Nanostructures Research Group Center for Solid State Electronics Research Quantum corrected full-band Cellular Monte Carlo simulation of AlGaN/GaN HEMTs.

Slides:



Advertisements
Similar presentations
Is Dual Gate Device Structure Better From a Thermal Perspective? D. Vasileska, K. Raleva and S. M. Goodnick Arizona State University Tempe, AZ USA.
Advertisements

Contact Modeling and Analysis of InAs HEMT Seung Hyun Park, Mehdi Salmani-Jelodar, Hong-Hyun Park, Sebastian Steiger, Michael Povoltsky, Tillmann Kubis,
Carrier and Phonon Dynamics in InN and its Nanostructures
Multisubband Monte Carlo simulations for p-MOSFETs David Esseni DIEGM, University of Udine (Italy) Many thanks to: M.De Michielis, P.Palestri, L.Lucci,
The Role of Long-Range Forces in Porin Channel Conduction S. Aboud Electrical and Computer Engineering Department, Worcester Polytechnic Institute, Worcester.
Computational Issues in Modeling Ion Transport in Biological Channels: Self- Consistent Particle-Based Simulations S. Aboud 1,2, M. Saraniti 1,2 and R.
International Workshop on Computational Electronics - 10 Oct 26, Comparison of full-band Monte Carlo and Non-equilibrium Green’s function simulations.
Simulations of sub-100nm strained Si MOSFETs with high- gate stacks
1 Analysis of Strained-Si Device including Quantum Effect Fujitsu Laboratories Ltd. Ryo Tanabe Takahiro Yamasaki Yoshio Ashizawa Hideki Oka
Comparison of Non-Equilibrium Green’s Function and Quantum-Corrected Monte Carlo Approaches in Nano MOS Simulation H. Tsuchiya A. Svizhenko M. P. Anantram.
(AlGaN/GaN) High electron mobility transistors Low dimensional System Master of Nanoscience Olatz Idigoras Lertxundi.
Course code: EE4209 Md. Nur Kutubul Alam Department of EEE KUET High Electron Mobility Transistor (HEMT)
International Workshop of Computational Electronics Purdue University, 26 th of October 2004 Treatment of Point Defects in Nanowire MOSFETs Using the Nonequilibrium.
Computational Electronics Generalized Monte Carlo Tool for Investigating Low-Field and High Field Properties of Materials Using Non-parabolic Band Structure.
Hot Electron Energy Relaxation In AlGaN/GaN Heterostructures 1 School Of Physics And Astronomy, University of Nottingham, University Park, Nottingham,
Materials for Thermoelectric Applications Jorge O. Sofo Department of Physics, Department of Materials Science and Engineering, and Materials Research.
Thermoelectrics: The search for better materials
Network for Computational Nanotechnology (NCN) UC Berkeley, Univ.of Illinois, Norfolk State, Northwestern, Purdue, UTEP Quantum Transport in Ultra-scaled.
Advanced Semiconductor Physics ~ Dr. Jena University of Notre Dame Department of Electrical Engineering SIZE DEPENDENT TRANSPORT IN DOPED NANOWIRES Qin.
Full-band Simulations of Band-to-Band Tunneling Diodes Woo-Suhl Cho, Mathieu Luisier and Gerhard Klimeck Purdue University Investigate the performance.
1 Scalable E-mode N-polar GaN MISFET devices and process with self-aligned source/drain regrowth Uttam Singisetti*, Man Hoi Wong, Sansaptak Dasgupta, Nidhi,
1 Interface roughness scattering in ultra-thin GaN channels in N-polar enhancement-mode GaN MISFETs Uttam Singisetti*, Man Hoi Wong, Jim Speck, and Umesh.
Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon Zudian Qin and Scott T. Dunham Department of Electrical Engineering University.
Nitride semiconductors and their applications Part II: Nitride semiconductors.
Full –Band Particle-Based Analysis of Device Scaling For 3D Tri-gate FETs By P. Chiney Electrical and Computer Engineering Department, Illinois Institute.
Optical properties and carrier dynamics of self-assembled GaN/AlGaN quantum dots Ashida lab. Nawaki Yohei Nanotechnology 17 (2006)
Modeling, Characterization and Design of Wide Bandgap MOSFETs for High Temperature and Power Applications UMCP: Neil Goldsman Gary Pennington(Ph.D) Stephen.
Computational Solid State Physics 計算物性学特論 第9回 9. Transport properties I: Diffusive transport.
