1. Jianchun Wang Syracuse University 10/16/99 CLEO Meeting Outline DAQ problems solved Recent results Status of DAQ Work to be done

2. 10/16/99 Jianchun WANG, Syracuse University 2 DAQ Problems Solved  Software problem  Corrupted data  DAQ bug, results in digital +2 V not set  Hardware problems in digital data boards  VME buffer/driver destroyed ( 14 boards affected )  Wrong VME and Sequencer code  ADC buffer damaged ( 20 boards affected )  Buffer enable conflict  Timing problem  Wrong timing caused wrong ADC to be read out

3. 10/16/99 Jianchun WANG, Syracuse University 3 Corrupted Data o Noise expected to be 3-4 ADC counts (~500 e) o DAC address 0-3 was shifted to be 1-4 o Effectively digital +2V not set o Bug fixed and noise as good as expected o Parameter monitor and alarm working now Pedestal RMS (ADC counts)

4. 10/16/99 Jianchun WANG, Syracuse University 4 Noise Performance Each crate checked, no problem with CC and cable Half cylinder tested simultaneously with repaired boards Total noise ~ 3.6 ADC counts Incoherent noise ~ 2.6 ADC counts (400 e)

5. 10/16/99 Jianchun WANG, Syracuse University 5 Parameter Monitor ****************************** * Crate: 123 Board: 4 * * Board ID: RICH ANALOG A025 * ****************************** ** Board values** Ch. 0 -> +5 analog: 480 4.996 V Ch. 1 -> -5 analog: 343 -5.191 V Ch. 2 -> +2 digital: 470 2.460 V Ch. 3 -> -2 digital: 477 -2.543 V Ch. 4 -> board temp: 509 25.224 C Ch. 5 -> cal pulse: 615 0.097 V ** Cell values** Ch. 0 -> +2 analog: 524 2.013 526 2.015 526 2.015 V Ch. 1 -> -2 analog: 216 -2.288 213 -2.291 214 -2.290 V Ch. 2 -> Vfp: 625 -0.486 628 -0.483 630 -0.480 V Ch. 3 -> Vfs: 688 0.673 682 0.667 685 0.670 V Ch. 4 -> Vref: 472 -0.673 474 -0.671 479 -0.665 V Ch. 5 -> prebias: 634 0.494 644 0.502 594 0.463 mA Ch. 6 -> shabias: 298 0.023 321 0.025 325 0.025 mA Ch. 7 -> iBuf: 0 0.000 1 0.000 1 0.000 mA Ch. 8 -> thermistor: 544 22.110 541 22.375 542 22.287 C Ch. 9 -> ADC offset: 741 1.811 741 1.811 740 1.808 V  Parameter monitor: Voltages, Bias currents, Temperatures  protect data board, chamber, ensure data quality  Readout via SBUS  By Bayar & Jian  Auto measurement and alarm implemented  Need to integrate into main slow control and alarm system

6. 10/16/99 Jianchun WANG, Syracuse University 6 Data Boards

7. 10/16/99 Jianchun WANG, Syracuse University 7 ADC Buffer Problem  ADC readout difference is small within one chain with no front end electronics connected  Difference of 256 suggests that bit 8 may be wrong  Buffer damaged and bits shorted  Wrong buffer enable before initialization and during reprogramming  All 20 boards repaired ; all digital boards modified pull-up resistor array

8. 10/16/99 Jianchun WANG, Syracuse University 8 Timing Problem o Wrong buffer timing or FIFO timing may cause wrong ADC selected (duplication, rotation ) o Test chain with no CC4 used to check all boards o 4 boards found such problem o All boards are adjusted

9. 10/16/99 Jianchun WANG, Syracuse University 9 Wirepulse Calibration Calibration pulse sent to anode wire and measure induced charge Half cylinder shown here Signal height quite uniform Dead channels 0.4%

10. 10/16/99 Jianchun WANG, Syracuse University 10 Plane Radiator

11. 10/16/99 Jianchun WANG, Syracuse University 11

12. 10/16/99 Jianchun WANG, Syracuse University 12 Status of DAQ  DAQ version 9902 and 9904 were used in the runs shown  Version 9902 uses only software trigger on TIM, so two crates can not be triggered simultaneously  Version 9904 use DFC and GCAL send trigger to TIM, configuration manager not function  DAQ version dlib (Y2K) has a successful run on two RICH crates. More functions need to be tested.  More details, see Todd’s talk

13. 10/16/99 Jianchun WANG, Syracuse University 13 Work To Be Done  Read out all RICH crates with new DAQ system  Measure pedestal, noise performance and wirepulse calibration to find any remaining problematic boards  Test new DAQ functions including single channel calibration and data sparsification  Continue coding on online monitor  Determine the mode for big calibration  Cosmic ray run