1. Optical Readout Interface (ORI)
latency
+24 ns
+24 ns
+300 ns
Conf.
Mem.
125MHz
120MHz
8 bit
DDR
I2C
SERDES
2.5GBits/s
Laser
Driver
CPLD
HCM (TRAP)
LVDS-TTL 16
DDR SDR
Resynchronization, status, counters
VCSEL
Laser Diode
850 nm

2. ORI – production test (laser diode)
Several parameters controlled:
Supply currents at various operation mode conditions
Voltages on the board in enabled/disabled state
Source, bias and modulation currents through the laser diode
Temperature of the laser driver chip
optical output power
photodiode current measured by the laser driver chip

3. No permanently damaged components. Equivalent time in years in blue,
No permanently damaged components. Equivalent time in years in blue, * - the device fails.
Recovery after power cycle or switching off for up to 12 hours (VR and Laser Driver).
The configuration of the CPLD and EEPROM was not damaged.
Laser Driver Linear Technology LTC *
VCSEL Diode ULM Photonics ULM LC-TOSA 20
EEPROM 24LC01 30*
LVDS Transceiver National Semiconductor DS90LV048A 30
CPLD Lattice LC4256V
15-50*
Serializer Texas Instruments TLK2501
250*
Voltage Regulators National Semicondutor LP and *
F.Rettig

5. CLK C
D Q Q A Y0 Y1 Y2 Y3 E
D Q
GCNTp
decoder
4:1 mux
with gray encoding
GCNTc
STROBE
IN DATA
GREG B
A=B
comp
Falling edge data
OUT DATA
VALID