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End Cap Board Testing Status at Penn July 14, 2004 Anton & Campion Mitch.

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Presentation on theme: "End Cap Board Testing Status at Penn July 14, 2004 Anton & Campion Mitch."— Presentation transcript:

1 End Cap Board Testing Status at Penn July 14, 2004 Anton & Campion Mitch

2 Tools thrate program Threshold ramp examines occupancy. Edge Rate ( Frequency Plots). tpscan program Will be used on second pass to examine low gain chips for internal connectivity. DVM measurements Verify continuity to ASICS, low level diagnosis of problems.

3 ‘A’ Wheel Boards from NBI Received 12 Tested 12 4 Shorts on NAIS Connectors 8 ASD’s with > 20 DAC cnts Low Offset 5 ASD’s with 10<Offset<20 19 ASD’s with “ Low “ Gain

4 Example Anomolies ASD A0060215 Normal ASD Chip High Offset Not Typical Failure Low Gain

5 ASD Anomolies ASD A0060215 Normal ASD Chip High Offset Not Typical Failure Low Gain Threshold Scan edge rate analysis

6 Low Threshold Offsets ASD A0059587 ASD A0063033

7 ‘B’ Wheel Boards from NBI Total of 11 - Results from 8 Tabulated 1 No detected problem 2 Shorted input pins 1 Questionable output 1 Bad ASD output 2 Possibly misaligned connectors (intermittent missing channel ) 6 Lo gain 2 Offset > 20 1 10< Offset< 20

8 B Wheel Board #VNG0061 ASD #A0062930 Unusual Input Resistance on low gain channels 12, 14, 14, 15K ohms

9 Algen Boards 25 received - 19 tested 0 Assembly Errors 6 Offset > 20 30, 40, 45, …. 9 10< Offset < 20 1 Lo Gain

10 ASDBLR Questions 1.Is the IMS testing accurate enough? 2.Is the selection working? ( Yes so far.) 3.Do we want to change the threshold offset acceptance windows? 4.Do we want additional IMS cut criteria?


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