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NON-INTERCEPTING DIAGNOSTIC FOR HIGH BRIGHTNESS ELECTRON BEAMS USING OPTICAL DIFFRACTION RADIATION INTERFERENCE (ODRI) A. Cianchi #1,2, M. Castellano 3,

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Presentation on theme: "NON-INTERCEPTING DIAGNOSTIC FOR HIGH BRIGHTNESS ELECTRON BEAMS USING OPTICAL DIFFRACTION RADIATION INTERFERENCE (ODRI) A. Cianchi #1,2, M. Castellano 3,"— Presentation transcript:

1 NON-INTERCEPTING DIAGNOSTIC FOR HIGH BRIGHTNESS ELECTRON BEAMS USING OPTICAL DIFFRACTION RADIATION INTERFERENCE (ODRI) A. Cianchi #1,2, M. Castellano 3, L. Catani 2, E. Chiadroni 3, G. Gatti 3, K. Honkavaara 4, G. Kube 4 1 University of Rome “Tor Vergata” v. della Ricerca Scientifica 1, 00133 Rome, Italy 2 INFN- Roma Tor Vergata, v. della Ricerca Scientifica 1, 00133 Rome, Italy 3 INFN –LNF, v. E. Fermi 40, 00040 Frascati (RM), Italy 4 DESY, Notkestrasse 85, 22607 Hamburg, Germany IX International Symposium RREPS - 11

2 Outlook  Importance of not intercepting diagnostic  Optical Diffraction Radiation vs Optical Diffraction Radiation Interference  Non collinear apertures  Experimental setup  Results  Horizontal polarization

3 High Brightness Machines [A/(m-rad) 2 ] V. Balandin, N. Golubeva High density power beam can substantially damage or destroy a foil or a wire scanner Possible alternatives are multishots devices ― Wire scanner (intercepting) ― Laser wire

4 Optical Diffraction Radiation (ODR)  The charge goes into the hole without touching the screen  The electromagnetic field of the moving charge interacts with the metallic screen  No power is deposited on the screen  The angular distribution of the emerging radiation is affected by the beam transverse size, the angular spread and the position inside the slit  Rectangular slit P. Karataev et al., “Beam-Size Measurement with Optical Diffraction Radiation at KEK Accelerator Test Facility”, Phys. Rev. Lett. 93, 244802 (2004)

5 Background noise E. Chiadroni et al., Non-intercepting electron beam transverse diagnostics with optical diffraction radiation at the DESY FLASH facility NIM B 266 (2008) 3789–3796 Mainly Synchrotron radiation, both directly coming for bending magnets and reflected from the vacuum chamber walls

6 Two slits geometry (ODRI) Optical Diffraction Radiation Interference (ODRI)

7 Collinear slits Point like beams with different angular spread Possible confusion between the contribution of the angular spread and the beam dimension

8 Non collinear slits The 50  m offset between the slits is enough to avoid mixing between the contributions of angular spread and beam size

9 Approximations and formulas  Perfect metal  Filter bandwidth negligible  Beam energy spread negligible  Beam Gaussian both in y and y’  Slit parallelism correction (M. Castellano, E. Chiadroni, A. Cianchi, “Phase control effects in optical diffraction radiation from a slit”, Nuclear Instruments and Methods in Physics Research A 614 (2010) 163–168)  Numerical code

10 Experiment @ FLASH FLASH is an excellent linac for this experiment:  High energy up to 1 GeV  Large number of bunches (up to 30) with high charge (up to 1 nC)  Frequency repetition 5 Hz  Long collaboration history

11 Optical System (1) High Sensitivity Hamamatsu Camera  High quantum efficiency  Air Cooling -55˚C  Long exposure time up to 2 hours Interferential filter at 800 nm Interferential filter at 450 nm Glenn-Thompson polarizer Achromat Lens with f=500 mm for DR angular distribution Lens with f=250 mm for beam imaging Hamamatsu CCD camera

12 Experimental Setup (1) Mirror Lenses Actuator Interferential filters Polarizer Camera holder

13 center -25 um -50 um -75 um -100 um -125 um -150 um Angular distribution

14 center +25 um +50 um +75 um +100 um +125 um +175 um Angular distribution (2)

15 Two different spots OTR beam 78±4 μ m 90±4 μ m ODRI beam 82 μ m 94 μ m,

16 A divergence of about 320 μ rad can be estimated from a quadrupole-scan emittance measurement carried out under the same experimental conditions RMS Beam Size (  m) 8278 RMS angular spread (  rad) 260310 Displacement in respect to the second slit (  m) -6-55 Misalignment between two slits (  m) 110113

17 Hardware evolution  New design in the mover Old screen holderNew screen holder

18 Experimental Setup (2) Mirror Lenses with one apochromatic lens Interferential filter 2 polarizers

19 Different wavelength 800 nm550 nm

20 Horizontal polarization Vertical Horizontal

21 X polarization 550 nm800 nm

22 Scan with the 1 mm slit 0.5  m slit out off center about -70  m 1 mm slit move range from -66  m to +200  m

23 To improve  Horizontal polarization features not fully understood  A control of the all known parameters is mandatory in order to make precise measurements  An analytic formula would be better than a MonteCarlo code

24 Conclusion  ODRI is in developing  ODRI dramatically reduce or eliminate the problem of background  Asymmetric configuration resolves parameters ambiguities  New measurements are foreseen to make a totally non intercepting emittance measurement

25 Thank you for your attention

26 Formulas

27 Multiple fit

28 Importance of side peaks

29 All data


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