1. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Flying Probe Tester APT8400 Component Test

2. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Flying Probe Test Features: 4 positionable test pins Test for production defects (open, short, R, C, L values) Advantages: No adapter costs Test pads smaller in comparison to pin adapters (0.2 mm compared with 0.8 mm) Short test program development time Low test program development costs

3. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Net Test Method for reducing the test time and improving the fault coverage level Method for reducing test times Reduces the number of contacts and consequently the test time (in the standard test the neighbouring networks are contacted to detect SHORTs; in the network test the networks are usually only contacted once) Test time reduction: rate of 2.5 to 7. improving the fault coverage level - complete control of the contacts - improved fault coverage level in relation to SHORTs (any 2 lines) - improved fault coverage level in relation to IC-OPEN if an internal impedance (R,C) is measurable Improved fault coverage level in relation to line interrupts

4. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Sample for Net(z)test application Standard-Test ~ 1300 needle movements NET (z) Test ~ 260 needle movements 100 1000 200 60 200 Component test Short test IC-Pin test Component test NET(z)test 100 components, 200 nets with respective 5 neighbouring nets

5. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering What faults are detected by the network test? 1) SHORTS between any two networks 2) Element faults (OPEN, incorrect value) for all elements connected to potential 3)IC-OPEN for IC pins if the 1IC/network condition is fulfilled What faults are not detected by the network test? 1) IC-OPEN for IC pins if there is more than one input/output in the network. Improved fault coverage level with the network test 1) SHORTS between any two networks 2) IC-OPEN (detection of internal linear elements) Fault Detection in the Network Test

6. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Test acceleration as a result of introducing the network test 1) All SHORT test stages no longer apply 2) Elements with a connection to the potential test within the framework of the network test 3) Minimum pin trajectory (optimum network sequence) 4) Effectiveness of pin movements with 4 pins (2 SHORT tests correspond to 3 network tests) Reducing the Test Time

7. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Cost Comparison Net Test / Standard Test / ICT Test ICT-Test:Standard test:Net(z)test: Progr.c.+Adapts c.: 15.000 EUR Program costs.: 4.000 EURProgram costs.: 6.000 EUR Test costs/piece: 0,42 EURTest costs/piece: 5 EURTest costs/piece: 1 EUR

8. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering Cost Comparison ICT Test / Net Test (Fl.-Pr.) / Net Test + Boundary Scan ICT-Test:Standard test:Net test: Progr.c.+Adap c.: 15.000 EUR Program c.: 4.000 EURProgram c.: 6.000 EUR Test costs/piece: 0,42 EURTest costs/piece: 5 EURTest costs/piece: 1 EUR

9. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering NET (z) Test soft ware Fabmaster UNICAM TAKAYACA8-File Program development

10. Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Electronic Design - Test Engineering perfect board defect board NET (z) Test program NET (z) Test - program diagnosis- software inside of NET (z) Test NET (z) Test- program NET (z) Test - program Testing with Net(z)test