1. Texture analysis of geological materials experimentally deformed at high p and T Florian Heidelbach Bayerisches Geoinstitut University of Bayreuth Texture analysis with synchrotron radiation Rock deformation at high p and T

2. Synchrotrons ESRF, France SPring8, Japan BESSY, Germany

3. Copied from BESSY website Copied from ESRF website high brilliance low divergence tunable energy Synchrotron radiation

4. Texture analysis of polycrystals with high spatial resolution and monochromatic X-rays Debye Scherrer geometry in transmission Rolled Al PE fibreApatite (bone)

5. Transferring Debye Scherrer cones into pole figure coordinates Opening angle of small circle  Calculating the ODF and complete pole figures from incom- plete experimental pole figures

6. Single grain mapping with polychromatic X-rays Laue diffraction in transmission Orientations of single grains No rotation of the sample Resolution determined by beam size and sample thickness (!) Indexing procedure is critical

7. Automatic indexing of Laue patterns via gnomonic projection... Laue pattern of olivineGnomonic projection

8. … and Hough transform Laue pattern (white) with solution (black) Hough transform Gnomonic projection with zones Wenk et al. 1997, J. Synchr. Rad. 4, 95

9. Separating Laue patterns from different single crystals a large number of single crystals is illuminated at the same time a platinum wire is stepped across the sample surface single grain diffraction patterns are reconstructed by taking the intensity variations due to the Pt wire into account submicron resolution can be reached (Larson et al. 2002)

10. Mapping orientation and stress distributions with Laue diffraction Tamura et el. 2002 Appl. Phys.Lett. 80, 3724 overlapping Laue patterns are mathematically separated by taking the X-ray spectrum and the crystal structure into account

11. Local texture analysis with a moving 2D detector and high energy radiation  scan of cold-rolled Ni detector is stepped synchronously with sample movement in  or y Bragg angle slit is used to filter reflections Bunge et al. 2002, Adv.Eng. Mat. 4, 300

12.  scan for recrystallized Ni sheet y scan of {111} in recrystallized Ni sheet