Novel Characterization Technique for 2D materials: LEEM/μLEED-IV Zhongwei Dai,1 Maxwell Grady,1 Wencan Jin,2 Jerry I. Dadap,2 Richard M. Osgood, Jr.,2.

Slides:



Advertisements
Similar presentations
Identification of Defects and Secondary Phases in Reactively Sputtered Cu 2 ZnSnS 4 Thin Films Vardaan Chawla, Stacey Bent, Bruce Clemens April 7 th, 2010.
Advertisements

UIC Physics Analysis of Al x Ga 1-x N Nanowires through Simulated Methods of Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy.
A New Design Tool for Nanoplasmonic Solar Cells using 3D Full Wave Optical Simulation with 1D Device Transport Models Liming Ji* and Vasundara V. Varadan.
Electron Spectroscopies of InN grown by HPCVD Department of Physics and Astronomy Georgia State University Atlanta, Georgia Rudra P. Bhatta Solid State.
Influence of Substrate Surface Orientation on the Structure of Ti Thin Films Grown on Al Single- Crystal Surfaces at Room Temperature Richard J. Smith.
Franco-Israel Conference on Nanocharacterization Surface Electronic Characterization with SPM Sidney Cohen This presentation will probably involve audience.
How do Remarkable Properties of Matter Emerge from Complex Correlations of the Atomic or Electronic Constituents and How Can We Control These Properties?
FIRST PRINCIPLES CALCULATION OF OFF-NORMAL LEEM REFLECTIVITY SPECTRA OF FEW LAYER GRAPHENE APS March Meeting: March 3, 2014 John McClain, Ph.D. Candidate.
Epitaxial Overlayers vs Alloy Formation at Aluminum- Transition Metal Interfaces Richard J. Smith Physics Department Montana State University Bozeman MT.
Applications of MeV Ion Channeling and Backscattering to the Study of Metal/Metal Epitaxial Growth Richard J. Smith Physics Department Montana State University.
Brillouin Light Scattering Studies of Magnetic Multilayers Cyrus Reed, Milton From Department of Physics and Astronomy, Western Washington University What.
I. Brief introduction Several questions to ask in this course: 1. What is the objective of the course - “introduction to crystal structure and diffraction.
J. H. Woo, Department of Electrical & Computer Engineering Texas A&M University GEOMETRIC RELIEF OF STRAINED GaAs ON NANO-SCALE GROWTH AREA.
Philip Kim Department of Physics Columbia University Toward Carbon Based Electronics Beyond CMOS Devices.
Nathan Duderstadt, Chemical Engineering, University of Cincinnati Stoney Sutton, Electrical Engineering, University of Cincinnati Kate Yoshino, Engineering.
Growth and Analysis of MOCVD Grown Crystalline GaAs Andrew Howard, Dr. S. Phillip Ahrenkiel SDSM&T Nanoscience Department NSF REU Grant # Objectives.
Novel Real Time Optics for Thin Film Materials Research - I Robert W. Collins The Pennsylvania State University, DMR New optical spectroscopies.
AlGaN/InGaN Photocathodes D.J. Leopold and J.H. Buckley Washington University St. Louis, Missouri, U.S.A. Large Area Picosecond Photodetector Development.
Fabrication and characterization of Au-Ag alloy thin films resistance random access memory C. C. Kuo 1 and J. C. Huang 1,* 1 Department of Materials and.
Ultrafast Carrier Dynamics in Graphene M. Breusing, N. Severin, S. Eilers, J. Rabe and T. Elsässer Conclusion information about carrier distribution with10fs.
Complex Epitaxial Oxides: Synthesis and Scanning Probe Microscopy Goutam Sheet, 1 Udai Raj Singh, 2 Anjan K. Gupta, 2 Ho Won Jang, 3 Chang-Beom Eom 3 and.
Microwave Assisted ZnO Nanorod Growth for Biosensing This material is based upon work supported by the National Science Foundation.
