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Characterization of CsI:Tl recrystalization after liquid phase deposition Ulrik Lund Olsen, Ph.D. student supervisors: H.F. Poulsen, S. Schmidt SCINT’07,

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Presentation on theme: "Characterization of CsI:Tl recrystalization after liquid phase deposition Ulrik Lund Olsen, Ph.D. student supervisors: H.F. Poulsen, S. Schmidt SCINT’07,"— Presentation transcript:

1 Characterization of CsI:Tl recrystalization after liquid phase deposition Ulrik Lund Olsen, Ph.D. student supervisors: H.F. Poulsen, S. Schmidt SCINT’07, Salem Winston, June 4-8 2007

2 Aims of project Diffracted Beam Grain in Aluminum Sample Scintillator Mirror Microscope Lens CCD photons 540nm X-rays 50keV Submicron grains structure resolved at high energy (30-100keV) at fast kinetic low flux diffraction meassurements. fundamental relationship between scintillator thickness and resolution

3 Principle - Structured Scintillator CsI:Tl SiO2 Si

4 Electrochemical etching HF solution etches surfaces with positive donors Light induced donors are guided by an applied electric field Field determined by silicon resistivity and bias HF e- + + + R.L. Smith and J.D. Collins, J. Appl. Phys. 71, 8, R1 (1992)

5 Pore Structure 10µm 1µm SiO2

6 Pore Filling Process CsI:Tl powder on Silicon surface Sealed sample holder Tube furnace Controlled cooling rate

7 Bulk characterization Focused Ion Beam(FIB) milling 4µm 10µm Ions

8 Crystal characterization - EBSD Grain size Distribution Electron Backscatter Diffraction

9 Compositional characterization - Fluorescence Flourescence exited with 90keV synchrotron radiation: local (w/ focused beam) large lead(Pb) background Au Sn Kβ1Kβ1 Kβ1Kβ1 Kα1Kα1 Kα1Kα1 Kα2Kα2 fit

10 Compositional characterization - PIXE Particle induced X-ray Emission: 40keV protons bulk information (250µm penetration) global probe (2mm 2 beam)

11 Compositional characterization - PIXE manufacturers specs on as-received was 0.2 wt% (GB crystals)

12 Composition characterization - SIMS Secondary Ion Mass Spectroscopy: local information surface probing high compositional sensitivity (>ppm) uneven sensitivity to different species No.Ion CentMass CI 1I 126.8895 434 2Cs 132.8742 564067 3^203Tl 203.0080 1069 4Tl 205.0127 1362 5Cs_2 265.7874 170843

13 Conclusion Multiple characterization tools needed textural information from high resolution EBSD absolute composition from PIXE meso-scale relative composition from x-ray induced fluorescence local composition – SIMS Thanks to: T. Martin (ESRF) V. Honkimaki (ESRF) M. di Michiel (ESRF) X. Badel (KTH) J. Linnros (KTH) N.B. Larsen (RISØ) J.C. Grivel (RISØ) C. Gundlach (ESRF) Funding: Danish Fundamental Research Foundation &

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