1. Large-Signal Network Analysis Tools and Techniques Page 1 Large-Signal Network Analysis Technology to help the R&D Customer

2. Large-Signal Network Analysis Tools and Techniques Page 2 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

3. Large-Signal Network Analysis Tools and Techniques Page 3 Design Challenge “Customers are demanding more capabilities/performance from their devices.”  Designers are looking for better methods of characterizing their components Demands translate to greater design complexities  More complex modulation schemes  Higher power efficiency requirements  Improved linearity  90 0 Phase Splitter I/Q Modulator LO I Q Rx/Tx Module MCPA PA Module Matched Transistors Mixer Transistors Process Engineer PA Designer Modeling Designer IC Designer System Designer

4. Large-Signal Network Analysis Tools and Techniques Page 4 Why can’t I predict device behavior To be successful in this environment, it is essential to fully characterize and understand device behavior  Need more realistic test conditions  Devices that operate in large-signal environments can’t be characterized with linear tools Existing tools are insufficient  Network analyzers only characterize small-signals (linear) behavior accurately  Signal analyzers evaluate properties of signals interacting with the test device, they do not analyze the interactions of analyzer with the test device

5. Large-Signal Network Analysis Tools and Techniques Page 5 AM-PM Amplifier Measurements Device Under Test Loadpull ACPR Gain Power in and out Power Added Efficiency Phase flatness

6. Large-Signal Network Analysis Tools and Techniques Page 6 Build two MCPAs, one passes the other does not  Do you know what to fix?  ACPR and other measurement data only represent symptoms of the problem  No insight is provided as to the cause of the problem ACPR of an MCPA FAIL PASS

7. Large-Signal Network Analysis Tools and Techniques Page 7 Existing Measurements and Limitations Spectral re-growth, IMD, ACPR  Characterizes signals caused by nonlinear behavior of components - in the frequency domain EVM  Compares deviation of modulated signal from ideal - in the time domain Limitations  Characterizes signals resulting from interaction DUT - measurement system, device performance is not isolated  Results will change when environment changes  Different sources and analyzers can produce different results  Characterizing just the DUT requires perfectly matched conditions DUT Freq. (GHz) DUT Z1Z1 Z2Z2

8. Large-Signal Network Analysis Tools and Techniques Page 8 Existing Measurements and Limitations con’t AM-AM and AM-PM  Characterizes changes in output power and phase with changes in input power  Starts defining the transfer function of the nonlinear behavior Limitations  DUT performance is still not isolated from the rest of the system  Results will change with changes in the environment  Results also depend on type of test signal regardless of matched conditions DUT Freq. (GHz) DUT Z1Z1 Z2Z2

9. Large-Signal Network Analysis Tools and Techniques Page 9 Existing Measurements and Limitations con’t Load Pull  Traditional: Characterizes applied impedances and powers at fundamental frequency  Measures incident, reflected and transmitted power as a function of  S and  L  Harmonic: Characterizes applied impedances and powers at fundamental and harmonics  Provides more complete information than traditional load pull. Harmonic termination has large impact on performance Limitations  Information is still missing, the DUT is not completely characterized  Does not allow to apply PA design theory (waveform engineering)  Measurements do not uniquely define a particular test state  May identify multiple local minimums as opposed to a optimal (global) minimum DUT Source Tuner (  S ) Load Tuner(s) (  L ) xxxx VNA, SA or Pwr Mtr. VNA, SA or Pwr Mtr.

