IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results1 Our status, progress and results are summarized on IFIC – Valencia July 16, 2004 Peter Kodys With help from: Carlos Escobar and next: Vaso, Salva, Sergio, Pavel, Zdenek, Carlos L., Peter W.P., Carmen, Pepe, Pablo, Luis, Paco (cooperation of IFIC Valencia and CU Prague)

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results2 STATUS Laser Spot on Threshold Scan (No focused spot, two channel signal, first historical detection of laser on SCT module in IFIC)  Stable mechanical arrangement.  Laser detection in only one side (metal back side of detectors – no transparent for light).  Strip position detection working up to 1 minute.  Few method of focusing was tuned.  Automatic focusing done up to 20 minutes with precision 40um in z and 4 um in x.  The bond mixing test done up to 30 minutes per detector – test for production modules.  The channels from mask file tested independently using two methods.  The channels from external file tested.  No effect of interference between chip channels is observed.  Pulse shape reconstruction done.  Punch through (pin hole) channels test for response done.  Testing at low temperatures was tuned and is done up to –20 deg in chillers (4 deg in T-hybrid) in dry air or nitrogen  Automatic logbook generate and saved with all important information

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results3 Scheme of arrangement: Laser parameters and light interaction with silicon:  Laser energy of photon: eV  Wavelenght of light: 1060 nm  Real part of dielectric const.:  Imag part of dielectric const.:  Index of refraction:  Imag part of index of refr.: 0  Absorption coeficient: cm·¹  0.6mm Si: 35.2%  0.6mm Si: 24%  0.6mm Si: 40.8%  0.27mm Si:60.35% back side of Si reflected - metalized  0.27mm Si:0 % back side of Si reflected - metalized  0.27mm Si:39.65% back side of Si reflected - metalized

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results4 LASER SPOT TUNNING 1 Main conclusion: there is possibility to tune laser focusing to smallest spot using reflectivity from strip metal material to measure decreasing of signal from main testing strip, sensitivity of focusing of our type of laser output is very high, focus range is less 50 µm (from factory is declared good focus range about 1 mm). Auto focus algorithm: ~ 6 minutes - Based on TriggerBurst Scans in range of variable Z (dynamic focus) - Dynamic Threshold selection based on strip output - In each Z and X distance, we acquire Trigger Burst and Median Charge data. Then, we found the minimum in a 3D plot

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results5 LASER SPOT TUNNING 2 Main conclusion: method independent of starting point in range 3mm from focus give result up to 20 minutes, method use quick scan to find mid of strip in two position (1 minute per position) and find minimum between them with precision 200um. Minimum exist because reflect from strip metal material. Then start fine 2D scan in range 400 x 16 um to find focus point. Auto focus algorithm: ~ 20 minutes Find mid of channel and current strip pitch Scan in z to find a minimum (3mm range)Scan in x and z to find a minimum (400 x 16 um range)

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results6 Pulse shape reconstruction vs. interstrip position of laser spot was done. Also quality of laser spot was measured used fit of edges on metal conductive strip and was sigma um, strip width is um. Laser spot profile reconstruction with sigma ~ 3.3um Scan of medians in x uncorrected for start point shift Scan of medians in x – corrected, in middle part is response decreasing based on reflection of light from strip PULSE SHAPE RECONSTRUCTION

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results7 PULSE SHAPE RECONSTRUCTION Laser spot reconstruction Delay vs. x from pulse shape fitPeaking time vs. x from pulse shape fit 2D graph of medians in time shift vs. x, strip metal part is on point 0 where practically whole light beam is reflected out Pulse shape fit for all x positions Strip position

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results8 RE-BONDING SOME CHANNELS In the results, you can see the differencies... We re-bond some bonds to different positions to look dependence of chip channel stability base of neighbored high powered channel. The channels are detected in unexpected positions. We can calculate the bond mixing with presition. This is a good test to check the bonds. Channels re-bonded

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results9 CHANNEL POSITION SCAN 1 (PRODUCTION TEST) We use the re-bond module to do all test, so we found in this quick test the incorrect bounded channels. This test is preliminary and we are working on it. Now, we have good results in ~30 min per side (full channels test). Dead Chip Channel signal from Laser

