1. Interferometric Residual Phase Noise Measurement System Pakpoom Buabthong Lee Teng Internship Program Advanced Photon Source Accelerator System Division, RF Group Tim Berenc (Mentor) Argonne National Laboratory

2. Noise Characterization of Radio Frequency (RF) Devices Phase & Amplitude noise of a RF Carrier Lee Teng Internship 2013, Final Presentation 2 Signal Level Frequency Carrier Residual or noise added to carrier by a device - Useful for characterizing noise added by a device or differential noise between devices (i.e. Short Pulse X-ray RF Cavities) Device Under Test ϕ Frequency Spectrum Polar Cartesian

3. Noise Measurement Using Saturated Mixer Lee Teng Internship 2013, Final Presentation 3 90⁰ Phase Shift -Source phase noise ideally cancels -Insensitive to amplitude fluctuations Source V1V1 V2V2 Low Noise Amplifier (LNA) Low Pass Filter (LPF) Fast Fourier Transform R(t) Scaling factor : Cable length difference : -Measure the ratio of voltage and phase change when adjusting the phase shifter

4. System Noise Floor Lee Teng Internship 2013, Final Presentation 4 90⁰ Phase Shift Source V1V1 V2V2 Low Noise Amplifier (LNA) Low Pass Filter (LPF) Fast Fourier Transform Frequency (Hz) Noise Referred to the Output of LNA Frequency (Hz) Noise Referred to the Input of LNA dBrad 2 /Hz Frequency (Hz) Test Set Noise Floor

5. Interferometric Noise Measurement Lee Teng Internship 2013, Final Presentation 5 Signal Level Frequency Carrier DUT Noise 90⁰ Phase Shift RF Amp Suppress Carrier Signal Level Frequency Source LO Amplify residual noise -Suppress the carrier -Eliminate dynamic range issue if one tried amplifying noise in presence of large carrier -Sensitive to mechanical vibrations due to multiple components

6. Interferometric Noise Measurement Lee Teng Internship 2013, Final Presentation 6 Interferometric system’s Prototype

7. Interferometric Noise Measurement Lee Teng Internship 2013, Final Presentation 7 Coarse Adjust 180⁰ Phase Shift RF Amp LO Fine Adjust Coarse Adjust Fine Adjust

8. LO Calibration Lee Teng Internship 2013, Final Presentation 8 LO dBVpk Frequency (Hz) Amplitude/Phase Modulation for LO Calibration -Amplitude modulation gives better detection for minimum -More difficult to find the maximum than to find the minimum

9. Scaling Factor Lee Teng Internship 2013, Final Presentation 9 -Compare the ratio between the carrier and the sideband with a specific offset frequency Signal Level Frequency Carrier Sideband

10. Contributions to Interferometric System and Comparison Lee Teng Internship 2013, Final Presentation 10 Inteferometric System’s Noise Floor dBrad 2 /Hz Frequency (Hz) dBrad 2 /Hz Frequency (Hz) -Rf amplifier limits the system’s white noise floor -Mechanical vibrations and rf amplifier flicker (from imperfect carrier suppression) limit lower frequency noise -Lower noise floor -10-15 dB improvement Comparison Cumulative Integral

11. Future Recommendation Lee Teng Internship 2013, Final Presentation 11 -Install the measurement system to an optic table -Amplifier with lower noise floor Time Domain Data from the Two Systems Normal Knock on the table Walk Wave over the set-up