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February 2, 2005 Surface Electronic Structure Photoemission Spectroscopy Optical Characterization of Semiconductor quantum dots Thin Film Growth and Characterization.

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Presentation on theme: "February 2, 2005 Surface Electronic Structure Photoemission Spectroscopy Optical Characterization of Semiconductor quantum dots Thin Film Growth and Characterization."— Presentation transcript:

1 February 2, 2005 Surface Electronic Structure Photoemission Spectroscopy Optical Characterization of Semiconductor quantum dots Thin Film Growth and Characterization Carbon Nanotubes XRD with high pressure Diamond Anvil Cell Raman and Photoluminescence Spectroscopy of fullerenes under high pressure Electro-optical Properties of Polymer-based materials Sharma’s Research Group

2 February 2, 2005 GRADUATE STUDENTS: Robert Ramsey, PhD (graduated 12/06) Tonmoy Chakraborty UNDERGRADUATES: Jay Murphree Chance Harenza Danielle Williams

3 February 2, 2005

4 H-PDLC Grating Formation Hologram Preparation (Interference Geometry for Transmission Grating) Hologram Preparation (Interference Geometry for Reflection Grating) ITO Glass Monomer/LC Syrup H-PDLC Sample

5 February 2, 2005 Holographic-PDLC R. A. Ramsey and S. C. Sharma, Opt. Lett. 30 (2005) Typical H-PDLC Switchable Diffraction Pattern Diffraction Efficiencies During Cure Process Incident-Angle Variation (m=1)

6 February 2, 2005 PDLC-Photonic Crystals (2005) a = 6.7 μm d = 4.3 μm a = 6.7 μm n ≈1.78 n =1.54

7 February 2, 2005

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9 Quantum Dot Size and Emission Wavelength

10 February 2, 2005

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