Presentation is loading. Please wait.

Presentation is loading. Please wait.

LCFI POsC, July 13, 20071 LCFI Project Oversight Committee Outline CCD Clock Drive (WP3/4) External Electronics (WP4) CCD Sensors (WP2) CCD Testing (WP5)

Similar presentations


Presentation on theme: "LCFI POsC, July 13, 20071 LCFI Project Oversight Committee Outline CCD Clock Drive (WP3/4) External Electronics (WP4) CCD Sensors (WP2) CCD Testing (WP5)"— Presentation transcript:

1 LCFI POsC, July 13, 20071 LCFI Project Oversight Committee Outline CCD Clock Drive (WP3/4) External Electronics (WP4) CCD Sensors (WP2) CCD Testing (WP5) ISIS Sensors (WP2) Mechanical (WP6)

2 LCFI POsC, July 13, 20072 CPD1 Testing o CPD1 driver ASIC –Designed for large and small sensors: 40 nF at 50 MHz or 127 nF at 25 MHz –One chip drives both phases with 3.3V clock swing, 21 amps/phase –0.35  m CMOS process, 3x8 mm 2 o Features –Three separate modes for operation over a wide range of frequencies –Designed to provide >2V pk-to-pk, up to 50MHz o Testing results –Control circuitry and integrated capacitive load work well –Tested to 50 MHz in test board (at right) –First demonstrated operation at 50 MHz Works well, now mounted and testing in MB5.0 CPD1 50 MHz, 2nF internal load 50 MHz, 40 nF external load

3 LCFI POsC, July 13, 20073 External Electronics Many different boards since last POsC: o CPD1 Test Board –Boards completed and in use o MB5.0 –Layout and production complete –Several boards produced and in use o CPC-T –Layout nearly complete –Provides clocks, outputs and measures capacitance o BVM sequencer boards –All 10 BVM2’s in use; 5 more being made –Plans for BVM3 coming together- significant advance o Transformer Drive –Works to 45 MHz, limited by parasitic inter-winding cap –Test improved designs standalone--> implement in MB5.1 o Setup copied by Oxford electron microscopy group

4 LCFI POsC, July 13, 20074 CPC2: Next generation CCD o CPC2: second generation Column-parallel CCD –Low-speed single-metal; with 100 Ωcm epi @ 25 µm and 1.5 kΩcm @ 50 µm –High-speed double-metal; busline-free variant designed for 50 MHz operation –4 more wafers of each variant being produced Busline-free design a big step! CPC2-70 CPC2-40 CPC2-10 ISIS test structures Busline-free CPC2

5 LCFI POsC, July 13, 20075 Sensor Developments Progress with sensor production at e2v technologies: o ISIS1 with p-well complete –Production complete: samples to arrive in July o CPC2 in production –4 wafers of single metal: delivery in July –4 more wafers double metal: delivery in autumn o CPC-T in production –Delivery of samples beginning September –Process split and number of samples rather complicated ISIS1CPC2Open phase CCD (CPC-T variant D)

6 LCFI POsC, July 13, 20076 Bump-bonded High-speed CPC2 o Initial results –Signals observed from all voltage channels –Gain decrease away from chip edges –Noise around 60-80 e- –Operated to 2 MHz; plans for >10MHz operation with MB 5.0 Noise Peak Fe-55 Peak

7 LCFI POsC, July 13, 20077 Next Big Step: CPC2+CPR2+CPD1 o All ingredients are in place –Medium-sized (CPC2-40) and small (CPC2-10) sensors mounted –Intensive testing ahead in coming months –Next generation CPR2A should offer improved clustering, testability, ADC performance Getting close to a prototype ladder! 104 mm Bump-bonded CPR2 Flexible cables CPC2-70 Two CPD1 driver chips

8 LCFI POsC, July 13, 20078 New Results with CPD1 and Busline-free CPC2 o MB 5.0 Motherboard and CPD1 driver –Board and chip work on first try –CPD1 “fast mode” works with V CPD1 > 2.8V –“Inverter mode” can deliver ≥ 1.2V clocks –Slew rate control by changing number of CPD1 sections (inverter mode) –Only one section needed to drive CCD o Integrated performance –Good performance shown at 10 MHz –CTE drops below 1.35 V; needs study –Noise reduced from 200 e- (with transformer) to 75 e- CPD1 CPC2 MB5.0

