1. Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Scanning electrochemical microscopy (SECM) UV & visible spectroscopy Transmission experiments Specular reflectance & ellipsometry Internal reflection spectroelectrochemistry Second harmonic spectroscopy Vibrational spectroscopy: IR spectroscopy, Raman spectroscopy Electron & ion spectroscopy XPS, AES, LEED, HREELS, mass spectroscopy Magnetic resonance methods: ESR, NMR Quartz crystal microbalance X-ray methods: XAS, XRD A Scanning probe techniques. Spectroelectrochemistry (ch. 16/17)

2. Microscopy: optical → scanning electron or force → STM, AFM in situ vs. ex situ techniques Scanning tunneling microsocpy (STM) Scanning probe techniques (ch. 16)

3. Au(111) at 0.7 V vs. NHE in HCl

4. Electrochemical STM

5. STM images of HOPG STM images of Pt(111) with I-adlattice in HClO 4

6. STM images of Cu(111): effect of etching

8. Scanning tunneling spectroscopy (STS)

9. Atomic force microscopy (AFM)

10. Cantilever displacement vs. z-deflection for (left) attractive interaction and (right) repulsive interaction

11. AFM of Cu underpotential deposition (UPD) on Au(111) Electrochemical AFM

12. Scanning electrochemical microscopy (SECM)

13. Principles of SECM

14. SECM appoach curves for steady-state currents

16. Imaging surface topography & reactivity Ta oxide formation on Ta

18. Commercialized SECM

19. SECM applications Ag line formation Electrochemical Cu etching

20. Spectroelectrochemistry (Ch. 17) UV & visible spectroscopy 1. Transmission experiments

21. Cell for transmission spectroelectrochemistry

22. Responses for transmission spectroelectrochemistry

23. Spectra of cobalt complex at different potentials

25. Detector Power meter Potentiostat Electrochemical cell or EC devices He-Ne laser (633nm) In-situ transmittance test

26. 2. Specular reflectance and ellipsometry

27. Elliptic polarization arising from a phase shift between parallel & perpendicular components

28. Specular reflection spectroscopy

29. Electroreflectance spectra of Ag in NaClO 4

30. Reflectance changes caused by halide adsorption on Au

32. Ellipsometer Ellipsometry

33. Ellipsometric results for anodization of Al in tartaric acid

34. Growth of passive film on Fe at 0.8 V vs. SCE

35. Growth of polyaniline film: experiemental (dotted) vs. fiited resluts (solid)

36. 3. Internal reflection spectroelectrochemistry

37. Transient absorbance

38. Surface plasmon resonance (SPR)

39. SPR curves for Au and monolayers

40. 4. Photoacoustic and Photothermal Spectroscopy

41. 5. Second harmonic spectroscopy Second harmonic generation (SHG)

42. SHG response