1. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Memory Testing and Pattern Introduction TM

2. This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Contents Brief Introduction Memory Classification and Application How to Test Memory IC Pattern Introduction Scramble

3. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Memory IC Testing For storage media (memory): not magnetic tape, not hard/floppy disk, not brain For silicon process: not WAT test, not reliability test, not physical failure analysis For IC testing: not logic (ASIC, CPU, FPGA, LCD driver, …) not mix-signal (ADC, DAC, USB, …) For test program: not timing, not pin format, not hardware configuration not command to generate report, not user interface We focus on: electrical failure analysis, (memory IC) function test, test pattern

4. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Memory Classification Volatile memory: data will lose after power off SRAM (static random access memory): Low Power (or Low Voltage) SRAM / High Speed SRAM DRAM (dynamic RAM, need refresh): Synchronous DRAM / Double Data Rate (DDR) SDRAM FCRAM (FJ, Fast Cycle RAM): DRAM cell with SRAM peripheral Non volatile memory: data still keep after power off ROM (read only memory) / PROM (programmable ROM) EPROM (Erasable PROM) / EEPROM (Electrical EPROM) Flash Embedded Memory : some of above memories are merged with some logical purpose circuit on a chip

5. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Memory Application LP-SRAM: mobile phone HS-SRAM: cache memory DRAM: phase out SDRAM / DDR SDRAM: mother board / graphic card ROM / PROM / EPROM: game machine / BIOS EEPROM / Flash: smart card / voice recorder FCRAM(FJ): mobile phone

6. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Special Testing Feature SRAM: typical memory function (Write and Read) DRAM: row and column address are multiplexed, need refresh SDRAM: need one synchronous clock, pipe-line (burst) concept DDR SDRAM: one cycle two data, write latency, DLL on/off FCRAM: need some test mode to access the DRAM cell ROM: need SOM (source only memory) board of tester, read only EEPROM / Flash: read / program / erase all / page mode address and data are multiplexed, BUSY signal Embedded Memory: in general, several hundreds pins, so we need customer provide more detailed or confidential document about the memory-related, only around fifty pins information to run a specified sequence to enter the direct access mode

7. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. From the PC BIOS’s View For the PC with 256M bytes SDRAM (the simplest way, mail box) write all 0x00, read all 0x00be visited 2 times write all 0xFF, read all 0xFFbe visited 2 times write all 0x55, read all 0x55be visited 2 times write random, read randombe visited 2 times, total 8 times

8. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. What We Say the “Testing” For the 16Mx8 bits SDRAM 1. In general, when we are debugging or creating a pattern, we always just consider one DQ only. 2. In order to get good fault coverage and measure almost all the device feature listed on data sheet, a test program will access each bit more than several hundreds times, not only few times DQ1 to DQ8 are accessed in the same time for every address

9. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Elements of Pattern the most important is address and data:

10. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Pattern Classification For written data (background data): solid 0/1, row bar, column bar, checker board, diagonal, DQ switch, RWI (repeat with invert) For cell visiting sequence (address changing): write-verify, scan X/Y, march4n, march6n, inverse, address complement, RWI Take too long time and less use galloping, butter-fly, shift diagonal --- n^2 For DRAM special: disturb, Long RAS

11. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Background Data In testing world:X is ROW is WL (word line), Y is COLUMN is BL (bit line)

12. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. DQ Switch (polarity)

13. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. X-Fast vs. Y-Fast

14. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Write Solid1 and RWI

15. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Scan vs. Write Verify

16. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Scan to March-4n

17. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. March-6n

18. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Data / Address Scramble Data scramble: only for DRAM, caused by Bit Line and /BL Address scramble: in general, DRAM simple, SRAM complex

19. TM This document is strictly confidential and proprietary of SMIC. It must not be copied or used for any purpose other than for reference only, and SMIC shall not be liable or responsible for any reliance. Display scramble: whole chip address decoding rule or chip architecture and DQ sequence describe the relationship between the electrical address and topological (physical) address Display Scramble