10. Large-Signal Network Analysis Tools and Techniques Page 10 Existing Measurements and Limitations con’t Modulated S-parameters  Attempt to use known concepts in new situations Hot S 22  Characterizes the interaction of the DUT with the load under large - signal drive  Depends on the chosen configuration Limitations  Modulated S-parameters do not have a scientific basis  Superposition principles do not apply for nonlinear behavior  Results will vary with the test conditions when device is nonlinear  Hot S 22 is still missing critical information for complete nonlinear characterization  The missing data mayor may not impact measurement results

11. Large-Signal Network Analysis Tools and Techniques Page 11 Insufficient Modeling Tools Ideal:  Measurements correlate with simulations  In a linear environment, S-Parameters are an excellent example The real world for non-linear characterization:  Insufficient models  Incomplete information  Poor correlation between measurements and simulations Model SimulateBuildMeas S-P ACPR Power = Model SimulateBuild Meas

12. Large-Signal Network Analysis Tools and Techniques Page 12 Results  Cut-and-try engineering (designers “imagineer” fixes)  Design verification consumes 2/3 rds of development time  Time-to-market delays  Unpredictable design processes  Time consuming tuning and measurement requirements

13. Large-Signal Network Analysis Tools and Techniques Page 13 How can Agilent help?  Large - Signal Network Analysis is a breakthrough new technology that provides unprecedented insight into transistor, component and system behavior using the same concepts across this complete spectrum  Through a small dedicated team Agilent is ready to work closely with early-adopter customers in different markets to create successes in their R&D environment through this technology

14. Large-Signal Network Analysis Tools and Techniques Page 14 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

15. Large-Signal Network Analysis Tools and Techniques Page 15 Large - Signal Network Analyzer (LSNA) Technology  Goals  complete characterization of a device, component and system under large - signal periodic stimulus at its ports. LSNA technology is presently limited to devices that maintain periodicity in their response  deriving nonlinear component characteristics which are invariant for the used equiment and test signals  Foundation: Large-signal Network Analysis

16. Large-Signal Network Analysis Tools and Techniques Page 16 Small-Signal Network Analysis  Small-Signal  Linear Behavior  Test signal : simple, typically a sine wave  Superposition principle to analyze behavior in realistic conditions  Network  Transistor, RFIC, Basestation Amplifier, Communication system  Analysis  Complete component characterization : S - parameters (within measurement bandwidth)

17. Large-Signal Network Analysis Tools and Techniques Page 17 Large-Signal Network Analysis  Large-Signal  Refers to potential nonlinear behavior  Nonlinear behavior -> Superposition is not valid  Requirement: Put a DUT in realistic large-signal operating conditions  Network  Transistor, RFIC, Basestation Amplifier, Communication system  Analysis  Characterize completely and accurately the DUT behavior for a given type of stimulus  Analyze the network behavior using these measurements

18. Large-Signal Network Analysis Tools and Techniques Page 18 Large-Signal Network Analysis: Overview Transistor RFIC System Realistic Stimulus Realistic Stimulus Measurement System  Physical Quantity Sets  Travelling Waves (A, B)  Voltage/Current (V, I)  Representation Domain  Frequency (f)  Time (t)  Freq - time (envelope)  Analysis

19. Large-Signal Network Analysis Tools and Techniques Page 19 Practical Limitations of LSNA for Large-Signal Network Analysis  Large-Signal Network analysis will be performed using periodic stimuli  one - tone and harmonics  periodic modulation and harmonics  The devices under test maintain periodicity in their response

20. Large-Signal Network Analysis Tools and Techniques Page 20 Continuos Wave Signal Freq. (GHz) 1 2 3 4DC DUT Z1Z1 Z2Z2 Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC All voltages and currents or waves are represented by a fundamental and harmonics (including DC) Complex Fourier coefficients X h of waveforms X0X0 X1X1 X2X2 X3X3 X4X4

21. Large-Signal Network Analysis Tools and Techniques Page 21 Amplitude and Phase Modulation of Continuos Wave Signal Freq. (GHz) 1 2 3 4DC DUT Z1Z1 Z2Z2 Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC Freq. (GHz) 1 2 3 4DC Complex Fourier coefficients X h (t) of waveforms Phasor Amplitude Phase Fast change (GHz) Slow change (MHz) Modulation X 0 (t) X 1 (t) X 2 (t) X 3 (t) X 4 (t) time

