1. TGT Conductive Test Environment
8/4/2019
doc.: IEEE yy/0419r0
May 2005
TGT Conductive Test Environment
Date: May 29, 2005
Authors:
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Alexander Tolpin, Intel
Alexander Tolpin, Intel

2. 8/4/2019
doc.: IEEE yy/0419r0
May 2005
Abstract
This document introduces the description of Conductive Test Environment as a part of Recommended Practice for the Evaluation of Wireless Performance. The reason for writing this document is to get feedback from TGT group on “work under progress” in this direction.
Alexander Tolpin, Intel
Alexander Tolpin, Intel

3. Summary Definitions Purpose Test Equipment Typical setup
8/4/2019
doc.: IEEE yy/0419r0
May 2005
Summary
Definitions
Purpose
Test Equipment
Typical setup
Examples of specific setups
Alexander Tolpin, Intel
Alexander Tolpin, Intel

4. Definitions from TGT draft
May 2005
Definitions from TGT draft
Test environment: The set of external physical circumstances and conditions surrounding or influencing the wireless performance of the DUT/SUT.
Conducted test environment: A test environment where RF test signals are directly injected into and received from the radio of the DUT using a cable.
Controlled test environment: Any test environment where the circumstances and conditions surrounding or influencing the DUT/SUT are controlled to provide a known level of uncertainty.
Shielded enclosure: A shielded box, screen room, or chamber used to isolate a test environment from outside RF signals.
Alexander Tolpin, Intel

5. Definitions from TGT draft (cont.)
May 2005
Definitions from TGT draft (cont.)
RF test signal: An RF signal introduced to the DUT/SUT for the purpose of testing its performance under a given set of conditions.
Communication test signal: An RF Test signal carrying the communication traffic to or from the DUT or SUT.
Interference test signal: An RF Test signal introduced or present at the DUT/SUT producing known levels and types of interference with the communication test signal.
Extraneous signal: Any signal external to the test setup
Internal interference signals: Platform noise or other similar signals that are internal to the DUT/SUT rather than externally applied as part of the test. This does not include thermal noise.
Alexander Tolpin, Intel

6. Purpose of Conductive Test Environment
May 2005
Purpose of Conductive Test Environment
Provide good control of test parameters
Provide good visibility of test results
Minimize an impact of extraneous signals
Guarantee high repeatability of test results (1-2%) – over-time and location.
Model real-life experience
for example, TPT vs. Attenuation correlates with TPT vs. range in LOS.
Alexander Tolpin, Intel

7. Main Test Equipment May 2005
DUT – any wireless device (AP or Client) that includes relevant SW running on the specific platform
WLCP (WireLess CounterPart) - reference AP or a reference Client or just a RF signal generator depending on test objectives
WLCP may be also a source of internal interference signals
Shielded enclosure for DUTs and WLCPs in order to isolate from extraneous signals
Cables
RF-cables – connected to antenna connectors.
Wired LAN cables
Control cables
Attenuators – to control attenuation (which means path loss) and RF signal input power
Alexander Tolpin, Intel

8. Main Test Equipment (cont.)
May 2005
Main Test Equipment (cont.)
Calibrated combiners, splitters and couplers – to handle different RF path, including antennas entries.
Power Meter Devices – to measure RF signal power per packet
Traffic Analyzer – to gather and analyze traffic through RF cables
Wired Traffic Generator to generate data traffic from DUT to WLCP and from WLCP to DUT on top of layer 2.
Wired Traffic Analyzer to gather delivered data payload over time through wired interface on top of layer 2.
Alexander Tolpin, Intel

9. Main Test Equipment (cont.)
May 2005
Main Test Equipment (cont.)
Test controller
includes the following capabilities, likely automated and controlled by dedicated SW:
The ability to control TX rates and TX power of WLCP and DUT
The ability to control power meters.
The ability to control attenuators
The ability to control Wired Traffic Analyzer
The ability to control Wired Traffic Generator.
The ability to control Traffic Analyzer
Alexander Tolpin, Intel

10. Typical conductive setup
May 2005
Typical conductive setup
Alexander Tolpin, Intel

11. May 2005
Examples of setups
Same test equipment may be used for many test setups depending on test objectives
Examples:
Few DUTs may work together (bandwidth sharing test)
Few WLCPs may be used together, some of them, for example, to generate internal interference signals (ACI, Roaming)
Different RF cables with different length controlled by attenuators may simulate multi-path effects
Alexander Tolpin, Intel

12. TPT vs. Attenuation conductive setup
May 2005
TPT vs. Attenuation conductive setup
Alexander Tolpin, Intel

13. Roaming conductive setup
May 2005
Roaming conductive setup
Alexander Tolpin, Intel

14. May 2005
ACI conductive setup #1
Alexander Tolpin, Intel

15. May 2005
ACI conductive setup #2
Alexander Tolpin, Intel

16. Bandwidth sharing conductive setup
May 2005
Bandwidth sharing conductive setup
Alexander Tolpin, Intel

17. Antenna Diversity conductive setup
May 2005
Antenna Diversity conductive setup
Alexander Tolpin, Intel

18. May 2005
References
P D0.1 - Draft Recommended Practice for the Evaluation of Wireless Performance
Alexander Tolpin, Intel