1. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 1 MMF Bench / CMM Procurement Plan Robert Ruland Procurement Process Specifications Status Procurement Process Specifications Status

2. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 2 Procurement Process Procurement of items exceeding K$100 require the formal Request For Proposal process This process begins with the release of an optional Request for Information (RFI) followed by a Request for Proposal (RFP) and the Award of Contract. The RFI is intended to explore the potential interest of vendors, to give SLAC general information on the vendor’s approach to achieving these requirements, to generate budgetary quotations and to prepare the vendors for the release of the RFP in order to expedite the process. The RFIs were released mid September with a closing date of Oct. 20, 2004 for MM Bench of Oct. 14, 2004 for CMM Because of the Continuing Resolution situation and the resulting delay in construction of the MMF, the RFPs will be released later than originally planned, probably in early January with a due date four weeks later. SLAC staff, SLAC purchasing agents and independent magnetic measurements / metrology experts will review all proposals received by the RFP closing date. The selected vendor will be notified about four weeks after the RFP closing date with the Award of Contract to occur upon receipt of funds from DOE. Expected delivery time for both the bench and CMM are 6 months, should coincide with the BO of MMF (don’t want to store the equipment)

3. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 3 7 m Test Bench Specifications Outline Total travel length in Z 7000 mm. Make carriage as long as cost wise reasonable to minimize yaw, at least 1000 mm Make bench cross-section as large as reasonable, min 800 mm wide, 500 mm high Travel length in X as much as bench width permits, min 300 mm Travel length in Y: 100 mm or more if w/o loss of accuracy Granite base straightness in Y and X: ± 10 µm Position accuracy at probe tip required Z, X, Y: 3 µm, 40 µm, 14 µm, desired: 3 µm, 10 µm, 10 µm. Carriage roll, pitch and yaw deviations of max. 14 µrad, 4.2 µrad and 4.2 µrad Z-axis drive linear motor with 1 µm positioning resolution X, Y axes drive lead-screw with 1 µm positioning resolution No stepping motor on any axis Z position measurement with incremental encoder type Heidenhain LIDA, a second encoder on opposite side of bench could be considered to monitor yaw rotation of carriage X, Y axes motion measured with Heidenhain glass scale encoders Perpendicularity of X and Y axes to be better than 0.1 mrad Probe axis be equipped with rotary stage with 0.01º resolution and 4-axes goniometer Support bench on foundation separate from laboratory floor Support undulator independent from bench on common foundation Support cable carrier independent from bench on common foundation Equip cable carrier with drive system synchronized as slave to Z-axis drive

4. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 4 Test Bench Configuration We would prefer the delivery of a fully integrated system. However, we will also consider delivery of a minimum configuration consisting of only the Z- axis device including the linear drive with mounting provided for the length measuring system. In order to be able to compare all responses, we are asking vendors who offer fully integrated systems to quote the minimum configuration separately.

5. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 5 CMM Specification The CMM shall have the following minimum measuring capacities: Y-axis: 4000 mm, preferably 4300 mm (horizontal longitudinal axis) X-axis: 1200 mm (horizontal, perpendicular to Y-axis) Z-axis: 1000 mm (vertical axis) Larger systems which are standard design are acceptable. The accuracy and repeatability of the system shall be specified in accordance with DIN EN ISO 10360. Values for MPE and Probing error shall be stated as a minimum. Form error and scanning error shall also be listed if applicable to the type of probe head supplied. The minimum requirement for MPE shall be 2.0 + L/350, e.g. 13 µm for L = 4000 mm. System resolution shall be 0.1 µm or better System repeatability shall be 1.0 µm or better

6. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 6 Potential Test Bench Vendors JOHANN FISCHER ASCHAFFENBURG Germany WENZEL PRÄZISION GMBH, Germany Carl Zeiss IMT Corp, Germany Anorad, Rockwell Automation USA Danaher Motion (formerly Dover Instruments) USA KUGLER GmbH Germany ESRF France

7. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 7 Summary Specifications for bench and CMM complete, being reviewed RFIs released RFPs postponed because of MMF construction delay First responses to CMM RFI indicate a 10 - 15% price increase because of exchange rate fluctuation since budgetary quotes from a year ago

8. Robert Ruland MMF Bench/CMM Procurement Plan ruland@slac.stanford.edu October 14, 2004 MMF Review 8 END of Presentation