1. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 1 1 1 Preliminary Ladder Testing Results (part 2) At IPHC MS, XS, LG

2. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 2 2 2 Outline New running conditions Noise and FPN Offset variation Normal readout mode – Self-induced noise – Ladder induced noise

3. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 3 3 New running conditions Using EX354RT lab power supply for VDD ladder and VDD buffers. – Developed noise pickup (?) that triggers overcurrent protection on our standard power modules Added 9 × 100 nF decoupling capacitors on VDD (1 per sensor, except for sensor 5) Bypassed bond wires for VDD and GND

4. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 4 4 New running conditions Thick sensor cable HIGH threshold settingsLOW threshold settings @ power supply3.68 (term. 3.65) (MTB 3.318) 3.68 (term. XX) (MTB 3.317) Sensor power3.2813.246 Driver power3.2283.214 Begin low mass section GND8 mV9 mV power3.2643.222 End of ladder power3.2433.199 End of ladder GND29 mV32 mV

5. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 5 5 Noise

6. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 6 6 FPN

7. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 7 7 Noise  FPN

8. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 8 8 Offset variation

9. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 9 9 Normal mode readout: self-induced noise 9 5×5× -1 mV-2 mV-3 mV A2965862210 B45233 k2.3 M2.7 M C1.0 k33 k2.3 M2.6 M D1772.4 k5.6 k5.7 k Sensor 2, others HIGH thresholds (sub-array A fixed threshold @ 5×  )

10. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 10 Ladder induced noise Sensor 2, others LOW thresholds Sensor 2 thresholds: 5× , - 1 mV, -2 mV

11. MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012 11 Summary Significant improvement with 9 decoupling capacitors Additional testing needed with full capacitor complement – Including repeatability Implications for ladder design: – TBD but likely a separate-power cable version