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Fig. 4 Electrical properties of GAP multilayer conductors and small-angle x-ray scattering analysis for the percolation network of Au NPs in a PU matrix.

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Presentation on theme: "Fig. 4 Electrical properties of GAP multilayer conductors and small-angle x-ray scattering analysis for the percolation network of Au NPs in a PU matrix."— Presentation transcript:

1 Fig. 4 Electrical properties of GAP multilayer conductors and small-angle x-ray scattering analysis for the percolation network of Au NPs in a PU matrix under strain. Electrical properties of GAP multilayer conductors and small-angle x-ray scattering analysis for the percolation network of Au NPs in a PU matrix under strain. (A) Normalized resistance on the top surface of high and low GAP multilayer conductors of 3 L and 9 L under different strain conditions. (B) Calculation of vertical conductivity for low GAP conductors with increasing number of layers. (C) Change in vertical conductivity in 5 L and 9 L low GAP conductors under strain. (D) Schematic illustration of the experimental setup of in situ small-angle x-ray scattering (SAXS) measurement. (E) 2D SAXS patterns at selected uniaxial strains of 0, 50, and 100% for pure PU and 50 wt % AuPU nanocomposite films, and schematic illustrations summarizing the behavior of Au NPs (yellow spheres) in the matrix and changes in the electrical pathway (red lines) under strain determined by SAXS analysis. (F) Calculated Herman’s orientation factor, f, under strain for a single layer of PU and 50 wt % AuPU. Minsu Gu et al. Sci Adv 2019;5:eaaw1879 Copyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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