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Thin Films of Deposition
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Thin film Thin film: thickness typically <1000nm.
Special properties of thin films: different from bulk materials, it may be – Not fully dense Under stress Different defect structures from bulk Quasi ‐ two dimensional (very thin films) Strongly influenced by surface and interface effects Typical steps in making thin films: Emission of particles from source (heat, high voltage . . .) Transport of particles to substrate Condensation of particles on substrate Lithography, thin film deposition and its etching are the three most important processes for micro-nano fabrication.
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General characteristics of thin film deposition
Deposition rate Film uniformity: Across wafer uniformity. Run-to-run uniformity. Materials that can be deposited: metal, dielectric, polymer. Quality of film: Physical and chemical properties Electrical property, breakdown voltage Mechanical properties, stress and adhesion to substrate Optical properties, transparency, refractive index Composition, stoichiometry Film density, defect (pinhole…) density Texture, grain size, boundary property, and orientation Impurity level, doping Deposition directionality: Directional - good for lift-off, trench filling Non-directional - good for step coverage Cost of ownership and operation.
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Four equilibrium growth/deposition modes
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Types growth modes Layer by layer growth (Frank ‐ van der Merwe): film atoms more strongly bound to substrate than to each other and/or fast diffusion Island growth (Volmer ‐ Weber): film atoms more strongly bound to each other than to substrate and/or slow diffusion. Mixed growth (Stranski ‐ Krastanov): initially layer by layer then forms three dimensional islands.
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Thin Film Deposition Techniques
PVD (Physical Vapor Deposition) Thermal Evaporation Electro-deposition Magnetron sputtering (DC, RF) Pulsed Laser Deposition MBE (molecular beam epitaxy) CVD (Chemical Vapor Deposition) APCVD (atmospheric CVD) LPCVD (low-pressure CVD) PECVD (Plasma-enhanced CVD) LECVD (Laser-enhanced CVD) MOCVD (Metal-organic CVD) Solution based deposition techniques Sol-gel PAD (Polymer assisted deposition)
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Chemical Vapor Deposition (CVD)
CVD steps: Introduce reactive gases to the chamber. Activate gases (decomposition) by heat or plasma. Gas absorption by substrate surface . Reaction take place on substrate surface, film firmed. Transport of volatile byproducts away form substrate. Exhaust waste CVD : deposit film through chemical reaction and surface absorption.
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CVD advantages and disadvantages (as compared to physical vapor deposition)
Can be used for a wide range of metals and ceramics Can be used for coatings or freestanding structures Fabricates net or near-net complex shapes Is self-cleaning—extremely high purity deposits (>99.995% purity) Conforms homogeneously to contours of substrate surface Has near-theoretical as-deposited density Has controllable thickness and morphology Forms alloys Infiltrates fiber preforms and foam structures Coats internal passages with high length-to-diameter ratios Can simultaneously coat multiple components Coats powders Disadvantages: High process temperatures. Complex processes, toxic and corrosive gasses. Film may not be pure (hydrogen incorporation…).
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Types of CVD reactions Thermal decomposition Reduction (using H2)
AB(g) ---> A(s) + B(g) Si deposition from Silane at 650oC: SiH4(g) → Si(s) + 2H2(g) Ni(CO)4(g) Ni(s) + 4CO(g) (180oC) Reduction (using H2) AX(g) + H2(g) A(s) + HX(g) W deposition at 300oC: WF6(g) + 3H2(g) W(s) + 6HF(g) SiCl4(g) + 2H2(g) Si(s) + 4HCl (1200oC) Oxidation (using O2) AX(g) + O2(g) AO(s) + [O]X(g) SiO2 deposition from silane and oxygen at 450oC (lower temp than thermal oxidation): SiH4(g) + O2(g) --- > SiO2(s) + 2H2(g) 2AlCl3(g) + 3H2(g) + 3CO2(g) Al2O3 + 3CO + 6HCl (1000oC) (O is more electronegative than Cl) Compound formation (using NH3 or H2O) AX(g) +NH3(g) AN(s) + HX(g) or AX(g) + H2O(g ) AO(s) + HX(g) Deposit wear resistant film (BN) at 1100oC: BF3(g) + NH3(g) BN(s) + 3HF(g) (CH3)3Ga(g) + AsH3(g) GaAs(s) + 3CH (650 – 750oC)
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Types of CVD APCVD (Atmospheric Pressure CVD), mass transport limited growth rate, leading to non-uniform film thickness. LPCVD (Low Pressure CVD) Low deposition rate limited by surface reaction, so uniform film thickness (many wafers stacked vertically facing each other; in APCVD, wafers have to be laid horizontally side by side. Gas pressures around mTorr (lower P => higher diffusivity of gas to substrate) Better film uniformity & step coverage and fewer defects Process temperature 500°C PECVD (Plasma Enhanced CVD) Plasma helps to break up gas molecules: high reactivity, able to process at lower temperature and lower pressure (good for electronics on plastics). Pressure higher than in sputter deposition: more collision in gas phase, less ion bombardment on substrate Can run in RF plasma mode: avoid charge buildup for insulators Film quality is poorer than LPCVD. Process temperature around °C. MOCVD (Metal-organic CVD, also called OMVPE - organo metallic VPE), epitaxial growth for many optoelectronic devices with III-V compounds for solar cells, lasers, LEDs, photo-cathodes and quantum wells.
