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Henrik Loos High Level 17 June 2008 High Level Physics Applications for LCLS Commissioning Henrik Loos.

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Presentation on theme: "Henrik Loos High Level 17 June 2008 High Level Physics Applications for LCLS Commissioning Henrik Loos."— Presentation transcript:

1 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 High Level Physics Applications for LCLS Commissioning Henrik Loos

2 High Level Applicationsloos@slac.stanford.edu 17 June 2008 Physics Applications Overview Matlab framework for development ~35 applications developed by physicists ~30 with graphical user interfaces (GUIs) Created and grown within last year Development driven by commissioning needs Quick adoption of new features

3 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Application Types Diagnostics Profile Monitors Wire Scanners Emittance Bunch Length Correlation Plot Cathode QE Laser Pulse Length Orbit Response Status Displays Operating Point Orbit RF Status Beam Jitter Beam Images Machine Control & Tuning Beam Line Switching Bunch Compressor Control Twiss Matching Undulator Beam Based Alignment Simulation LiTrack 1D FEL Code

4 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Physics HLA Launch Screen

5 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Operating Point Primary definition for main machine parameters Used as defaults for other applications Electronic checklist Compares actual values with set points No machine control H.-D. Nuhn

6 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Linac Beam Jitter Measures transverse beam jitter in injector and near end of linac Display of jitter in terms of normalized phase space Display of energy jitter throughout machine D. Ratner

7 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 RF Phase Scans Beam based measurement of all RF phases Integrates Epics and SCP controls Amplitude calibration and phase re-golding Stores results in PVs for archiving P. Emma

8 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Twiss Parameter Matching Retrieves Twiss parameters from previous emittance measurement Wire scanner or profile monitor Applies solution to magnet settings Will include undulator matching soon C. Limborg

9 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Dispersion Measurement Orbit measurement after chicanes with varying beam energy Calculates resulting emittance growth and corrector quad strengths Applies correction P. Emma

10 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Bunch Compressor Control Set R 56 of chicane Controls Dipole strengths Chicane motion Matching quads Upstream RF phases P. Emma

11 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Beam Diagnostics Application Hierarchy Correlation Plot EmittanceBunch Length Profile MonitorWire Scan

12 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Common User Interface Features Configs Files Data Point Measure Export

13 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Image Acquisition Live image display Pixels or calibrated display Line outs Intensity histogram Fit results Interactive screen calibration

14 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Wire Scans Beam synchronous acquisition of wire position, PMT signals, charge, and beam position Automatic set of scan range from BPM reading Optional jitter correction and charge normalization Applies set of fit algorithms to profiles Add support for undulator beam finder wires Raw Data Processed Scan

15 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Bunch Length Measurement Measures bunch length at various profile monitors using TCAV0 and 3 Scans TCAV phase for calibration. Plot of measured images, profiles, and beam size fit.

16 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Emittance Overview Phase Space Slice Plot Summary Plot

17 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Emittance GUI Features Measures emittance at various profile monitors and wire scanners. Uses quadrupole scan or acquisition at multiple locations (multi screen). Projected emittance or slice emittance Sets PVs for archiving and matching Plot of measured profiles, beam size fit, and phase space view. Add emittance measurement using undulator beam finder wires.

18 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Correlation Plot Overview

19 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Correlation Plot Features Scans any epics process variable (PV) Measures multiple samples of any number of PVs Non-synchronous and synchronous acquisition Scan of 2 PVs for 2-D plots Scan of SLC magnets Time scan Measurement of emittance, bunch length, profile monitors, wire scanners Selection of different fit functions Plot of selected results

20 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Applications for Next Phase Beam-Based Alignment of the FEL Undulator - (Loos) Undulator Steering and re-Pointing - (Nuhn) K-measurement Application - (Welch/Emma/Nuhn) Beam-Finder Wire Application - Centering & Emittance - (Loos/Nuhn?) LTU Emittance Measurement - (Loos - extension of existing GUI) Beta-Matching into undulator - (Loos - extension of existing GUI) FEE diagnostics - (see R. Bionta's talk)

21 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Undulator Beam Based Alignment Measurement of undulator orbit at 3+ energies Fit of BPM & quad offsets and orbit Changes BPM offsets Moves quads with undulator girders Launches beam into undulator Integrates simulation Simulation Orbit Offsets Measurement Preliminary

22 Henrik Loos High Level Applicationsloos@slac.stanford.edu 17 June 2008 Summary Migration of applications from physicists to software group Matlab applications were developed in interaction with control room needs Existing Matlab applications are used to define software requirements Gradual replacement from lower level apps (e.g. wire scan) to highest level (e.g. correlation plots)


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