22. Large-Signal Network Analysis Tools and Techniques Page 22 Periodic Modulated Signals Freq. (GHz) 1 2 3 4DC DUT Z1Z1 Z2Z2 Freq. (GHz) 1 2 3 DC Complex Fourier coefficients X hm of waveforms Freq. (GHz) 1 2 3 DC Freq. (GHz) 1 2 3 DC Freq. (GHz) 1 2 3 DC Phasor Amplitude Phase Periodic Modulation X 0i X 1i X 2i X 3i

23. Large-Signal Network Analysis Tools and Techniques Page 23 Waves (A, B) versus Current/Voltage (V, I) Typically “From device to system level”

24. Large-Signal Network Analysis Tools and Techniques Page 24 Small-Signal Network Analysis: S-parameters Transistor RFIC System Measurement System  Analysis Experiment 1 Transistor RFIC System Measurement System Experiment 2

25. Large-Signal Network Analysis Tools and Techniques Page 25 Large-Signal Network Analysis Transistor RFIC System Realistic Stimulus Realistic Stimulus Measurement System  Analysis Different Experiments

26. Large-Signal Network Analysis Tools and Techniques Page 26 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

27. Large-Signal Network Analysis Tools and Techniques Page 27 Vector Network Analyzer Measurement 50 Ohm Acquisition Calibration Linear Theory S-parameters Stimulus Response Reference Planes

28. Large-Signal Network Analysis Tools and Techniques Page 28 Complete Spectrum Waveforms Harmonics and Periodic Modulation 50 Ohm or tuner Acquisition Calibration Stimulus Response Reference Planes Modulation Source Large-Signal Network Analyzer

29. Large-Signal Network Analysis Tools and Techniques Page 29 Filter DUT Test Set Data-Acquisition LO Source 2nd Source PC Sampling Converter Cal Kit Power Std Phase Std LSNA System Block Diagram Calibration Standards Converts carrier, harmonics and modulation to IF bandwidth Separates incident and reflected waves into four meas. channels Or Tuner On wafer Connectorized RF bandwidth: 600 Mhz - 20 GHz max RF power: 10 Watt Modulation bandwidth Needs periodic modulation E1430 - based 4 MHz IF 10 MHz IF

30. Large-Signal Network Analysis Tools and Techniques Page 30 Harmonic Sampling - Signal Class: CW Freq. (GHz) 1 2 3 50 f LO 100 f LO 150 f LO Freq. (MHz)1 2 3 RF IF f LO =19.98 MHz = (1GHz-1MHz)/50 LP IF Bandwidth: 4 MHz Cutt Off IF

31. Large-Signal Network Analysis Tools and Techniques Page 31 Harmonic Sampling - Signal Class: Periodic Modulation LP IF Bandwidth: 4 MHz 1 2 3 50 f LO 100 f LO 150 f LO Freq. (MHz) 1 2 3 RF IF f LO =19.98 MHz = (1GHz-1MHz)/50

32. Large-Signal Network Analysis Tools and Techniques Page 32 Harmonic Sampling - Signal Class: Periodic Broadband Modulation Freq. (GHz) 1 2 3 150 f LO Freq. (MHz) RF IF LP BW Adapted sampling process BW of Periodic Broadband Modulation = 2* BW IF data acquisition BW 8 MHz

33. Large-Signal Network Analysis Tools and Techniques Page 33 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

34. Large-Signal Network Analysis Tools and Techniques Page 34 50 Ohm or tuner Acquisition Calibration Stimulus Response Reference Planes Modulation Source LSNA Calibration Measured waves Actual waves at DUT 7 relative error terms same as a VNA Absolute magnitude and phase error term F 0 =1GHz freq 1GHz 2GHz 3GHz

35. Large-Signal Network Analysis Tools and Techniques Page 35 Relative Calibration: Load-Open-Short 50 Ohm Acquisition 50 Ohm Load Open Short 50 Ohm Acquisition 50 Ohm Thru {f 0, 2 f 0, …, n f 0 } Calibration for fundamental and Harmonics {f 0, 2 f 0, …, n f 0 } F 0 =1GHz

