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Parameter Extraction of Advanced MOSFET Model

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Presentation on theme: "Parameter Extraction of Advanced MOSFET Model"— Presentation transcript:

1 Parameter Extraction of Advanced MOSFET Model
Abhay Chopde Department of Electronics Engineering Vishwkarma Institute of Technology, Pune. VLSI Design Course IUCEE 2008 Workshop, Mysore.

2 Outline MOSFET Model MM11 Introduction Parameters
MOSFET Parameter Extraction Problem Definition Parameter extraction modules Evolutionary Algorithm IUCEE 2008 Workshop, Mysore 15 April 2019 2

3 MOS Model 11 Developed by Philips
Suitable for modern/future CMOS processes Surface potential based Implemented physical effects: mobility reduction bias-dependent series resistance velocity saturation conductance effects (CLM, DIBL) gate leakage current gate-induced drain leakage gate depletion quantum-mechanical effects bias-dependent overlap capacitances IUCEE 2008 Workshop, Mysore 15 April 2019 3

4 MOS Model 11 Structure 4 IUCEE 2008 Workshop, Mysore 15 April 2019
4

5 MOS Model 11 Mini Set Parameters
IUCEE 2008 Workshop, Mysore 15 April 2019 5

6 MOSFET Parameter Extraction
Parameter extraction: the determination of the parameters for given set of measured quantities, so that the values of current predicted by above equation (model) match closely the actual experimental measurement. IUCEE 2008 Workshop, Mysore 15 April 2019 6

7 parameters to be extracted
MOSFET Parameter Extraction Modules Input parameter file with range for parameters to be extracted Measurement data Algorithm parameters Optimizer Model file (e.g. MM11, BSIM, EKV etc.) Extracted parameters Model generated data using extracted parameters IUCEE 2008 Workshop, Mysore 15 April 2019 7

8 Evolutionary Algorithms
Simple Genetic Algorithm : Based on biological evolution of species. Particle Swarm Optimization : Based on the principle of birds flocking in search of food. Ant Colony Optimization : Optimization methodology based on ant behaviors. IUCEE 2008 Workshop, Mysore 15 April 2019 8

9 Summary Accurate Simulation of circuit depends not only on the model but also correct value of parameters. Parameter extraction is a critical area in deep submicron regime. IUCEE 2008 Workshop, Mysore 15 April 2019 9

10 See you Again! Q & A IUCEE 2008 Workshop, Mysore 15 April 2019 10

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