidential) Solar Metrology: The Market Potential  PV Metrology Equipment Market: $5 billion TAM projected by One Trillion-Dollar Global Electricity Generation Industry  Solar PV currently <1% of total annual electric power generation worldwide.  Solar PV market share in vicinity of 10% anticipated by 2020.

5 (Company Confidential) Solar Metrology: What We Do We Provide an Enabling Technology…  Solar Metrology tools are required to manufacture the active layer in photovoltaic (PV) cells that converts sunlight to electricity.  Solar Metrology technology enables manufacturers to conduct R&D, control processes and manage yield to produce high-efficiency, low-cost commercial solar PV panels. TCO Window Layer (CdS) CIGS Back Contact (Mo) Glass, Stainless, Plastic CIGS Layer

6 (Company Confidential) Mo CIGS CdS Substrate Photons from the X-Ray tube impinge on the sample material (CdS or CIGS/Electrode Layer/Substrate). Atoms are ionized and fluoresce characteristic emissions that are collected by a detector then amplified, digitized, and sorted into a histogram (intensity vs. energy – spectrum) and displayed Solar Metrology: How We Do It

7 (Company Confidential) Solar Metrology: Who Will Do It THE SOLAR MANAGEMENT TEAM…  Has over 100 years cumulative experience in the XRF business.  Formed Matrix Metrologies in 2003  Has existing base of success to leverage in transition to solar.  Has designed and marketed six XRF product lines, with an installed base in excess of 5000 units.  Members have held key management positions at Thermo, Veeco Instruments, Fisons and Kevex.

8 (Company Confidential) Solar Metrology: Who Will Do It MANAGEMENT TEAM:  FRANK REILLY: President & Sales/Marketing Director (Principal) Successfully managed Matrix Metrologies as a going concern for five years. (Years XRF Experience: 22)  FRANK FERRANDINO: V.P. & Dir. of Technology/Project Management (Principal) Patented X-ray optical beam and detector column with vacuum conduit; developed and patented NIST-traceable metal calibration standards. (Years XRF Experience: 26)  JIM BOGERT: Director, Domestic Sales, Spectroscopist (Principal) Developed advanced mathematical methods for spectral analysis; extensive surface analysis, materials engineering and sales force management experience. (Years XRF Experience: 26)  IGOR LENICKY: Director, International Sales, QC Engineer (Principal) Experienced global marketer of advanced technology-based instrumentation. (Years XRF Experience: 30)  TIM CAHANEY: Director, Marketing/Product Management (Principal) Experienced in development of process and metrology equipment solutions for semiconductor industry and Polytechnic Inst. of NY graduate (Years Semi Experience: 30) BOARD OF DIRECTORS: Frank Reilly, Frank Ferrandino, Walter Scherr ADVISORS:  WALTER SCHERR: Founder of Panafax (first commercially availably fax machine), Litton, Sperry and Veeco Instruments; operated XRF Industrial Measurement Group at Veeco.  EDWARD BRAUN: MBO Veeco instruments (1991); CEO Veeco; President of SEMI and Solar Product Development Specialist at Veeco.

9 (Company Confidential) Solar Metrology: Product Platforms Our Products SMX-BEN, SMX-ILH, SMX-ISI The System SMX is a unique family of three platforms designed exclusively for the Photovoltaic manufacturing industry for multi-layer thickness and composition measurements of flexible or rigid substrates. Presently containing XRF technology it allows for the inclusion of other “best-of- breed” measurement technologies.  SMX-BEN for Bench top Measurements  SMX-ILH for In-Line, Near-Line Atmospheric Measurements- Integrated or Remote X-Ray head; Static, Linear, and Dual-Axis Configurations  SMX-ISI for In-situ Vacuum Measurements- Static or Linear X-Ray head Configurations

10 (Company Confidential) Solar Metrology: Tool Insertion Points XRF Tool Insertion Points  R&D, Process development, Failure analysis Material selection, Layer formulations  Off-Line Process Control Detailed individual Product Sampling  Yield Management In-line and In-situ measurement of PV cells and panels

11 (Company Confidential) Solar Metrology: Moving Forward Future PV Manufacturing Requirements  Capacity Ramp of existing technology  Enhanced Yield Management  Continuous Gains in Conversion Efficiency Future Solar Metrology Requirements  Expansion of global distribution channels  Rapid product development  Procurement of additional metrology Methods