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23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Presented by Naehyuck Chang Kiyoung Choi 2015 General.

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Presentation on theme: "23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Presented by Naehyuck Chang Kiyoung Choi 2015 General."— Presentation transcript:

1 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Presented by Naehyuck Chang Kiyoung Choi 2015 General Co-Chairs On Behalf of VLSI-SoC 2015 Organizing Committee June 9, 2015 VLSI-SoC 2015 Report 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea

2 ●Program Chairs ○Youngsoo Shin, KAIST, Korea ○Chi-Ying Tsui, HKUST, Hong Kong ●Vice Program Chair ○Jae-Joon Kim, POSTECH, Korea ●Analog and mixed-signal IC design ○Jaeha Kim, Seoul National University, Korea ○Tai-Cheng Lee, National Taiwan University, Taiwan ●CAD: synthesis and analysis ○Minsik Cho, IBM Research, USA ○Masahiro Fujita, University of Tokyo, Japan ●Circuits and systems for signal processing and communications ○Per Larsson-Edefors, Chalmers University, Sweden ○Oscar Gustafsson, Linköping University, Sweden ●Embedded system: architecture, design, and software ○Vijaykrishnan Narayanan, Penn State University, USA ○Jason Xue, City University of Hong Kong, Hong Kong TECHNICAL PROGRAM COMMITTEE 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea

3 ●Low-power and thermal-aware design ○Massimo Poncino, Politecnico di Torino, Italy ○Tadahiro Kuroda, Keio University, Japan ●Memory: technology, circuit, and system ○Yiran Chen, University of Pittsburg, USA ○Rahul Rao, IBM, India ●Prototyping, verification, modeling, and simulation ○Swarup Bhunia, Case Western Reserve University, USA ○Graziano Pravadelli, University of Verona, Italy ●System architectures: NoC, 3D, multi-core, and reconfigurable ○Yuan Xie, UC Santa Babara, USA ○Nam Sung Kim, University of Wisconsin-Madison, USA ●Design for variability, reliability, and test ○Chris Kim, University of Minnesota, USA ○Jing-Jia Liou, NTHU, Taiwan ●Security of SoC Systems ○Ozgur Sinanoglu, New York University Abu Dhabi, UAE ○Srinivas Katkoori, University of South Florida, USA 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea TECHNICAL PROGRAM COMMITTEE

4 ●Total submissions Abstracts: 138, Full papers: 118 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Submission Stats TrackSubmissions Analog and mixed-signal IC design 17 CAD: synthesis and analysis 5 Circuits and systems for signal processing and communications 17 Design for variability, reliability, and test 11 Embedded system: architecture, design, and software 8 Low-power and thermal-aware design 10 Memory: technology, circuit, and system 11 Prototyping, verification, modeling, and simulation 7 Security of SoC Systems 4 System architectures: NoC, 3D, multi-core, and reconfigurable 20 COI 8 Total 118

5 No. of reviews/paper: 4 Target acceptance rate Regular: 48/118 = 41% Regular + Poster: 66/118 = 56% Session schedule 12 regular session (4 papers per session) + 1 poster session Acceptance notification June 25th 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Review Process TrackRegularPoster Analog 72 CAD 21 Circuits & Systems 73 Variability 41 Embedded 31 Low-power 31 Memory 51 Prototyping 21 Security 11 System Architecture 84 COI 62 Total 4818

6 PhD Forum abstracts included in the proceedings? Copyright issue should be resolved between IFIP and IEEE 23rd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)Daejeon, Korea Issues

7 Look forward to seeing you in Daejeon, Korea! Thank you!


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