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Physical Vapour Deposition(PVD) 1
Physical Vapour Deposition(PVD) 1.Physical vapour deposition (PVD) is fundamentally a vaporisation coating technique, involving transfer of material on an atomic level. It is an alternative process to electroplating. 2.The process is similar to chemical vapour deposition (CVD) except that the raw materials/precursors, i.e. the material that is going to be deposited starts out in solid form, whereas in CVD, the precursors are introduced to the reaction chamber in the gaseous state. Working Concept PVD processes are carried out under vacuum conditions. The process involved four steps: 1.Evaporation 2.Transportation 3.Reaction 4.Deposition
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Variants of PVD include ; Evaporative Deposition: In which the material to be deposited is heated to a high vapor pressure by electrically resistive heating in "high" vacuum. Electron Beam Physical Vapor Deposition: In which the material to be deposited is heated to a high vapor pressure by electron bombardment in "high" vacuum. Sputter Deposition: In which a glow plasma discharge (usually localized around the "target" by a magnet) bombards the material sputtering some away as a vapor. Cathodic Arc Deposition: In which a high power arc directed at the target material blasts away some into a vapor. Pulsed Laser Deposition: In which a high power laser ablates material from the target into a vapor.
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Summary of Merits and Demerits of evaporation methods
E-Beam Evaporation 1. high temp materials 2. good for liftoff 3. highest purity 1. some CMOS processes sensitive to radiation 2. alloys difficult 3. poor step coverage Filament Evaporation 1. simple to implement 2. good for liftoff 1. limited source material (no high temp) 2. alloys difficult 3. poor step coverage Sputter Deposition 1. better step coverage 2. alloys 3. high temp materials 4. less radiation \damage 1. possible grainy films 2. porous films 3. plasma damage/contamination
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Importance of PVD Coatings
PVD coatings are deposited for numerous reasons. Some of the main ones are: Improved hardness and wear resistance Reduced friction Improved oxidation resistance The use of such coatings is aimed at improving efficiency through improved performance and longer component life. They may also allow coated components to operate in environments that the uncoated component would not otherwise have been able to perform.
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Advantages Materials can be deposited with improved properties compared to the substrate material Almost any type of inorganic material can be used as well as some kinds of organic materials The process is more environmentally friendly than processes such as electroplating Disadvantages It is a line of sight technique meaning that it is extremely difficult to coat undercuts and similar surface features High capital cost Some processes operate at high vacuums and temperatures requiring skilled operators Processes requiring large amounts of heat require appropriate cooling systems The rate of coating deposition is usually quite slow
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Deposition By Sputtering
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Sputtering – General Sputtering is a term used to describe the mechanism in which atoms are ejected from the surface of a material when that surface is stuck by sufficiency energetic particles. Alternative to evaporation. First discovered in 1852, and developed as a thin film deposition technique by Langmuir in 1920. Metallic films: Al-alloys, Ti, TiW, TiN, Tantalum, Nickel, Cobalt, Gold, etc.
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Reasons for sputtering
Use large-area-targets which gives uniform thickness over the wafer. Control the thickness by Dep. time and other parameters. Control film properties such as step coverage (negative bias), grain structure (wafer temp), etc. Sputter-cleaned the surface in vacuum prior to deposition.
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Sputtering steps Ions are generated and directed at a target.
The ions sputter targets atoms. The ejected atoms are transported to the substrate. Atoms condense and form a thin film.
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Application of Sputtering
Thin film deposition: Microelectronics Decorative coating Protective coating Etching of targets: Microelectronics patterning Depth profiling microanalysis Surface treatment: Hardening Corrosion treatment
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Sputter sources Magnetron
Magnetic field traps freed electron near target Move in helical pattern, causing large number of scattering events with Ar gas – creating high density of ionized Ar Ion beam Plasma of ions generated away from target and then accelerated toward start by electric field Reactive sputtering Gas used in plasma reacts with target material to form compond that is deposited on wafer Ion-assisted deposition Wafer is biased so that some Ar ion impact its surface, density the deposited film. May sputter material off of wafer prior to deposition for in-situ cleaning.
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Process conditions Type of sputtering gas. In purely physical sputtering (as opposed to reactive sputtering) this limits to noble gas, thus Argon is generally the choice. Pressure range: usually 2-3 mTorr (by glow discharge). Power Heating of target material Low temperature metals can melt from temperature rise caused by energy transfer from Ar ions Electrical conditions: selected to give a max sputter yield (Deposition rate).
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Sputter deposition film growth
Sputtered atoms have velocities of 3-6E5 cm/sec and energy of eV. Desire: many of these atoms deposited upon the substrate. Therefore, the spacing is 5-10 mm. The mean free path is usually <5-10 mm. Thus, sputtered atoms will suffer one or more collision with the sputter gas.
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Sputtering Advantages Disadvantages
Large-size targets, simplifying the deposition of thins with uniform thickness over large wafers Film thickness is easily controlled by fixing the operating parameters and simply adjusting the deposition time Control of the alloy composition, step coverage, grain structure is easier obtained through evaporation Sputter-cleaning of the substrate in vacuum prior to film deposition Device damage from X-rays generated by electron beam evaporation is avoided. Disadvantages High capital expenses are required Rates of deposition of some materials (such as SiO2) are relatively low Some materials such as organic solids are easily degraded by ionic bombardment Greater probability to introduce impurities in the substrate because the former operates under a higher pressure
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