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results10 CHANNEL POSITION SCAN 2 (PRODUCTION TEST) Response from trigger burst at some threshold over noise threshold, we expect response in range counts This test is for checking of response from all channels using laser spot, neighbours should have not additional response Results in ~30 min per detector (full channels test), 2 hours per module with 4 detectors. Using threshold at each channel decreasing of median from noise (threshold without laser spot invoking) 6 bad channels (4 dead and 2 noised) Special test of only bad channels response from mask file is tuned and is done.

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results11 BAD CHANNEL TEST (FOR PRODUCTION MODULES TEST) This test is for checking of response from bad channels based on mask file and compare it with neighbours channels Testing channels normalized to 1 used their neighbours: average of them was reference value, two channels shows some response but in very high level – un-trimm channels Testing channels (red) with their neighbours (blue), up: response – noise, bottom: response from channels and noise (yellow/green) Map of testing bad channels on module

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results12 PUNCH THROUGH (PIN HOLE) CHANNEL TEST This test is for checking of response from special channels and compare it with neighbours channels Testing channels normalized to 1 used their neighbours: average of them was reference value Testing channels (red) with their neighbours (blue), up: response – noise, bottom: response from channels and noise (yellow/green) Testing channels – histogram of normalized channels

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results13 STABILITY AND TEMPERATURE DEPENDENCES For many tests we need measurement with untrimmed channels (for measurement of un-trimable channels) and unmasked channels (for bad channel tests). For measurement of stability of measurements we use outer unirradiated module with Hamamatsu detectors in dry air atmosphere. Stability: 1.Measurement of channels response used median point from threshold scan with precision ±5mV 2.Differences between channels (no trimming) are ±17 mV (± 10% of signal from laser) 3.Differences between measurements are ±3 mV (± 2% of signal from laser) Temperature dependences: Noise is not depended from temperature in range 6 to 29 °C on Thybrid Response from channels depend from Thybrid: (2.4 ±0.3)mV/°C

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results14 HOW TO TEST MODULES USING SCTDAQ AND SPECIAL FUNCTIONS After to set position about 2mm or less from focused point you can find in trigger burst scan laser spot Typical window after an start laser tests: set right side and initialise L1A Laser Test mode (without calibration pulse)

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results15 HOW TO TEST MODULES USING SCTDAQ AND SPECIAL FUNCTIONS Computer: Silab05, starting commands:.x ST.cpp(); MoveZ(CloseToFocusPoin); Push Button: ´Top/Back side module 0 testing´ Push Button: ´Initialization L1A´ Push Button: 1 – 8 to start test you want To lost laser signal try: Push Button: ´Move TimeBin …´ 1a, 7, 8 – working OK in un-focusing.2 – 2.0mm 4. Auto Focus – is best and quick 6. Median charge scan need setting of delays using delay wires and before scan you must find good focus point and start from it All test produce log book text file in dir ´data´and program:.x ShowChTestGraphs(FileName,RunNo,SaveGraphs,TypeAnalysis); help you with interpretation of results of main type of tests. After test, my recommendation, always to restart ROOT session

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results16 PHOTOS 1 First arrangement of workspace Module in test box with window for laser spot, optical fibre for laser light (yellow cover), insulated plastic support for module Laser end with focusing lens above module sensor Black box with 2D stages inside and chiller below them

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results17 PHOTOS 2 Final arrangement of workspace Black box with module box connecting to cooling and DAQ electronics General view to laser tests workplace with black box (left) with 2D stages inside and chiller below them, readout electronics (right) and DAQ computer Block of connectors for in/out puts of cooling, air or nitrogen, optical fibre of laser light and command wires of position stages

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results18 PHOTOS 3 Final arrangement of workspace Position stages arrangement Laser end with focusing lens above module sensor and module test box with two windows for testing of both sensors (one is closed for save cool dry atmosphere inside) Production of dry cool air for module