9 LCFI POsC, July 13, 20079 New Testing Capabilities Added Liverpool: Cold testing of CPC1 Bristol: ISIS1 testing Oxford: CPC2 well capacity, capacitance testing, shot noise & integration time

10 LCFI POsC, July 13, 200710 ISIS2 Progress o Initial work with ZMD/ZFoundry and DALSA –Work started seriously earlier this year –Good communication: met with company reps, many phone meetings etc. –Decided to continue with both companies through design study phase o DALSA –Non-overlapping poly process: our test of radiation tolerance looks good –Made early ISIS designs for Prof. Etoh –Initial feasibility study and layout by DALSA… good ideas, good discussion –Work-around for deep p+ implant, but CMOS circuitry still to be solved –DALSA-Eindhoven too busy with big customer --> contacted DALSA-Waterloo o ZMD/ZFoundry –Mixed 0.6µm CMOS/CCD process (C7C) –Initial work with design kit looked quite promising –Have: buried channel implant, 2-level poly, CMOS elements, extensive experience with deep implants with controlled tails –Need: to incorporate deep implant in C7C process –Company sold in late March --> new owner (Xfab) not interested in new development for old process

11 LCFI POsC, July 13, 200711 ISIS vendor possibilities --> Many companies, no perfect fit. CompanyProcessSize( μ m)Challenges DALSAmixed0.35CMOS elements, routing  JazzCMOS0.18Need buried channel, poly  Lincoln Labsmixed0.18Mixed process being developed  XFAB (Zfoundry)mixed0.6Not willing to modify old processX TowerCMOS0.35Need buried channel, polyX CSEMmixed0.35Mixed process being developed? PanasonicCCD/mixed<<1Not interested (Prof. Etoh)X “Japanese company”CCD<<1(Prof. Etoh is contacting)? HamamatsuCCD?<1Not interestedX

12 LCFI POsC, July 13, 200712 Global Mechanical Design o Global design considerations –Impact ladder designs, ideas for construction –Couple to detector concepts and physics Layer no No of Ladder s Radius (mm) Active length (mm) Activ e width (mm) Tilt angle Overla p (mm) 1815(19)1001300 2826(28.5)2502200.42 3123725022151.3 4154825022150.86 5196025022151.2 Ladders Beam pipe Foam cryostat Beryllium support shell Ladder end detail:

13 LCFI POsC, July 13, 200713 SiC Foam Ladder o Silicon (single layer) over SiC –20 micron silicon –1.5 mm SiC foam, 8% density –Silicone adhesive pads, 1mm x 0.2mm on ~5mm pitch –Total is ~0.14% X 0 –New ladders being tested SiC ladder ladder block glue annulus block mm m Deviation ( μ m)

14 LCFI POsC, July 13, 200714 RVC Foam Ladder o Silicon (sandwiched) over RVC foam –20 micron silicon (two layers) –1.5 mm thick RVC foam, 3% density –Silicone adhesive pads, 5mm pitch –Slight tension; about 1.5 N –Total is ~0.08% X 0 –New ladders being made RVC sandwiched ladder silicon spacer ladder block glue annulus block Tension mm Deviation ( μ m)

15 LCFI POsC, July 13, 200715 Ladder Prototyping, Supports o Support ideas include carbon fibre –Corrugated for ladder lateral support –Shells, for especially for inner layers o New ladders, tools, construction plans –Raw materials (ie thin silicon) now here –Initial testing and assembly plans drafted, under study –New test equipment commissioned –New simulation tools implemented Mechanical studies ratcheting up activity

16 LCFI POsC, July 13, 200716 Conclusions –Vertexing package delivered to world ILC community –CPR2A a new, much-improved yet pad-compatible design; nearly ready to go –CPC2 operating with ASIC driver and bonded CPR2; testing ramping up –CPC test structures, ISIS1 w/p-well, CPC2 single and double metal all in production –New results with foam-based ladders and modelling of global designs bearing fruit –National and international ILC activity intensifying Great progress so far in 2007!


Download ppt "LCFI POsC, July 13, 20071 LCFI Project Oversight Committee Outline CCD Clock Drive (WP3/4) External Electronics (WP4) CCD Sensors (WP2) CCD Testing (WP5)"

Similar presentations


Ads by Google