1. 1 May 2015 Qulity & Reliability Test and Measurment– Materials Analysis Ingrid Snijkers Accelerate your innovation

2. 2 ©2015 Philips Innovation Services | Confidential Looking for expertise? Should you plan for a maturity step in one of your processes? Maybe you lack specific competencies or a particular challenge requires an out-of-the- box solution ? Do you struggle with a tough problem to solve? Are you planning an innovation and looking for ways to get it to the market fast? 2’ introduction video ›

3. 3 ©2015 Philips Innovation Services | Confidential A short introduction

4. 4 ©2015 Philips Innovation Services | Confidential A short introduction Our services

5. 5 ©2015 Philips Innovation Services | Confidential Materials Analysis – a snapshot https://www.youtube.com/watch?v=XbVPItr-tKw

6. 6 Materials Analysis Group 44 experts in chemical analysis, molecular and structural analysis, surface and thin film analysis Characteristics of our group:  broad spectrum of analytical techniques and product knowledge  actively involved in R&D, manufacturing and troubleshooting  solution oriented, together with customers

7. 7 Materials Analysis Competences The compositional & physical inspection of materials and objects; (*) Identifying material properties and characteristics, (*) Enabling proper material choices and specification/optimization of processes, (*) Providing support in reliability issues, problem solving, quality control, failure analysis, competitor analysis (*) Providing easy acces to services, facilities and expertise for all material analysis Compositional Analysis Contamination Control Surface & thin film analysis Advanced Imaging Materials Consultancy Physical Characteri- zation

8. 8 substrate surface coating layer composition & profile Applications need a mix of all analytical expertises substrate composition & structuregas composition & contaminationinterface profile surface condition

9. 9 Advanced imaging Most of the time the relevant features are not revealed by simple visual inspection. We offer the facilities and expertise for creating and analyzing images, making visible for you what cannot be seen with the naked eye. With our microscopy and imaging instrumentation we are capable of visualizing structures across length scales from many centimeters to sub-nanometer. The techniques allow us to look at as well as below the surface, either directly or via proper sample preparation. Spectral imaging, 3D imaging, high-speed imaging and imaging of various material properties also belong to the possibilities. Moreover, you can rely on our experts for automation and image analysis. SEM, SEM-EDX, FIB, TEM, AFM, SPM, XRT

10. 10 Compositional analysis We can identify the make-up – from the main constituents to ultra traces – of bulk materials, thin layers, solutions and gases. Through this analysis, we provide support in R&D, quality control, reliability issues and problem solving in general. There are no restrictions in advance as we pride ourselves on being able to offer solutions for any type of material. We have experience with specific sample handling to avoid even low-level contamination, pre-treatment to allow subsurface analysis and we even develop remote, non-destructive tools for at-line applications. Compositional analysis is also a firm foundation under a range of Quality & Reliability related competences, allowing in-house characterization of any type of material by people with both technical and application expertise. ICP-MS, ICP-AES, La-ICP-MS, elemental analysis, FT-IR, Raman, NMR, GC-MS, IC-MS, LC-MS, XRD, XRF

11. 11 Surface and thin film analysis Our high-precision analytic tools include electron microscopy (SEM, TEM, FIB), electron spectroscopy (XPS, AES), X-ray diffraction (XRD), ellipsometry, scanning probe techniques (AFM, SOM..), elemental analysis techniques (SIMS, LA-ICP-MS), molecular analysis techniques (FT-IR, Raman) and much more. They give you detailed insight into key manufacturing processes such as deposition, etching, cleaning, implantation and diffusion Key expertise areas Surface contamination Composition depth profiling Layer thickness Roughness and step coverage Adhesion and delamination Strain and stress SEM, FIB, TEM, XRD, ellipsometry, AFM, SPM, SIMS, LA-ICP-MS, FT-IR, Raman,…

12. 12 Contamination Control We can help you contamination control issues as diverse as analyzing supply gases at the ppq levels and sub-monolayer analysis of wafer surfaces. Moreover, you can call on us to solve problems at your site or provide routine analyses for existing products and processes. And we are at the forefront of developing new techniques to address specific challenges – such as combining 2D-FTIR (Fourier transform infrared spectroscopy) and chemometric data analysis. Our extensive trace analysis services include advanced techniques such as (X-ray photoelectron spectroscopy), Auger emission spectroscopy, TOFSIMS (time-of-flight secondary ion mass spectroscopy) and LA-ICP-MS (laser-ablation inductively coupled plasma mass spectrometry). Moreover, you can rely on our experts for support and advice to ensure you find the right analytical solution for your needs Gas analysis, FT-IR, TOF- SIMS, La-ICP-MS, TOF SIMS, chemometric data- analysis,..

13. 13 Physical characterization Apart from offering a wide range of physical characterization techniques, our ability to correlate information from different sources is what provides added value for our customers. Whether it is the rheological behaviour of material that needs to be optimized for processing or the thermal stability of materials that are used under challenging conditions, we can help. Key expertise area: -Failure analysis -Mechanical testing Rheology, thermal analysis, particle size distribution, surface area, porosity, permeability, DSC,..

14. 14 6 August 14, 2014 Our customer support - Early involvement -Structured problem solving -Development of tools & protocols to detect lower contamination levels -Fast & non-destructive analysis -Benchmarking analysis -Materials consultancy -Data mining -DfSS approach (Philips) We deliver our service over the full innovation chain

15. 15 ©2015 Philips Innovation Services | Confidential Proud to serve…

16. 16 ©2015 Philips Innovation Services | Confidential Global organization, local partner Andover Eindhoven Turnhout Aachen Pila Shanghai Chengdu

17. 17 How can we help to accelerate your innovation? www.innovationservices.philips.com

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