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Summer School Student’s Projects. Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods.

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Presentation on theme: "Summer School Student’s Projects. Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods."— Presentation transcript:

1 Summer School Student’s Projects

2 Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView The research project “Methods and draft standards for the DYNamic characterization and testing of Analog to Digital converters” (DYNAD) was proposed and successfully financed within the 4th Framework Programme “Standard, Measurement and Testing SMT” of the European Union. The project aimed at integrating and complementing IEC Standard 60748 for the part concerning dynamic testing, by proposing a list of parameters specifying the dynamic behavior of the converter and indicating in detail the measurement conditions and the data processing algorithms to be adopted. At level of category standardization, in 2000 the Technical Committee 10 of the IEEE Instrumentation and Measurement Society published the IEEE 1241. It provides both standard terminology for specifying the performance of ADCs and test methods for measuring it ELECTRONIC VERSIONS OF IEEE STD 1241 AND DYNAD WILL BE ON THE DESKTOP OF THE PC IN THE LAB

3 Compare numerical results obtained by using test methods reported in the IEEE Std. 1241 and DYNAD Compare the two standards also in terms of Summer School Student’s Projects how easy is to read and comprehend the standard ? how easy is to carry out the standard test methods ? should something be added or changed or deleted in the standard ? readability, easiness of use, completeness and effectiveness

4 Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. THD, SINAD, SNHR, SFDR and ENOB of the ADC of the PCI6024 DAQ board IEEE std 1241 Dynad coherent and not coherent sampling coherentsampling Agilent 33120A

5 Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. Gain, offset, INL, DNL of the ADC of the PCI6024 DAQ board IEEE std 1241 Dynad rampsinewave Gain and Offset, linearity errors definitions histogram Independently and terminal based Gain and Offset, linearity errors definitions histogram least squares fit, end-points and min-max definition Agilent 33250A

6 Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. SINAD, ENOB of the ADC of the PCI6024 DAQ board IEEE std 1241 Dynad three and four fixed-frequency and four multiharmonic sine-wave fitting parameter Agilent 33220A

7 Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. IMD of the ADC of the PCI6024 DAQ board The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. IEEE std 1241 Dynad IMD in the frequency domainIMD in the frequency and time domain coherent and not coherent samplingcoherent sampling Tektronix AWG420

8 Guidelines Each developed ATE must be written in LabViewEach developed ATE must be written in LabView A sub VI for each test method must be developedA sub VI for each test method must be developed The same notation used in the two standards must be consideredThe same notation used in the two standards must be considered A detailed report of the work done explaining the considered test methods, highlighting existing differences in the two standards and thoroughly describing the developed LabView code, has to be writtenA detailed report of the work done explaining the considered test methods, highlighting existing differences in the two standards and thoroughly describing the developed LabView code, has to be written Presentation of the results of the Individual Case StudiesPresentation of the results of the Individual Case Studies


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