36. Large-Signal Network Analysis Tools and Techniques Page 36 Power Calibration 50 Ohm Acquisition Power Meter {f 0, 2 f 0, …, n f 0 } Amplitude {f 0, 2 f 0, …, n f 0 } F 0 =1GHz freq 2GHz 3GHz 1GHz

37. Large-Signal Network Analysis Tools and Techniques Page 37 Phase Calibration 50 Ohm Acquisition Reference Impulse Generator f0f0... f0f0 50 Ohm Phase {f 0, 2 f 0, …, n f 0 } freq 2GHz 3GHz 1GHz F 0 =1GHz

38. Large-Signal Network Analysis Tools and Techniques Page 38 Measurement Traceability Relative CalPhase CalPower Cal National Standards (NIST) Agilent Nose-to-Nose Standard

39. Large-Signal Network Analysis Tools and Techniques Page 39 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

40. Large-Signal Network Analysis Tools and Techniques Page 40 The heart of the Large-Signal Network Analysis  This hardware is the core that will be used to work with the customer in providing LSNA technology  Combines capabilities of a vector network analyzer, sampling scope and ESG- VSA.  Provides complete waveform analysis capabilities  CW/Multi-tones with harmonics  0.6 to 20 GHz frequency coverage  8MHz usable IF BW  10 W power handling capability

41. Large-Signal Network Analysis Tools and Techniques Page 41 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

42. Large-Signal Network Analysis Tools and Techniques Page 42 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

43. Large-Signal Network Analysis Tools and Techniques Page 43 Gate - Drain Breakdown Current Time (ns) º transistor provided by David Root, Agilent Technologies - MWTC º TELEMIC / KUL

44. Large-Signal Network Analysis Tools and Techniques Page 44 Forward Gate Conductance Time (ns) º transistor provided by David Root, Agilent Technologies - MWTC º TELEMIC / KUL

45. Large-Signal Network Analysis Tools and Techniques Page 45 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

46. Large-Signal Network Analysis Tools and Techniques Page 46 Use of LSNA measurements in ICCAP  model verification, optimisation (and extraction) ICCAP specific input ADS netlist. Used, a.o., to impose the measured impedance to the output of the transistor in simulation sweep of Power Vgs Vds Freq

47. Large-Signal Network Analysis Tools and Techniques Page 47 Transistor De-embedding before after de-embedding Time/period Gate current / mA Equivalent circuit of the RF test-structure, including the DUT and layout parasitics

48. Large-Signal Network Analysis Tools and Techniques Page 48 Input capacitance behaviour V gs,dc =0.9 VV ds,dc =0.3 VV ds,dc =1.8 V Input loci turn clockwise, conform i=C*dv/dt

49. Large-Signal Network Analysis Tools and Techniques Page 49 Dynamic loadline & transfer characteristic V gs,dc =0.3 VV ds,dc =0.9 V

50. Large-Signal Network Analysis Tools and Techniques Page 50 LSNA identifies modeling problem : extrapolation example SiGe HBT 1002003004005006007008000900 -0.002 -0.001 0.000 0.001 -0.003 0.002 time, psec i1sts i1mts_de 1002003004005006007008000900 0.6 0.7 0.8 0.9 1.0 1.1 0.5 1.2 time, psec v1sts v1mts_de 1002003004005006007008000900 1.3 1.4 1.5 1.6 1.2 1.7 time, psec v2sts v2mts_de 1002003004005006007008000900 0.000 0.002 0.004 0.006 -0.002 0.008 time, psec i2sts i2mts_de SiGe HBT (model parameters extracted using DC measurements up to 1V) V be = 0.9 V; V ce =1.5 V; P in = - 6 dBm; f 0 = 2.4 GHz simul. meas.

51. Large-Signal Network Analysis Tools and Techniques Page 51 LSNA identifies modeling problem : extrapolation example SiGe HBT MeasurementSimulation SiGe HBT - DC characteristics 0.20.40.60.81.01.21.40.01.6 -0.010 -0.005 0.000 0.005 0.010 0.015 0.020 -0.015 0.025 VbDC DCmeas1..Ice 0.20.40.60.81.01.21.40.01.6 -0.010 -0.005 0.000 0.005 0.010 0.015 0.020 -0.015 0.025 VbDC i2.i Alcatel Microelectronics and the Alcatel SEL Stuttgart Research Center teams are acknowledged for providing these data.

