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Electromagnetic Compatibility of Integrated Circuits LABO CEM Christophe Lemoine Winter Summary (in preparation for Jan, 20 th, 2010)

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Presentation on theme: "Electromagnetic Compatibility of Integrated Circuits LABO CEM Christophe Lemoine Winter Summary (in preparation for Jan, 20 th, 2010)"— Presentation transcript:

1 Electromagnetic Compatibility of Integrated Circuits LABO CEM Christophe Lemoine Winter Summary (in preparation for Jan, 20 th, 2010)

2 2 The Laboratory has moved to a bigger room since end of 2009  3 test benches available Equipment Purchase  Oscilloscope Lecroy 2GHz  Amplifier Teseq 800 Mhz - 3.1 GHz, 50 W  Amplifier Teseq 10MHz - 1GHz, 70 W Planning Tool  This tool gives a better visibility of laboratory use  Each users can reserve test bench easily Network. All test bench are connected to INSAT network  Data security. Automatic backup are done  A better data sharing between users  Data are not user-dependant  Accessibility with an INSAT login LABO CEM - What’s New ?

3 3 LABO CEM – Capability 1/2 CEM Measurements Radiated Immunity 1MHz – 3.1GHz 150 dBµV Radiated Emission 9kHz – 3GHz Conducted Immunity 1MHz – 3.1GHz Conducted Emission 9kHz – 3GHz Coupling Network

4 4 LABO CEM – Capability 2/2 Ageing or temperature investigation with climatic chamber Board Design with Altium Designer S parameter measurements with VNA R&S ZVL 6GHz and 6 Coplanar GS probes with pitches from 500 µm to 1.2 mm IV measurements with precision SourceMeter KEITHLEY Advanced default monitoring with Lecroy oscilloscope  LT342 500MHz  WaveRunner 204MXi 2GHz Soldering tool adapted to CMS component

5 5 LABO CEM - Prospective 2010 Purchase  Faraday Cage. 3mx2m for BCI and Emission measurements BCI measurements  The labo will be able to do BCI measurements with the purchase of the faraday cage and the new amplifier TESEQ DPI measurements  Improve the repeatability of the Dpi measurements  Upgrade the Bias Tee  Upgrade Power control algorithm Lab use  Binhong Li - Mixity  ? – EPEA  Christopher Peron – Rosie Improve Lab visibility Trainee about characterization of embedded sensor ?


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