CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY.

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CEN 281 Electronic Circuits and Devices Spring Term CEN 281 Electronic Circuits and Devices Spring Term INTERNATIONAL BURCH UNIVERSITY DEPARTMENT of ELECTRICAL & ELECTRONICS ENGINEERING Gunter Senyurt

Timetable and office hours Class Schedule: Tuesday 17:00-19:45 Class Schedule: Tuesday 17:00-19:45 Office Hour: Open Door Policy Office Hour: Open Door Policy

Course Objectives The student will become proficient in the use of algebra, calculus, and linear algebra to describe and analyze DC and AC electric circuit problems. The student will become proficient in the use of algebra, calculus, and linear algebra to describe and analyze DC and AC electric circuit problems. The student will become proficient in the use of Kirchhoff’s laws of Voltage and Current to analyze electrical circuits, utilizing the techniques of mesh and nodal analysis. The student will become proficient in the use of Kirchhoff’s laws of Voltage and Current to analyze electrical circuits, utilizing the techniques of mesh and nodal analysis. Review of solid-state device characteristics and circuit analysis. Review of solid-state device characteristics and circuit analysis.

Textbooks *James W. Nilsson, Susan A. Riedel. Electric Circuits, 7th Edition, Pearson *Robert L.Boylestad, Louis Nashelsky, Electronic Devices and Circuit Theory, 10 th Edition, Pearson

Brief Contents Ch. 1: Circuit Variables. Ch. 2: Circuit Elements. Ch. 3: Simple Resistive Circuits. Ch. 4: Techniques of Circuit Analysis. Ch. 5: The Operational Amplifier. Ch.1 : Semiconductor Diodes Ch. 2 : Diode Applications Ch. 3 : Bipolar Junction Transistors Ch. 4 : DC Biasing-BJTs JFET, MOSFET, FET amplifiers Overviews

Grading Lab. Sessions 25% Quiz 10% Midterm Exam 25% Final Examination 40%