MultiView 400™ Product Presentation Nanonics MultiView 400™

MultiView 400 ™ Complete System Product Presentation View of a complete MultiView 400 system including: Controller PC with Screen Dual Microscope NSOM 100 scan-head Detection APD on the upright microscope Confocal illumination on the upright microscope Missing: Laser APD controller Detection system on the inverted microscope Interface boxes

Modes of Operation SPM modes: AFM contact AFM Intermittent MultiView 400™ Product Presentation SPM modes: AFM contact AFM Intermittent contact mode STM Electrical Measurements Far Field Methods: Standard Microscope Imaging Fluorescence Confocal SPM: Scanning Probe Microscopy AFM: Atomic Force Microscopy STM: Scanning Tunneling Microscopy NSOM: Near Field Scanning Optical Microscopy (also called SNOM: Scanning Near Field Optical Microscopy)

Easy Integration with Optical Microscopes Dual - Upright /Inverted MultiView 400™ Product Presentation MultiView 400 mounted in a Dual Olympus Microscope Dual - Upright /Inverted Optical Microscope

MultiView 400 ™ fits any Optical Microscope Product Presentation Olympus Inverted Examples of other Microscopes supplied by Nanonics. Principally integration of the MultiView 400 with the customers microscope is possible. Zeiss Dual Olympus Dual Zeiss Upright

Normal Force Feedback Standard AFM and cantilevered glass probes MultiView 400™ Product Presentation This is the typical feedback mode used in most AFM‘s Can do all the AFM modes (Contact, Non-Contact, and Intermittent Contact) In contact mode can illuminate while measuring electrical properties and/or surface mechanical properties. This is not possible with straight probe NSOM which is above the surface using shear force control. Lateral force measurements are optionally allowed with these tips. (A flat mirror surface is added to the back of the otherwise curved optical fiber for this) The cantilevered optical fiber tip can also be used for collection of light. This is especially critical for wave guide, quantum laser, laser devices for communication, and optical switches. Measurement of light distribution with electrical properties is unique to this technology. Standard AFM and cantilevered glass probes Easy to use - standard beam-bounce feedback All standard AFM imaging modes available Free optical axis above and below

Standard NSOM/SPM Technology MultiView 400™ Product Presentation Cylindrical Piezo Probe Scanning Probe (SPM) Technologies Including NSOM Are Not Transparently Compatible with Standard Optical Configurations for Two Reasons: The First reason is the probe Certain systems only use straight optical fibers and this limits the system from the top. Other systems only use silicon probes with apertures. This does not allow the lens to illuminate the tip of the probe in apertureless geometries or this does not allow illumination from the probe and the lens on the sample simultaneously. Both of these approaches require special optical solution in compatible with any other emulations of NSOM. In addition, in terms of SPM in general the standard silicon cantilevers have the tip of the probe under a cantilever of silicon that is opaque to the optical beam from the top. Thus, this blocks direct viewing and illumination of the sample from the top. The Second reason is the scanning mechanism All SPM scanning systems are based on a cylindrical piezo device that is held in a perpendicular geometry relative to the sample or probe to be scanned. This either blocks the top or the bottom or both. These elements of the tip and the scanner eliminates the possibility of integrating the many useful aspects of SPMs into standard optical, electron and ion beam systems. is not Optical, microRaman or Electron/Ion Beam Friendly neither from the top nor bottom