52. Large-Signal Network Analysis Tools and Techniques Page 52 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

53. Large-Signal Network Analysis Tools and Techniques Page 53 MODEL TO BE OPTIMIZED generators apply LSNA measured waveforms “Chalmers Model” “Power swept measurements under mismatched conditions” GaAs pseudomorphic HEMT gate l=0.2 um w=100 um Parameter Boundaries Empirical Model Tuning º Dominique Schreurs, IMEC & KUL-TELEMIC

54. Large-Signal Network Analysis Tools and Techniques Page 54 During OPTIMIZATION Time domain waveforms Frequency domain gatedrain voltage current gatedrain Voltage - Current State Space Using the Built-in Optimizer

55. Large-Signal Network Analysis Tools and Techniques Page 55 Verification of the Optimized Model Time domain waveforms Frequency domain gatedrain voltage current gatedrain Voltage - Current State Space AFTER OPTIMIZATION

56. Large-Signal Network Analysis Tools and Techniques Page 56 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

57. Large-Signal Network Analysis Tools and Techniques Page 57 Waveform Engineering Block Diagram DUT Test Set Data-Acquisition Source PC Sampling Converter Filter LO f0f0 f0f0 2f 0 3f 0 IRCOM Setup

58. Large-Signal Network Analysis Tools and Techniques Page 58 Example - Measured Waveforms MesFET Class F f 0 =1.8 GHz I ds0 =7 mA V ds0 = 6 V Z(f 0 )=130+j73  Z(2f 0 )=1-j2.8  Z(3f 0 )=20-j97  PAE=84% PAE  50% Waveform Engineering º IRCOM / Limoges

59. Large-Signal Network Analysis Tools and Techniques Page 59 Example - Performance Improvement Derived Information from the V/I waveforms (swept input power at different terminations) Z(f 0 )=123+j72  Z(2f 0 )=50  Z(3f 0 )=50  Z(f 0 )=123+j72  Z(2f 0 )=2 - j 4.0  Z(3f 0 )=50  Z(f 0 )=123+j72  Z(2f 0 )=2 - j 4.0  Z(3f 0 )=21-96  PAE  74% PAE  84% º IRCOM / Limoges

60. Large-Signal Network Analysis Tools and Techniques Page 60 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

61. Large-Signal Network Analysis Tools and Techniques Page 61 RFIC Amplifier Characterization using periodic modulation Modulation Source a1a1 E1E1 a1a1 E1E1 A 1 shows spectral regrowth Spectral regrowth on b 1 combined with measurement system mismatch Nonlinear pulling on source 5 dB f 0 = 1.9 GHz Evaluation Board

62. Large-Signal Network Analysis Tools and Techniques Page 62 Transmission Characteristics A1A1 Carrier Modulation B2B2 3rd harmonic Modulation Harmonic Distortion Compression

63. Large-Signal Network Analysis Tools and Techniques Page 63 Reflection Characteristics A1A1 Carrier Modulation B1B1 3rd harmonic Modulation Harmonic Distortion Carrier Modulation 2nd harmonic Modulation Expansion

64. Large-Signal Network Analysis Tools and Techniques Page 64 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

65. Large-Signal Network Analysis Tools and Techniques Page 65 Scattering Functions provide device understanding and enable CAE coupling Tuners and active injection at harmonics @ fundamental frequency @ higher harmonics

66. Large-Signal Network Analysis Tools and Techniques Page 66 Nonlinear behaviour and Scattering Functions Functions of Index of: Port & harmonic Note: a’s and b’s are phase normalized quantities !! As shown before: for small-signal levels (linear) this reduces to (fundamental at port 2) (and independent bias settings)