D.-A. Luh, A. Brachmann, J. E. Clendenin, T. Desikan, E. L. Garwin, S. Harvey, R. E. Kirby, T. Maruyama, and C. Y. Prescott Stanford Linear Accelerator.
National Science Foundation GOALI: Epitaxial Growth of Perovskite Films and Heterostructures by Atomic Layer Deposition and Molecular Beam Epitaxy John.
XI. Reflection high energy electron diffraction
UIC Physics Tessa Cooper Materials Science and Engineering Rutgers University Advisors: Dr. R. Klie and Q. Qiao Department of Physics, University of Illinois.
Ferroelectric Nanolithography Extended to Flexible Substrates Dawn A. Bonnell, University of Pennsylvania, DMR Recent advances in materials synthesis.
The design of dielectric environment for ultra long lifetime of graphene plasmon Dr. Qing Dai 22/10/2015.
National Science Foundation Sb-doped SnO 2 as a transparent contact on InGaN/GaN LEDs James S. Speck, University of California-Santa Barbara, DMR
In situ X-ray Diffraction Study of High Performance Organic Semiconductor Polymorphism Zhenan Bao, Stanford University, DMR Flexible, transparent.
In-situ Scanning Tunneling Microscopy Study of Bismuth Electrodeposition on Au(100) and Au(111) S.H. Zheng a, C.A. Jeffrey a,b, D.A. Harrington b E. Bohannan.
2. Design Determine grating coupler period from theory: Determine grating coupler period from theory: Determine photonic crystal lattice type and dimensions.
Identifying Radiative Polaritons in Thin Oxide Films with Experimental and Simulated Dispersion Relations Anita J. Vincent-Johnson 1, James S. Hammonds.
ACADEMIC AND SCIENTIFIC WORK ROBERTO PINEDA GÓMEZ
Li Zeng1, M. Moghadam1, D. Buchholz1, D. Keane3, Tobin J
John Mortimer, Fan Xia and Junjie Niu
Yakup Boran Spring Modern Atomic Physics
Stacking of Quasi 2D Transition Metal Dichalcogenides
Ching-Rong “Ada” Chung Mentor: Dr. Jing Zhou Department of Chemistry
MBE Growth of Graded Structures for Polarized Electron Emitters
What’s a modulated structure ?
Motivation Experimental method Results Conclusion References
Control of Spin-Orbit Splitting in 2D Semiconductors
Superconductivity in CuxBi2Se3 and its Implications for the Undoped Topological Insulator Garrett Vanacore, Sean Vig, Xiaoxiao Wang, Jiang Wang, University.
CdS/MoS2 Photocatalyst
Conformal Charge Barriers For Organic Electro-Optics
Cryo-EM Services Electron microscopy (EM) has become an extremely popular method for the ultrastructural study of macromolecules, cells and tissues. An.
Cryo-em Electron microscopy (EM) has become an extremely popular method for the ultrastructural study of macromolecules, cells and tissues. An aqueous.
Fabrication of GaAs nanowires for solar cell devices
Optical and Terahertz Spectroscopy of CdSe/ZnS Quantum Dots
Cryo-EM Services Cryo-EM Services in Creative Biostructure.
Photoreactions of Hybrid Photocathodes Browse EMSL Capabilities at:
Search for Superconductivity with Nanodevices
Identifying the Driving Forces for Alloying in Ultra-Thin Films
Structures and Defects at Interfaces in Organic Molecular Heterostructures Paul G. Evans, Department of Materials Science and Engineering, University of.
Dirac Line Nodes in Inversion Symmetric Crystals C. L. Kane & A. M
Diffraction T. Ishikawa Part 1 Kinematical Theory 1/11/2019 JASS02.
Determination of the Dielectric Function of Nickel Ferrite Thin Films
Tip-based functionalization of Group IV graphenes
Wei Luo, Hongjun Xiang* Introduction
Epitaxial growth of a monolayer WSe2-MoS2 lateral p-n junction with an atomically sharp interface by Ming-Yang Li, Yumeng Shi, Chia-Chin Cheng, Li-Syuan.
