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Electron Microscopy for Catalyst Characterization Dr. King Lun Yeung Department of Chemical Engineering Hong Kong University of Science and Technology CENG 511 Lecture 3
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Electron-Specimen Interaction e-e- e-e- e-e- backscattered e - elemental contrast secondary e - surface topography Primary or unscattered e - projected sample image transmission electron microscopy http://www.jeol.com/sem_gde/imgchng.html http://www.unl.edu/CMRAcfem/ http://www.ou.edu/research/electron/www-vl/ http://www.mwrn.com/guide/electron_microscopy/microscope.htm
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Specimen Interaction Volume (V i ) Auger secondary e- backscattered e- K X-ray L X-ray increasing depth surface information bulk information V i when accelerating V i when incident angle V i when atomic number
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Electron-Specimen Interaction Backscattered electrons Topography (A-B) Composition (A+B)
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Electron-Specimen Interaction Secondary electrons
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Electron-Specimen Interaction Ugly BUGS
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Electron-Specimen Interaction Surface Topography of Catalyst-related Materials
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Electron-Specimen Interaction Primary or unscattered electrons diamond gold TEM
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Electron-Specimen Interaction e-e- e-e- e-e- X-rays bulk elemental composition Auger electrons surface elemental composition Cathodaluminescence band-gap energy, electronic property http://jan.ucc.nau.edu/~wittke/Microprobe/ProbeNotes.html
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Electron-Specimen Interaction Cathodaluminescence
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Electron-Specimen Interaction Cathodaluminescence Ion implanted silicon patterns
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Electron-Specimen Interaction X-rays Sampling volume for X-ray X-rays Si(Li) detector
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Electron-Specimen Interaction Si(Li) Detector E Ne - PULSE 1 PULSE 2
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Electron-Specimen Interaction Si(Li) Detector Window
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Electron-Specimen Interaction Energy Dispersive X-ray Spectroscopy Si (bright)Al (bright)
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Electron-Specimen Interaction http://jan.ucc.nau.edu/~wittke/Microprobe/Interact.html#Aug Auger Electron WKWK WLWL WMWM WNWN WGWG KK KK LL Auger e - or Auger e - Z
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Scanning Electron Microscopy specimen Electron gun
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SEM - Electron Gun
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SEM - Electromagnetic Condenser Lenses
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Figure C-8. The light optics (4) and scanning coils (1) are located inside the minicoil probe- forming lens (2) at the base of the electron column. The pole piece (7) is one solid piece of metal and protects the sample from stray magnetic fields. The x-ray beams (3) are collimated by small apertures (6), and pass through an electron trap (5) that prevents backscattered electrons from entering the x-ray pectrometers. SEM - Objective Len
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SEM - Electron Probe
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SEM - Image Formation-1
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SEM - Image Formation-2
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Scanning Electron Microscopy high voltage low voltage Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Effect of beam current and spot size http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Incorrect alignment of objective aperture http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Effect of specimen tilt http://www.jeol.com/sem_gde/imgchng.html Stereo microscopy
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Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html (1) (2) (3)
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Scanning Electron Microscopy Contrast and brightness http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Astigmatism http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Sample charging http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Preventing charging by thin film coating http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Electron beam damages and contamination http://www.jeol.com/sem_gde/imgchng.html Carbon contaminant deposited by electron beam Electron beam damage on a fly’s compound eye
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Scanning Electron Microscopy Sources of image distortions http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Influence of external disturbances http://www.jeol.com/sem_gde/imgchng.html
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Scanning Electron Microscopy Importance of sample preparation http://www.jeol.com/sem_gde/imgchng.html
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Electron-Specimen Interaction e-e- e-e- e-e- backscattered e - elemental contrast secondary e - surface topography Primary or unscattered e - projected sample image transmission electron microscopy http://www.jeol.com/sem_gde/imgchng.html http://www.unl.edu/CMRAcfem/ http://www.ou.edu/research/electron/www-vl/ http://www.mwrn.com/guide/electron_microscopy/microscope.htm
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Electron-Specimen Interaction Principle of E. M. lithography Polymer resist Substrate
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Electron Beam Lithography Micropatterning and Microfabrication PMMA resist E-beam develop resist selectively etch substrate http://www.cnf.cornell.edu/SPIEBook/spie5.htm#2.5.3.1
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Microfabricated Catalysts deposit alternate layers of catalyst and inert micropattern and etch undercut and remove 50 nm nickel, 50 nm SiO 2
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Supported Catalysts Metal supported on metal oxide Coarsening
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Microfabricated Catalysts Zeolite micropatterned catalysts Zeolite Grids (200)/(020)(101) Zeolite Grids
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Electron-Specimen Interaction Electron beam Thin sample Unscattered electrons
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Different Types of Electron Microscopy SEM TEM Ultra-TEM HREM
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Transmission Electron Microscopy Au/SiO 2 http://www.mwrn.com/guide.htm http://www.hei.org/research/depts/aemi/micro.htm
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Electron-Specimen Interaction
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Transmission Electron Microscopy Au
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Transmission Electron Microscopy Primary or unscattered electrons diamond gold TEM http://em-outreach.sdsc.edu/web-course
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Transmission Electron Microscopy Catalyst particle size distribution
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Transmission Electron Microscopy Catalyst particle shape and morphology
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Particle Morphology Selected zone dark field imaging (SZDF) ? ?
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Particle Morphology Selected zone dark field imaging (SZDF) (100) (110)
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Particle Morphology Weak beam dark field (WBDF)
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Particle Morphology SZDF and WBDF techniques
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Electron-Specimen Interaction
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Transmission Electron Microscopy Distribution of crystallographic planes
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Electron-Specimen Interaction
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High Resolution Electron Microscopy http://bnlstb.bio.bnl.gov/biodocs/stem/interactive.htmlx Bismuth molybdates (Bi 2 Mo 3 O 12 - )
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High Resolution Electron Microscopy Bismuth molybdates (Bi 2 MoO 6 - )
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High Resolution Electron Microscopy Platinum on Alumina hydrogen Hydrogen sulfide
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High Resolution Electron Microscopy 2 x 1 reconstruction of (110) surface of Au particle
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High Resolution Electron Microscopy Rh/SiO 2 Reduced Oxidized
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High Resolution Electron Microscopy Rh particles
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High Resolution Electron Microscopy Electron-beam induced reduction of RuCl 3 on MgO
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High Resolution Electron Microscopy Hydrogen reduced Rhodium-TiO 2
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Electron-Specimen Interaction
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