67. Large-Signal Network Analysis Tools and Techniques Page 67 Scattering functions variation versus input power

68. Large-Signal Network Analysis Tools and Techniques Page 68 Generated reflection coefficients at port 2 at f 0 Generated  ’s  ’s for verification meas. (a)

69. Large-Signal Network Analysis Tools and Techniques Page 69 Time domain waveforms measured and simulated b -waves

70. Large-Signal Network Analysis Tools and Techniques Page 70 Application of CDMA-like signal

71. Large-Signal Network Analysis Tools and Techniques Page 71 Frequency domain f c =2.45 GHz,  f  50 kHz, modulation BW  1.45 MHz red=measured, blue=model

72. Large-Signal Network Analysis Tools and Techniques Page 72 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

73. Large-Signal Network Analysis Tools and Techniques Page 73 Time domain Memory effects !

74. Large-Signal Network Analysis Tools and Techniques Page 74 Memory effects DUT behaviour under 2-Tone excitation Modulation frequency = 20 kHzModulation frequency = 620 kHz

75. Large-Signal Network Analysis Tools and Techniques Page 75 Examples  Transistor reliability  Transistor model verification (ICCAP / ADS)  Transistor model tuning  PA design using waveform engineering  System level characterization  Scattering functions  Memory effect  Dynamic bias

76. Large-Signal Network Analysis Tools and Techniques Page 76 What is “Dynamic Bias Behaviour”? Freq. (GHz) 12 DC Freq. (GHz) 1 DC Input Voltage Output Current Dynamic Bias Behaviour Frequency Domain: Generation of Low Frequency Intermodulation Products Time Domain: “Beating” of the Bias

77. Large-Signal Network Analysis Tools and Techniques Page 77 Dynamic Bias: Measurement Principle TUNER RF Data Acquisition Dynamic Bias Data Acquisition Current Probe Bias 1 Supply Current Probe Bias 2 Supply Computer

78. Large-Signal Network Analysis Tools and Techniques Page 78 RFIC Example in Time Domain Output Current Waveform (without Dynamic Bias) (mA) (V) Normalized Time Input Voltage Waveform “MultiLine TRL”

79. Large-Signal Network Analysis Tools and Techniques Page 79 Adding Measured Dynamic Bias Output Current Waveform (including Dynamic Bias) (mA) Normalized Time Dynamic Bias Current Waveform

80. Large-Signal Network Analysis Tools and Techniques Page 80 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

81. Large-Signal Network Analysis Tools and Techniques Page 81 LSNA possible next steps driven by customer needs  Extending modulation BW (3G)  Increase power capability  Extending frequency range (50 GHz and beyond …)  Offer pulsed measurements to isolate the thermal effects  Complete dynamic bias testing capabilities to characterize the effects of modulation on bias  Add impedance tuning measurements to determine the impact of differing impedance conditions  Use of LSNA technology in high speed digital applications

82. Large-Signal Network Analysis Tools and Techniques Page 82 Example: Extending Power Capability Acquisition Calibration Stimulus Reference Planes Modulation Source Pre-matching Proper calibration elements On - board DC bias Tuners ? 3rd party Adapt test - set Proper absolute calibration Measurement science Agilent NMDG

83. Large-Signal Network Analysis Tools and Techniques Page 83 Agenda  Introduction  Large-Signal Network Analysis  The Large-Signal Network Analyzer  Calibration  The core of the LSNA Technology  Examples  A typical LSNA measurement session  Next steps in LSNA Technology  Wrap-up

84. Large-Signal Network Analysis Tools and Techniques Page 84 Wrap-up  Large-Signal Network Analysis Technology is breakthrough technology to characterize nonlinear behavior from transistor to system  The technlogy is targeted toward research and design experts. It requires a strong background in RF or Microwave theory to be successful.  Agilent NMDG is assigned to make the technology a success with early-adopter key customers  More information at : “http://wirelesscentral.tm.agilent.com/wirelesscentral/cgi- bin/epsg.cgi”  If you think the LSNA technology can help you, please contact Marcus_VandenBossche@agilent.com