Growth Behavior of Co on Al(001) substrate
Iterative Phase Retrieval (Jianwei Miao & David Sayre)
Observation of Intrinsic Quantum Well States and
Ionic liquid gating of VO2 with a hBN interfacial barrier
Magnetic force resonance microscopy
Through the Looking Glass at the Atomic Scale
Chapter 16: Electron Diffraction
Ultrahigh mobility and efficient charge injection in monolayer organic thin-film transistors on boron nitride by Daowei He, Jingsi Qiao, Linglong Zhang,
by Mark T. Edmonds, James L
Presentation transcript:

Novel Characterization Technique for 2D materials: LEEM/μLEED-IV Zhongwei Dai,1 Maxwell Grady,1 Wencan Jin,2 Jerry I. Dadap,2 Richard M. Osgood, Jr.,2 Jerzy T. Sadowski,3 Karsten Pohl1 (advisor) 1University of New Hampshire, Department of Physics and Materials Science Program; 2Columbia University; 3Brookhaven National Lab, Upton, NY Motivations Why 2D Materials? Simulation and Results Investigating atomic structure of emerging 2D materials: Study of surface relaxation of bulk MoS2 and atomic structure of suspended single layer MoS2 Determination of surface termination element of MBE grown toplogical insulator SnSe thin film and its surface structure Determination of surface buckling of black phosphorus, a newly discoverd 2D material Mechanically strong. High carrier mobility. Applications in photovoltaic, modern electronics and photocatalysts. IV spectra calculation and optimization Bulk MoS2 and Monolayer MoS2 Low energy e- (5-200eV) A proposed bilayer BP and MoS2 thin film heterostructure flexble solar-cell is predicted to have a power conversion efficiency as high as 18%. Scattering of the electrons by a single atom is calculated first Then the atoms are arranged to form an atomic layer for which layer diffraction matrices are computed Methods LEEM (Low Energy Electron Microscopy) imaging An image at E = 17 eV. FOV = 30 m. Sample: Multi-layers MoS2 flakes Aberraion -corrected LEEM system The electron multiple scattering IV calculations are based on the muffin-tin model of the crystal potential [5] Black Phosphorus Surface buckling The detailed surface atomic structure was determined for the first time experimentally. Surface buckling on BP was found to be around 0.2 Å. Layers are stacked to a crystal to yield the total reflection matrix of the surface SnSe: a novel toplogical insulator Single-layer MoS2 transistor μLEED pattern at selected area E=95 eV log (R) db (Å) Surface structure of newly MBE grown SnSe thin film was characterzied to be Sn-terminated with oscillatory surface relaxation Electronic structure was measrured using ARPES. The observed Dirac surface state is shown to yield a high Fermi velocity which potentially may lead to high-speed electronic devices and spintronic applications. d12 (Å) Local μLEED-IV Extraction LEEM μLEED LEEM: real-space, in situ, direct imaging Spatial resolution: ~ 2 nm Field of view: 1 ~ 30 m Low beam energy: 5 ~ 150 eV Conclusions Investigated the surface of bulk MoS2 and suspended monolayer MoS2 . Determined the surface termincation of newly grown TCI SnSe to be Sn-terminated and has an oscillatory surface relaxation. Surface buckling of BP was determined to be 0.2 Å, which is much bigger than previsously reported value. Acknowledgement References Young Duck Kim, James Hone (Columbia University, USA) Suresh Vishwanath, Huili Grace Xing (Cornell University, USA) This work is supported by grants from the National Science Foundation, # EPS-071730, to the NH EPSCoR program, and # DMR-1006863. [1] Jun Dai and Xiao Cheng Zeng, J. Phys. Chem. Lett. 5, 1289 (2014) [2] B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti and A. Kis, Nature Nanotechnol. 6, 147 (2011); [3] R.M. Tromp and J.B.Hannon et. al., Ultramicroscopy 110, 852 (2010) 26th October, 2016