1. Powerpoint Presentation, ECM22
G. Kaupp, M. R. Naimi-Jamal
Powerpoint Presentation, ECM22
Budapest, August 26-31, 2004

2. G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

3. G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

4. loading: FN = k h3/2 k [µN/nm3/2] = indentation coefficient
Al-Berkovich
loading: FN = k h3/ k [µN/nm3/2] = indentation coefficient
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

5. The relation of normal force and normal displacement
FN = k·h3/ (k [µN/nm3/2] = indentation coefficient)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

6. Crystalline SiO2 and SrTiO3
trigonal a-quartz
monoclinic coesite (>2.2 GPa)
tetragonal stishovite (>8.2 GPa)
cubic SrTiO3(Pm-3m); tetragonal (I4/mcm) ?
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

7. Anthracene, coefficients and work of indentation
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

8. Isotropic and anisotropic indentation responce
Far-reaching phenomena with crystals
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

9. Face anisotropy in nanoindentations
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

10. Appearances of nanoscratches by AFM
Z range 50 nm
ramp experiment
constant normal force
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

11. The relation of lateral force and (fixed) normal force
FL = K·FN3/ (K = scratch coefficient [N-1/2])
The value for the lateral force gives the scratch work [µNµm] for 1 µm scratch length
Fused quartz and cube corner indentation tip, edge in front
(a)
(b)
(c)
normal force (µN)
(normal force)1.5 (µN1.5)
(normal force)2 (µN2)
Linear plot through the origin only with exponent 1.5 (not 1 or 2)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

12. The relation of lateral force and (fixed) normal force
SrTiO3 (100), 0°, cube corner edge in front
100
200
300
20000
40000
60000
(normal force)
1.5
(µN )
lateral force (µN) y 1
= 0,0047x
+ 3,8443 2
= 0,0071x
,218
(a)
(b)
y = 0,0048x + 13,571 40 80
120
160
10000
30000
(c)
y = 0,0001x + 33,419
250000
500000
750000
(d)
invalid
(normal force)1.5 (µN1.5)
acceptable
exponent 1.5 (not 1 or 2)
the steep line in (b) corresponds to phase transformed SrTiO3
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

13. G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Angular and facial dependence of specific scratch work on strontium titanate at different normal loads (WSc, spec = FL.1 [µNµm])
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

14. Angular dependence of specific scratch work on (1-100) of a-quartz and crystal packing
spec.WSc = FL.1 [µNµm] = work for 1 µm scratch length of the indented tip
(1-100), scratch work per µm scratch length (FN=1482 µN):
Angle µNµm
90°
45° 0°
c-direction: alternation of nm Si-Si rows; the other directions are less distant and the skew (10-11) cleavage plane is cutting in c-direction
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

15. Molecular migrations under (110) of thiohydantoin
(b) 90°
(c) 180°
(d) 270°
(P21/c)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

16. Reason for the orientational specifity on (110) of thiohydantoin
cleavage planes between steep (66°) monolayers
Geometric model for the understanding of the marked anisotropies upon scratching over skew cleavage planes in four orthogonal directions
In all directions: FL = K.FN3/2 is valid
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

17. Nanoscratching of anthracene on (110)
(110) on top
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

18. Nanoscratching on the layers
(001) on top
anthracene
ramp nanoscratching at µN on (001)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

19. Tetraphenylethene (P21) on (10-1)
Poor vertical (010) cleavage planes between monolayers of bulky molecules
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

20. Nanoscratching along the polar axis of ninhydrin
edge in front
180°
(P21)
180°
side in front
180°
Cube corner scratches on ninhydrin (110) along the polar axis
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004

21. Thiourea, anisotropic nanoscratching on (100)b a
(100) c
(image rotated by 10° around x and y)
(Pbnm)
a) along [010] (b)
b) along [001] (c)
ramp nanoscratching at µN
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004