1. ECE 477 R ELIABILITY & S AFETY A NALYSIS Team 5 – myATM Xue Yuan Wong

2. O VERVIEW Automated Teller Machine (ATM) Use face recognition technology to verify identity 4-digit PIN Read/Write cash card via RFID Touchpad to navigate user menu Occupancy sensor to detect user

3. C RITICALITY L EVELS

5. C OMPONENT A NALYSIS Microcontroller (Microchip PIC18F24J11) Complex architecture Perform various tasks (eg: sample keypad buttons, occupancy sensor, RFID data, control modulation) Switching regulators (TI LM2675-3.3/5.0) Handles large amount of current

6. C OMPONENT A NALYSIS RFID read/write base station (Atmel U2270B) Has 16 pins. Multiple modules inside the chip.  On-chip power supply circuit  Antenna driver circuit  Frequency generator  Signal processing circuit (modulation/demodulation) Fast switching signals. Generate heat easily.

7. ParamaeterDescriptionValueComments C1C1 Die complexity0.2816-bit MOS microprocessor πTπT Temperature coefficient0.98Assume T J < 85 °C C2C2 Package failure rate0.01328 pins non-hermetic SMT component πEπE Environment factor2.0G F (ground fixed) πQπQ Quality factor10Commercial level πLπL Learning factor1.0Started production in March 2011. Production > 2 years λPλP Failure rate / 10 6 hours3.004 1/ λ P MTTF332889 hours = 38 years PIC18F24J11 Microcontroller

8. ParamaeterDescriptionValueComments C1C1 Die complexity0.01MOS linear gate with approximately 1 to 100 transistors πTπT Temperature coefficient16Assume T J < 100 °C C2C2 Package failure rate0.00348 pins non-hermetic SMT component πEπE Environment factor2.0G F (ground fixed) πQπQ Quality factor10Commercial level πLπL Learning factor1.0Started production in 2004 Production > 2 years λPλP Failure rate / 10 6 hours1.668 1/ λ P MTTF599520 hours = 68 years LM2675 Switching Regulator

9. ParamaeterDescriptionValueComments C1C1 Die complexity0.01MOS linear gate with approximately 1-100 transistors πTπT Temperature coefficient16Assume T J < 100 °C C2C2 Package failure rate0.007216 pins non-hermetic SMT component πEπE Environment factor2.0G F (ground fixed) πQπQ Quality factor10Commercial level πLπL Learning factor1.0Started production in 2005 Production > 2 years λPλP Failure rate / 10 6 hours1.744 1/ λ P MTTF573394 hours = 65 years U2270B RFID Read/Write Base Station

10. Section A - Power Supply Block

11. Section B - Microcontroller Block (1)

12. Section B - Microcontroller Block (2)

13. Section C – RFID Block

14. FMECA C HART Failure No. Failure Mode CausesEffectsMethod of Detectio n CriticalityRemarks A1VDD1 = 0V or VDD2 = 0V -Failure of switching regulator -L1,L2 open- circuit or short- circuit -No keypad input -Fail to access RFID cash card -Cannot detect user Intel board watchdo g Low A2VDD1 > 5V or VDD2 > 3.3V - Failure of switching regulator -Partial loss of ATM functionality Intel board watchdo g Medium Section A – Power Supply Block

15. FMECA C HART Failure No. Failure Mode CausesEffectsMethod of Detectio n Critical ity Re mar ks B1No keypad input is detected (RB1 = 0V, RB2 = 0V, RB3 = 0V) -Keypad buttons become less sensitive -Could not input PIN to authenticate user By observati on Low B2Microcontroll er UART becomes not responsive -Failure of MAX3232 -C4,C5,C6,C7 open-circuit or short-circuit -Loss communicatio n between microcontrolle r and Intel Atom Board -Intel board watchdo g - Observat ion Mediu m Section B – Microcontroller Block

16. FMECA C HART Failure No. Failure Mode CausesEffectsMethod of Detectio n Critical ity Re mar ks B3Pin “PIR” = 0V Potential failure of occupancy sensor -Fail to detect user - ATM stays at inactive mode By observati on Low Section B – Microcontroller Block

17. FMECA C HART Failure No. Failure Mode CausesEffectsMethod of Detectio n Critical ity Re mar ks C1Pin CFE continuously receives 0 or 1 -Potential failure of voltage translator (MAX3373) - Could not control modulation -Unable to read/update cash card By observati on Low C2Modulation frequency out of tolerance (f > 125 kHz or F < 125 kHz) -R3 short-circuit or open circuit - Internal modulation circuitry issue -Cannot detect cash card -Fail to read/update cash card By observati on Low Section C – RFID Block

18. FMECA C HART Failure No. Failure Mode CausesEffectsMethod of Detection Critical ity Remark s C3Data rate out of tolerance (125 kHz / 32) - Incorrect register configuration of RFID cash card - Potential failure of cash card -Unable to read RFID cash card By observatio n Low Section C – RFID Block

19. Q UESTION