The MultiView 400 ™ Technology Product Presentation Flat Scanner Probe The Optically Friendly Nanonics’ Solutions: Cantilevered optical fiber or other transparent cantilevered glass probes, such as nanoparticle containing nanopipette, with all probes having their tips exposed to the optical axis. Such probes can be coated with metal to allow for a near-field optical aperture. The nanoparticles cantilevered nanopipette aNSOM/AFM probes, provide for conventional apertureless geometries with side illumination or provide for unique patented protocols of Raman NSOM or second harmonic generation, such as Shadow NSOM to be discussed in more detail below. Also Nanonics NSOM/SPM Systems are the only systems in the world that allow any available NSOM or AFM probe to be used and do not limit the investigator’s imagination. 3D Flat ScanningTM Technology integrated to provide for optically friendly SPM systems. These Flat ScannersTM are based on the same scanning mechanism of all AFM piezo scanners. However, four such piezos are used in a patented geometry that provides, with the same mechanism, not only standard AFM x, y scan ranges but also millimeters of rough scanning and, also, with the same scanner seven to ten times larger Z scan range than any known AFM scanning system. The only SPM scanning system with a large, 70 micron, Z range that is not only important for SPM of deep trenches or invaginations but is also of great importance to on line optical sectioning in confocal & CCD imaging. In addition, such sample Z motion is preferable to Z motion of the lens for optical sectioning both in terms of using any objective in the far-field microscope and in terms of not altering the position of the far-field optical element that could introduce errors in alignment. Also mm of rough scanning that is electronically controlled with the same, 7 mm thin, SPM piezo scanner and this is ideal for rapidly finding in the optical microscope regions of interest in a sample. is Optical, microRaman or Electron/Ion Beam Friendly from the top and the bottom

Nanonics 3D-Flatscan™ Only 7 mm thick 70 mm X-Y-Z scan range MultiView 400™ Product Presentation The central opening provides a large 24mm diameter clear optical axis enabling a wide variety of system set ups and optical or other beam technologies to be employed simultaneously and transparently with the NSOM/SPM-100 microscope head. 3D Flat ScanningTM Technology integrated to provide for optically friendly SPM systems. These Flat ScannersTM are based on the same scanning mechanism of all AFM piezo scanners. However, four such piezos are used in a patented geometry that provides, with the same mechanism, not only standard AFM x, y scan ranges but also millimeters of rough scanning and, also, with the same scanner seven to ten times larger Z scan range than any known AFM scanning system. The only SPM scanning system with a large, 70 micron, Z range that is not only important for SPM of deep trenches or invaginations but is also of great importance to on line optical sectioning in confocal & CCD imaging. In addition, such sample Z motion is preferable to Z motion of the lens for optical sectioning both in terms of using any objective in the far-field microscope and in terms of not altering the position of the far-field optical element that could introduce errors in alignment. Also mm of rough scanning that is electronically controlled with the same, 7 mm thin, SPM piezo scanner and this is ideal for rapidly finding in the optical microscope regions of interest in a sample. Only 7 mm thick 70 mm X-Y-Z scan range Central opening providing clear optical axis Inertial motion positioning of sample (6 mm)

with Closed Loop Sensors Nanonics 3D-Flatscan™ with Closed Loop Sensors MultiView 400™ Product Presentation Nanonics 3D-Flatscan ™ with X-Y closed loop sensors Closed loop add the possibility for accurate scanning and positioning. The closed loop sensor compensates the non linearity of the piezo scanner. In the standard setup the linearization is done by software, which is good enough for most applications. Capacitive displacement sensors Precise positioning and scanning Additional Z-sensor available Central opening providing clear optical axis Inertial motion positioning of sample (6 mm)

Magnetic tip placement MultiView 400™ Product Presentation A close up view of a mounted Nanonics probe. The cantilevered nature of the probe allows for not only the geometry and the topography of the device to be measured with nanometric accuracy using atomic force microscopy (AFM) but also, AFM, allows for on-line feedback with 0.02 dB stability, repeatability and reconfigurability of the probe on the device under test (DUT) Cantilevered optical fiber or other transparent cantilevered glass probes, such as nanoparticle containing nanopipette, with all probes having their tips exposed to the optical axis. Such probes can be coated with metal to allow for a near-field optical aperture. The nanoparticles cantilevered nanopipette a NSOM/AFM probes, provide for conventional apertureless geometries with side illumination or provide for unique patented protocols of Raman NSOM or second harmonic generation, such as Shadow NSOM to be discussed in more detail below. Also Nanonics NSOM/SPM Systems are the only systems in the world that allow any available NSOM or AFM probe to be used and do not limit the investigator’s imagination. Easy & repeatable magnetic tip mounting Easy magnetic attachment of the mount to the scan head Large selection of specialized tips Non-magnet holders available