1. RCD Laser System Corey Lane, Ryan Scott, Danny Barjum

2. Microcontroller ParameterDescriptionValueComments C1Die Complexity.148-bit CMOS πTπT Temperature Coefficent1.5Assumed based on average microcontroller conditions C2Package Failure Rate.01328-pin nonhermetic πEπE Environmental Constant 2Fixed Ground πQπQ Quality Factor10Commercial Product πLπL Learning Factor1Over 2 years old λ p = (C 1 π T + C 2 π T ) π Q π L = 2.36 failures/10^6 hours MTTF = 1/ λ p =.4237e6 hours to failure

3. Bluetooth Modem ParameterDescriptionValueComments C1Die Complexity.16Assuming 10k-30k transistors πTπT Temperature Coefficent1.5Assumed based on average IC conditions C2Package Failure Rate.00256-pin nonhermetic πEπE Environmental Constant 2Fixed Ground πQπQ Quality Factor10Commercial Product πLπL Learning Factor1Over 2 years old λ p = (C 1 π T + C 2 π T ) π Q π L = 2.45 failures/10^6 hours MTTF = 1/ λ p =.4082e6 hours to failure

4. RF Reciever ParameterDescriptionValueComments C1Die Complexity.08Assuming 3k – 10k transistors πTπT Temperature Coefficent1.5Assumed based on average IC conditions C2Package Failure Rate.00133-pin nonhermetic πEπE Environmental Constant 2Fixed Ground πQπQ Quality Factor10Commercial Product πLπL Learning Factor1Over 2 years old λ p = (C 1 π T + C 2 π T ) π Q π L = 1.226 failures/10^6 hours MTTF = 1/ λ p =.8157e6 hours to failure

5. Voltage Regulator ParameterDescriptionValueComments λ d Base Failure Probability.002Voltage Regulator πTπT Temperature Coefficent3.9Assumed maximum operating temperature of 70˚C πSπS Stress Coefficent1Voltage Regulator πCπC Contact Construction Factor 1Metallurgically bonded contact πQπQ Quality Factor8Plastic casing πEπE Environmental Constant 6Fixed Ground λ p = λ p π T π S π C π Q π E =.3744 failures/10^6 hours MTTF = 1/ λ p = 2.6709e6 hours to failure

6. Failure Modes – μC Subsystem Failure ModePossible CausesFailure EffectsMethod of Detection Criticality Microcontroller doesn’t receive a signal from the RF receiver RF Transmitter, RF receiver, uC pin Inability to draw or select options ObservationLow Microcontroller doesn’t receive a signal from the camera Pixart camera, uC pin Software will not receive new coordinates ObservationLow Bluetooth transmitter is not transmitting data. Battery Subsystem, microcontroller, shorted bypass capacitor, Bluetooth transmitter Software will not receive any input ObservationLow

7. Failure Modes – Battery Subsystem Failure ModePossible CausesFailure EffectsMethod of Detection Criticality Battery overchargeFuel gauge, charger, sense resistor Heat, possible battery expansion, leakage or explosion Observe system failure, burning High Battery doesn’t charge Power supply, fuel gauge, charger, sense resistor System doesn’t operate after battery dies Observation, gauge LEDs Low Voltage regulator outputs greater than 3.3V Voltage regulatorDamage to all logic circuits, instability ObservationLow Voltage regulator outputs less than 3.3V Voltage regulatorInstability or no system response ObservationLow

8. Criticality Definitions Low Criticality – Inconvenience to the user or failure of system. λ p = 10^6 failures/hours High Criticality – Potential to harm user. λ p = 10^9 failures/hour Potential Improvements Independent monitoring of the battery voltage as a fail safe for the charger. Robust battery enclosure to reduce critically of battery overcharging. Monitor voltage regulator and shutdown system if out of range. Monitor charging power supply voltage and current. If RF data connection fails, always draw instead of never draw.