W. Blokland*, R. Potts#, S. Cousineau#

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Presentation transcript:

W. Blokland*, R. Potts#, S. Cousineau# Electron Beam Profile Monitor measurements of the Montague Resonance in the SNS Ring W. Blokland*, R. Potts#, S. Cousineau# * Diagnostics # Beam Dynamics Beam Dynamics meets Diagnostics Workshop 4-6 November 2015 Convitto della Calza, Florence, Italy

Spallation Neutron Source Accelerator Current 1ms Accumulated in the Ring 16.6ms Current 670 ns RTBT Ring Linac 945 ns Current 1 ms macro-pulse Spallation Neutron Source (SNS) Materials research with neutrons through spallation of protons in mercury Power on Target 1.4 MW at 1.0 GeV Pulse on Target 1.5 E14 protons (24 µC) in 670 ns Macro-pulse in Linac 1000 mini pulses of ~24 mA average over 1 ms at 60 Hz

Beam Dynamics meets Diagnostics What the..? Beam Dynamics: Define and execute experiment Simulate experiment Benchmark simulation with experiment Diagnostics: Knows how to setup diagnostics devices for measurements Knows how obtain beam parameters from raw data Provides application to acquire data and generate results Problem: Beam profiles are found to be coupled under certain conditions  Setup to get right beam size on target more complicated

Beam Dynamics: Space Charge Effects Hill’s equation with space charge as driving force: with Nominal tune point without space charge Tune spread due to space charge effects particles differently based on local density Simulation of space effect on tune

Beam Dynamics: Resonances Montague Resonance: 2x-2y=0 Characteristics: Sensitive to intensity: stronger with more space charge Sensitive to tune-split: stronger with closer tunes Observe exchange of RMS widths between planes Second Order Beam Moments Vertical Horizontal Turn Simulation of space charge effect on RMS width

*1 min per profile to setup extraction for RTBT measurements Experiment Conditions SNS Ring: Different tune-splits with different beam intensities and stored turns Required Data: Profiles (RMS width) during accumulation and storage Device Location Each Injection Stored turns Resolu -tion Time@1Hz Time per set* Wire Scanner RTBT Profile point extracted Adjust ring 50 -100 pts 100-200 s 160 min Harp Full profile extracted 30 pts 1 s 40 min Electron Scanner Ring !!! Full profile slice any turn No adjustment 5 - 40 s 30 min *1 min per profile to setup extraction for RTBT measurements The electron scanner can take a set of data unattended (requires offline analysis) The wire scanner has the best signal to noise ratio, the harp has lowest resolution Only the electron scanner can measure directly (no extraction kicker, lattice, etc)

Electron Scanner Principle Quadrupoles Deflector Electrons  Multiple scans dy dx Proton beam Look at the deflected projection of a tilted sheet of electrons: Neglect magnetic field (small displacement of projection) Assume path of electrons is straight (they are almost straight) Assume net electron energy change is zero  take the derivative of curve to get the profile

Electron Scanner Hardware Dipoles Electron Gun Quadrupoles Deflector Screen HV Transformer Electron scanner now covered with magnetic shield Ring Beam Pipe Camera

Electron Scanner Capabilities The SNS Ring presents a good operational spot for the electron scanner: A lower kV setting requires better magnetic shielding A higher beam potential requires higher kVs (expensive) Shorter bunch lengths require faster scans e.g. cavity and result in less electrons A smaller beam size requires lower electron emittance and projection and better sensor resolution and/or diverging projection A faster rep rate requires a more expensive electron gun HV supply Parameter Range Implementation Dependency Beam Intensity 50 nC-25 µC (1*600ns) 10’s mA – 10’s A 10-100 keV Geometry (deflection) Beam Potential Up to ~20kV Requires 100 keV electrons Electron momentum Bunch Length > 10’s ns < 10’s ns Deflector single shot profile Cavity or step per position Amount of electrons to screen Beam size > 5 mm < 5 mm Parallel projection & screen diverging projection & MCP Geometry Rep Rate < 10’s Hz Screen and Camera Fluorescent Tc and power supply

ES: Profile generation Setup of accelerating voltages, cathode current, deflector voltages, dipoles, quadrupoles, and timing. Find the curve Images But for beam dynamics more is needed: Automatic acquisition of defined turns and slices Offline quantitative analysis Visualize large amounts of data Multi profiles show bunches in the ring during accumulation Take derivative to generate profile

ES: Offline analysis Handle large amount of data Analyze images in stages for quick re-analysis Image to profile (most time-intensive), profile to accumulated profile, profile to RMS Visualize and export analysis results Results plotted vs. turns Verify operation of electron scanner and data

Electron Scanner imperfections This is a prototype: Projection not through center of quads: Beam pipe of vertical ES not straight Projection is not a straight line when no beam Aperture is too small Need to extend analysis beyond marker Rotated vertical deflection Artifacts interfere with image Blobs of un-deflected electrons Background of lower momentum electrons New HV power supply to be installed These imperfections make the setup (~1 hr. for new conditions) and analysis more time-consuming and also restrict beam conditions (width) background blobs Deflection past markers Before Increased aperture between markers by rotating the deflectors After

Analyzing: Image to Profile Find curve in image then take derivative to find profile: Use spline fit to reduce noise but not predispose to a certain profile shape Shows slope Show effect of gap in trace due to marker Marker Slope ~1.2µC beam

Analyzing the data: Composite Profile From profile slice to composite profile: Shows slope Subtract base trace Show effect of gap in trace due to marker Exclude if no deflection Animation of analyzing all profiles in this data set (40 turns with each 40 slice profiles of ~1.2µC total accumulation)

Analyzing the data: display Beam accumulation for the first 100 turns The Electron Scanner shows the evolution of transverse profile during the accumulation (and even profiles within the bunch) Qualitative idea of what is going on. But we need additional quantitative results for beam dynamics Checking the electron scanner profiles

Calibrating the scale Convert image pixels to mm in the profile Horizontal projection isn’t quite at 45 degrees  small correction Vertical deflector intentionally rotated  large correction

Checking the obtained profiles Integrate profile to obtain charge we clearly see the linear increase in charge up to turn 100 and the charge matches beam accumulation even as profiles are changing (whole profile is captured) Track centroid through accumulation and storage Centroid is stable Calculate RMS width

Analyzing the data: Numerical results Plot the charge, centroid, and RMS width for both planes in same plot Allow user to view evolution of profile

Ring coupled beam study: Initial results Split tune does not show RMS oscillation Case Hor Tune Ver Tune dTune Equal 6.19944 6.19781 0.00163 Split 6.20898 6.16860 0.04038

Ring coupled beam study: initial results Damped oscillator: check its period changes vs charge 0.4 µC  Lower charge seems to have longer and stronger exchange of RMS 1.2 µC 0.7 µC 1.2 µC Split tune Fit to function: a*exp(-f*x)*sin(b*x +c)+d

Beam Dynamics initial conclusions Probably not Montague Resonance because coupling stronger at lower intensities Looks like linear lattice coupling, but this was corrected before experiment started with skew quads Investigation ongoing…. (e.g. mapping profiles from RTBT to Ring, simulations, verifying calibration)

Beam Dynamics meets Diagnostics Good example of how to use a complex diagnostic Has advantages over wire scanner Can handle high intensity Scans faster Not interceptive  No beam losses The Beam Dynamics experimental needs pushed the development of the electron scanner software Manage many turns of data for acquisition and display Further verification of analysis At SNS, the Beam Dynamics and Diagnostics meet every day (Espresso!)