Negative-mass electronic transport in Gallium Nitride using analytic approximations in Monte-Carlo Simulations Daniel R. Naylor*, Angela Dyson* & Brian.
Computational Solid State Physics 計算物性学特論 5回
Outline: What is Computational Electronics?
ENEE 704 Summary Final Exam Topics. Drift-Diffusion 5 Equations, Five Unknowns. – n, p, Jn, Jp,  Solve Self-Consistently Analytical Method: – Equilibrium:
Properties of HfO 2 Deposited on AlGaN/GaN Structures Using e-beam Technique V. Tokranov a, S. Oktyabrsky a, S.L. Rumyantsev b, M.S. Shur b, N. Pala b,c,
December 2, 2011Ph.D. Thesis Presentation First principles simulations of nanoelectronic devices Jesse Maassen (Supervisor : Prof. Hong Guo) Department.
Author: Egon Pavlica Nova Gorica Polytechic Comparision of Metal-Organic Semiconductor interfaces to Metal- Semiconductor interfaces May 2003.
Laboratoire Matériaux et Microélectronique de Provence UMR CNRS Marseille/Toulon (France) - M. Bescond, J-L. Autran, M. Lannoo 4 th.
Modeling, Characterization and Design of Wide Bandgap MOSFETs for High Temperature and Power Applications UMCP: Neil Goldsman Gary Pennington(Ph.D) Stephen.
Grace Xing---EE30357 (Semiconductors II: Devices) 1 EE 30357: Semiconductors II: Devices Lecture Note #19 (02/27/09) MOS Field Effect Transistors Grace.
Comparison of Ultra-Thin InAs and InGaAs Quantum Wells and
Influence of carrier mobility and interface trap states on the transfer characteristics of organic thin film transistors. INFM A. Bolognesi, A. Di Carlo.
Photoluminescence-excitation spectra on n-type doped quantum wire
TCAD simulation of Si crystal with different clusters. Ernestas Zasinas, Rokas Bondzinskas, Juozas Vaitkus Vilnius University.
Development of an analytical mobility model for the simulation of ultra thin SOI MOSFETs. M.Alessandrini, *D.Esseni, C.Fiegna Department of Engineering.
Advanced Drift Diffusion Device Simulator for 6H and 4H-SiC MOSFETs
IEE5328 Nanodevice Transport Theory
Generalized Dynamical Mean - Field Theory for Strongly Correlated Systems E.Z.Kuchinskii 1, I.A. Nekrasov 1, M.V.Sadovskii 1,2 1 Institute for Electrophysics.
NC STATE UNIVERSITY Direct observation and characterization of domain-patterned ferroelectrics by UV Photo-Electron Emission Microscopy Woochul Yang, Brian.
Advisor: Prof. Yen-Kuang Kuo
Scattering Rates for Confined Carriers Dragica Vasileska Professor Arizona State University.
F. Sacconi, M. Povolotskyi, A. Di Carlo, P. Lugli University of Rome “Tor Vergata”, Rome, Italy M. Städele Infineon Technologies AG, Munich, Germany Full-band.
Fowler-Nordheim Tunneling in TiO2 for room temperature operation of the Vertical Metal Insulator Semiconductor Tunneling Transistor (VMISTT) Lit Ho Chong,Kanad.
Fatemeh (Samira) Soltani University of Victoria June 11 th
Small internal electric fields in quaternary InAlGaN heterostructures S.P. Łepkowski 1, P. Lefebvre 2, S. Anceau 1,2, T. Suski 1, H. Teisseyre 1, H. Hirayama.
Analysis of Strain Effect in Ballistic Carbon Nanotube FETs
MOSFET Device Simulation
ACADEMIC AND SCIENTIFIC WORK ROBERTO PINEDA GÓMEZ
Nitride semiconductors and their applications
Barrier Current Flow in Nitride Heterostructures
ECE 695 Discussion Session GaN HEMT Technology – Recent Advances
Contact Resistance Modeling and Analysis of HEMT Devices S. H. Park, H
Predictive Modeling and Simulation of Charge Mobility in 2D Material Based Devices Altaf Karim Department of Physics, COMSATS Institute of Information.
Contact Resistance Modeling in HEMT Devices
Production of an S(α,β) Covariance Matrix with a Monte Carlo-Generated
Introduction to Nanoheat; Aspel group
The Materials Computation Center. Duane D. Johnson and Richard M
The Two-Dimensional Electron Gas (2DEG)
Long Channel MOS Transistors
Prof. Sanjay. V. Khare Department of Physics and Astronomy,
Long Channel MOS Transistors
Mechanical Stress Effect on Gate Tunneling Leakage of Ge MOS Capacitor
Presentation transcript:

Nanostructures Research Group Center for Solid State Electronics Research Quantum corrected full-band Cellular Monte Carlo simulation of AlGaN/GaN HEMTs † Shinya Yamakawa, Stephen Goodnick *Shela Aboud, and **Marco Saraniti Department of Electrical Engineering, Arizona State University *Electrical Engineering Department, Worcester Polytechnic Institute **Department of Electrical and Computer Engineering, Illinois Institute of Technology USA † This work has been supported by ONR, NSF, and HPTi.

Nanostructures Research Group Center for Solid State Electronics Research Motivation and Approach AlGaN/GaN HEMT is the attractive candidate for high- temperature, high-power and high-frequency device. –wide band gap, high saturation velocity –high electron density by spontaneous and piezoelectric polarization effect Here the full-band Cellular Monte Carlo (CMC) approach is applied to HEMT modeling. The effect of the quantum corrections is examined based on the effective potential method.

Nanostructures Research Group Center for Solid State Electronics Research Full-band transport model Transport is based on the full electronic and lattice dynamical properties of Wurtzite GaN: Full-band structure Full Phonon dispersion Anisotropic deformation potential scattering (Rigid pseudo-ion Model) Anisotropic polar optical phonon scattering (LO- and TO-like mode phonons) Crystal dislocation scattering Ionized impurity scattering Piezoelectric scattering

Nanostructures Research Group Center for Solid State Electronics Research AlGaN/GaN hetero structure AlGaN GaN P SP P PE ++ 2DEG Tensile strain Ambacher et al., J. Appl. Phys. 87, 334 (2000) P0P0 2DEG AlGaN Tensile strain GaN Fixed polarization charge is induced at the AlGaN/GaN interface Ga-face (Ga-polarity) P SP : Spontaneous polarization P PE : Piezoelectric polarization (strain)

Nanostructures Research Group Center for Solid State Electronics Research Effective potential approach Quantization energy Charge set-back Effective potential approximation Classical potential (from Poisson’s equation) Smoothed Effective Potential Effective potential takes into account the natural non-zero size of an electron wave packet in the quantized system. This effective potential is related to the self-consistent Hartree potential obtained from Poisson’s equation. a 0 : Gaussian smoothing parameter depends on  Temperature  Concentration  Confining potential  Other interactions D.K. Ferry, Superlattices and Microstructures 28, 419 (2000)

Nanostructures Research Group Center for Solid State Electronics Research Schrödinger-Poisson calculation Calculated AlGaN/GaN structure Al x Ga 1-x N Doped GaN 15 nm 100 nm Gate Al x Ga 1-x N Spacer 5 nm Modulation doping : cm -3 Unintentional doping : cm -3 (for AlGaN and GaN) Al content x : 0.2  0.4 Schrödinger-Poisson (S-P) calculation Al 0.2 Ga 0.8 N/GaN F. Sacconi et al., IEEE Trans. Electron Devices 48, 450 (2001)

Nanostructures Research Group Center for Solid State Electronics Research Effective potential calculation Quantum correction (QC) with effective potential Self-consistent calculation : The final effective potential shifts due to the polarization charge Solve Poisson equation with classical electron distribution Quantum correction with the effective potential method Calculate the electron density with the new potential (Fermi- Dirac statistics) Solve the Poisson equation Repeat until convergence Al 0.2 Ga 0.8 N/GaN

Nanostructures Research Group Center for Solid State Electronics Research Electron distribution Electron distribution for S-P, classical and quantum correction Quantum correction (initial)Quantum correction (self-consistent) a 0 (Å) : Gaussian smoothing parameter (Al 0.2 Ga 0.8 N/GaN)

Nanostructures Research Group Center for Solid State Electronics Research Electron sheet density N s for Si MOSFETN s for AlGaN/GaN HEMT MOSFET with 6nm gate oxide. Substrate doping is and cm -3. MOSFET data: I. Knezevic et al., IEEE Trans. Electron Devices 49, 1019 (2002) Al 0.2 Ga 0.8 N/GaN

Nanostructures Research Group Center for Solid State Electronics Research Comparison of electron distribution with S-P Al 0.2 Ga 0.8 N/GaNAl 0.4 Ga 0.6 N/GaN

Nanostructures Research Group Center for Solid State Electronics Research Gaussian smoothing parameter ( a 0 ) fitting

Nanostructures Research Group Center for Solid State Electronics Research HEMT device simulation Simulated HEMT device Electron distribution under the gate Classical Quantum correction a 0 =6.4 Å UID density : cm -3  E c = 0.33 eV Schottky barrier  B =1.2eV

Nanostructures Research Group Center for Solid State Electronics Research Classical Effective potential V G =0V V DS =6V

Nanostructures Research Group Center for Solid State Electronics Research I D _V DS, I D _V G

Nanostructures Research Group Center for Solid State Electronics Research Conclusion The effect of quantum corrections to the classical charge distribution at the AlGaN/GaN interface are examined. The self-consistent effective potential method gives good agreement with S-P solution. The best fit Gaussian parameters are obtained for different Al contents and gate biases. The effective potential method is coupled with a full-band CMC simulator for a GaN/AlGaN HEMT. The charge set-back from the interface is clearly observed. However, the overall current of the device is close to the classical solution due to the dominance of polarization charge.