Presentation on theme: "Surrey.ac.uk/surfaceanalysis Analysis of Sub-Micron Metal Particles By Proximal Excitation of X-rays: Proximal XPS Christopher F. Mallinson Department."— Presentation transcript:
Surrey.ac.uk/surfaceanalysis Analysis of Sub-Micron Metal Particles By Proximal Excitation of X-rays: Proximal XPS Christopher F. Mallinson Department of Mechanical Engineering Sciences The Surface Analysis Laboratory 2nd July 2014
Surrey.ac.uk/surfaceanalysis With the increasing interest in the health and safety issues associated with the use and emission of small particles, there is a need for the chemical analysis of sub-micron sized particles. Introduction Thermo Scientific Microlab 350 Scanning Auger Microscope
Surrey.ac.uk/surfaceanalysis What is Proximal XPS and How is it Performed? Schematic of analysis set up in Scanning Auger Microscope Conditions: 15 kV beam energy Beam just off the particle, 200 -300 nm Tilt sample 40° from sample normal
Surrey.ac.uk/surfaceanalysis Results from Copper Particle α * copper particle = 1852.3 eV indicative of copper (II) oxide 500 x 800 nm particle
Surrey.ac.uk/surfaceanalysis Results from Iron Particle 500 x 800 nm particle
Surrey.ac.uk/surfaceanalysis Possible Beam Damage
Surrey.ac.uk/surfaceanalysis Take Home Message Locally generated X-rays have been used to analyze sub- micron metal particles to obtain chemical information. Further work is needed to improve the technique to achieve more reliable results. Thank you for listening Any Questions?