Presentation is loading. Please wait.

Presentation is loading. Please wait.

Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution:

Similar presentations


Presentation on theme: "Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution:"— Presentation transcript:

1 Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution: University of Hawaii at Manoa CfAO Akaimai Internship 2008 Subaru Telescope Mentor: Stephen Colley Funding provided by the Center for Adaptive Optics through its National Science Foundation Science and Technology Center grant (#AST-987683)

2 Today’s Presentation Project Intro Project Intro Problems Encountered Problems Encountered Approaches Approaches

3 Project Overview Design Built-In Test (BIT) software for deformable mirror high voltage driver in the Subaru LGSAO system. Design Built-In Test (BIT) software for deformable mirror high voltage driver in the Subaru LGSAO system. Measurements performed by BIT circuitry Input Voltages Input Voltages Output Voltages Output Voltages Power Supply Voltages Power Supply Voltages Board Temperature Board Temperature

4 Deformable Mirror (DM)

5 HV Driver Subsystem The HV driver subsystem in the Subaru LGSAO system consist of 10 HV Amplifier boards The HV driver subsystem in the Subaru LGSAO system consist of 10 HV Amplifier boards

6 High Voltage Amplifier Board High Voltage Amplifier Board

7 Built-In Test Circuit Main components: Analog Multiplexer (Mux) Analog Multiplexer (Mux) Analog-To-Digital Converter Analog-To-Digital Converter Microcontroller (PIC 16F877) Microcontroller (PIC 16F877) Temperature Sensor Temperature Sensor Mux A/D Converter Microcontroller Temperature Sensor Host Computer BIT Circuit

8 Built-In Test Software Program Language use: C Program Language use: C Step 1: Program in C Step 1: Program in C Step 2: Compile to Assembly language by PICC STD. Step 2: Compile to Assembly language by PICC STD. Pros and cons C is easier and much shorter than assembly language C is easier and much shorter than assembly language Programming requires the knowledge of microcontroller Programming requires the knowledge of microcontroller

9 Problem Encountered I: understand the circuit

10 II: Microcontroller

11 C compiler Not compactable with certain computer system Not compactable with certain computer system Unidentified bug ( Insert of leading 0) Unidentified bug ( Insert of leading 0) Special setting Special setting

12 Development tool In-circuit Debugger In-circuit Debugger MPLAB-IDE MPLAB-IDE

13 Communication Communication between the chips on the Communication between the chips on the built-in test circuit built-in test circuit Communication between the microcontroller Communication between the microcontroller and host computer ( I2C) and host computer ( I2C)

14 Approaches Review the knowledge learnt in school Review the knowledge learnt in school ( programming, digital design, circuit analysis) ( programming, digital design, circuit analysis) Search on Internet Search on Internet Read the data sheet of the device Read the data sheet of the device Get help from mentor Get help from mentor

15 Question


Download ppt "Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution:"

Similar presentations


Ads by Google