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results19 General summary 1 STATUS OF LASER TEST WORKPLACE IN IFIC VALENCIA Laser Spot on Threshold Scan (No focused spot, two channel signal, first historical detection of laser on SCT module in IFIC)  Stable mechanical arrangement.  Laser detection in only one side (metal back side of detectors – no transparent for light).  Strip position detection working up to 1 minute.  Few method of focusing was tuned.  Automatic focusing done up to 20 minutes with precision 40um in z and 4 um in x.  The bond mixing test done up to 30 minutes per detector – test for production modules.  The channels from mask file tested independently using two methods.  The channels from external file tested.  No effect of interference between chip channels is observed.  Pulse shape reconstruction done.  Punch through (pin hole) channels test for response done.  Testing at low temperatures was tuned and is done up to –20 deg in chillers (4 deg in T-hybrid) in dry air or nitrogen  Automatic logbook generate and saved with all important information

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results20 CHANNEL POSITION SCAN (FOR PRODUCTION MODULES TEST) Response from trigger burst at some threshold over noise threshold, we expect response in range counts This test is for checking of response from all channels using laser spot, neighbours should have not additional response Results in ~30 min per detector (full channels test), 2 hours per module with 4 detectors. Using threshold at each channel decreasing of median from noise (threshold without laser spot invoking) 6 bad channels (4 dead and 2 noised) Special test of only bad channels response from mask file is tuned and is done. General summary 2

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results21 BAD CHANNEL TEST (FOR PRODUCTION MODULES TEST) General summary 3 This test is for checking of response from bad channels based on mask file and compare it with neighbours channels Testing channels normalized to 1 used their neighbours: average of them was reference value, two channels shows some response but in very high level – un-trimm channels Testing channels (red) with their neighbours (blue), up: response – noise, bottom: response from channels and noise (yellow/green) Map of testing bad channels on module

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results22 General summary 4 PUNCH THROUGH (PIN HOLE) CHANNEL TEST This test is for checking of response from special channels and compare it with neighbours channels Testing channels normalized to 1 used their neighbours: average of them was reference value Testing channels (red) with their neighbours (blue), up: response – noise, bottom: response from channels and noise (yellow/green) Testing channels – histogram of normalized channels

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results23 General summary 5 Pulse shape reconstruction vs. interstrip position of laser spot was done. Also quality of laser spot was measured used fit of edges on metal conductive strip and was sigma um, strip width is um. Scan of medians in x – corrected, in middle part is response decreasing based on reflection of light from strip 2D graph of medians in time shift vs. x, strip metal part is on point 0 where practically whole light beam is reflected out Pulse shape fit for all x positions Strip position Peaking time (up) and delay (down) vs. x from pulse shape fit PULSE SHAPE RECONSTRUCTION

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results24 General summary 6 LASER SPOT TUNNING Main conclusion: method independent of starting point in range 3mm from focus give result up to 20 minutes, method use quick scan to find mid of strip in two position (1 minute per position) and find minimum between them with precision 200um. Minimum exist because reflect from strip metal material. Then start fine 2D scan in range 400 x 16 um to find focus point. Autofocus algorithm: ~ 20 minutes Find mid of channel and current strip pitch Scan in z to find a minimum (3mm range) Scan in x and z to find a minimum (400 x 16 um range) Detail how sharp is focus point of laser spot

IFIC - Valencia Peter Kodys, July 16, 2004, internal workshop, status and results25 STABILITY AND TEMPERATURE DEPENDENCES For many tests we need measurement with untrimmed channels (for measurement of un-trimable channels) and unmasked channels (for bad channel tests). For measurement of stability of measurements we use outer unirradiated module with Hamamatsu detectors in dry air atmosphere. Stability: 1.Measurement of channels response used median point from threshold scan with precision ±5mV 2.Differences between channels (no trimming) are ±17 mV (± 10% of signal from laser) 3.Differences between measurements are ±3 mV (± 2% of signal from laser) Temperature dependences: Noise is not depended from temperature in range 6 to 29 °C on Thybrid Response from channels depend from Thybrid: (2.4 ±0.3)mV/°C General summary 7