1. 1 ATF2 Q BPM electronics Specification (Y. Honda, 02.2006) Design System –Hardware layout –Software –Calibration Testing Production schedule ATF2 electronics group (SLAC), NanoBPM collaboration, and Y. Honda (KEK)

2. 2 Specifications

3. 3

4. 4 New board layout Improved coupler and packaging More robust power and sensor connectors Design

5. 5 Local configuration System design

6. 6 Electronics mounting The structure of the ATF2 magnet system will be a magnet, position adjustable support, mover and concrete base from top to bottom. You can mount the BPM electronics boxes on the side face of the concrete bases. But their height will be about 580 mm. So you had better place your boxes so that their dimension might be 300 mm vertically and 700 mm horizontally. I can install iron plates, which have several screw holes in order to mount your boxes, on the side face of the concrete bases. Design

7. 7 Electronics package Thermal tests done. Temperature rise of about 10 degrees in the closed box. Design

8. 8 Calibration The purpose of this calibration system is to keep track of gain variations Typical variations are caused by temperature changes On-board calibration signal coupler (non- directional) On-board precision cal and LO power meter This type of calibration procedure has not been tested.

9. 9 With a single tone calibration (away from the cavity resonance), the power meter will provide a few tenths of a percent calibration stability. The calculated gain stability vs. temperature of the ATF2 board is 0.02dB/C, or an amplitude change of 0.25% / C. The temperature variation of the attenuation of the limiter is not known or specified. We could test this with a connnectorized limiter. The cable variation is calculated at approximately 0.06%/C, if good cable is used. The power meter chip has a variation of 0.16%/C, slightly better than the calculated stability of the board. The power supplies are well regulated on the board, so input voltage variations are probably not important. However, if the input voltage varies, the power dissipated in the primary regulator will change, and the board temperature will change. It might be worth running a separate power cable to each board (in a multi-conductor bundle) so that changes in the number of operating boards doesn’t change the board temperatures. Since we believe (but need to measure) the board temperature variation is 0.25%/C, and the power meter variation is 0.16%/C (all numbers calculated - have not done measurements), it is not clear we can improve on the stability with calibration. Calibration

10. 10 RECOMMENDATIONS 1: Use non-directional couplers. Include a temperature monitoring thermistor connected to the diagnostic cable. Include a pad for a thermistor in parallel with the gain resistor on the output amplifiers. Test board temperature stability. 1a. If the 2 channels match well, install a thermistor set to cancel the first order variation with temperature. Expect ~0.1%/C stability. 1b. If channels do not track, expect ~0.25%/C stability. Calibration

11. 11 The default scheme would be to have a calibration synthesizer operate with a tone which we blank off for a few microseconds around beam time. The standard SIS data acquisition will then see some tone, and the cavity signal. Two operation modes: 1: system calibration: This is used to find cavity frequencies, couplings to X,Y, etc. Optionally we could also do a tone sweep of the calibration synthesizer to map out the cavity resonance and possibly (if we are clever enough), the cable attenuation. 2: Operation mode: DDC is performed in the VME crate controller using the precalculated coefficients. The I and Q amplitudes are multiplied by previously calculated matricies to get X,Y. These X,Y are made available to the EPICs server. The I and Q of the calibration tone is also made available for history buffering. We will need beam studies to determine if we want to adjust the calculated gain based on the measured calibration tone, or just use it as a check. The crate controller should be fast enough to do DDC even for multi-bunch beams in real time. Operation

12. 12 Lab Tests

13. 13 Lab Tests

14. 14 Beam Tests of ATF2 electronics (Y. Honda)

15. 15 Beam Tests

16. 16 Beam Tests

17. 17 Beam Tests

18. 18 Beam Tests

19. 19 Beam Tests

20. 20 Beam Tests

21. 21 Beam Tests

22. 22 Beam Tests

23. 23 Schedule

24. 24 Schedule

25. 25 Remaining: Bench tests of coupling Bench tests of stability, lifetime and temperature response Beam test analysis Saturation tests and matching with digitizer Calibration tests System design