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Implementing Low-Power CRC-Half for RFID Circuits

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Presentation on theme: "Implementing Low-Power CRC-Half for RFID Circuits"— Presentation transcript:

1 Implementing Low-Power CRC-Half for RFID Circuits
Qi Mi & Zhi Li ECE 632 – Fall, 2008 University of Virginia

2 Outline Introduction Problem Statement Contribution Design Simulation
Conclusion Future Work Q & A

3 Introduction RFID applications RFID security issues

4 Problem Statement Constraint: Problem:
Energy – foremost constraint Size Complexity Problem: We seek to find a feasible way of implementing low-power data encryption on RFID tags.

5 Contribution Implemented the core hash function (i.e., CRC-Half) of CRC-MAC with PTM 90nm technology. Analyzed energy at different operating voltages. Gave an optimal operating voltage point for CRC-MAC. Analyzed the trend of leakage current of the circuit.

6 Fig 1. A hardware implementation of CRC-MAC
CRC-MAC Briefing Fig 1. A hardware implementation of CRC-MAC

7 CRC-MAC Briefing (cont’d)
Fig 2. C implementation of CRC-MAC as keyed one-way function

8 Fig 3. A symbol view of CRC-Half
Circuit Design Fig 3. A symbol view of CRC-Half

9

10

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12 Simulation

13 E/op = Eactive + Eleakage = CeffVDD2 + IlkgVDDTD
Optimization Design Metric: Total energy consumption E/op = Eactive + Eleakage = CeffVDD2 + IlkgVDDTD Knobs Lower VDD (subthreshold design) Robust, require CMOS Shorten operation duration

14 Simulation Technology: PTM 90nm Technology
Circuit Description: netlists Simulation Environment Schematic-level Software: FPGA Advantage 7.0 LS Circuit-level Software: Cadence 2005 Simulator: Ocean with Spectre

15 Simulation (cont’d) Approach

16 Spectre Simulation Result
1 1 1 Data word: Key word: Output:

17 Leakage Current Simulation
Exponential Reduction as VDD decreases due to DIBL effect Leakage Current is independent of CLK rate

18 Current Waveform in One Cycle
Pavg = α0→1fCeffVDD2 A higher CLK rate helps reduce energy consumption for a certain VDD

19 Total Energy per CRC cycle
VDD (V) Tcr (ns) Iavg (A) Etotal (nJ) 0.5 10 3.09E-05 1.55E-03 0.45 15 1.98E-05 1.33E-03 0.4 20 1.33E-05 1.06E-03 0.35 40 6.20E-06 8.68E-04 0.3 70 3.50E-06 7.36E-04 0.25 200 1.53E-06 7.63E-04 0.2 700 7.16E-07 1.00E-03 0.15 1800 4.84E-07 1.31E-03

20 Energy Consumption Plot
The optimal supply voltage is around 0.3V Leakage energy consumption starts to dominate in the sub-threshold region Leakage current is taking up a large proportion of average current

21 Conclusion CRC-processing circuit is simulated in FPGA and Cadence
Average and leakage currents are simulated Energy consumption comparison for different VDD and VDD optimization for minimum energy consumption

22 Future Work Use multiple power supplies to speed up the critical path
Size up some parts of the circuit to increase speed Add high VT NMOS to the PDN to reduce leakage

23 Q and A?

24 Thank you!


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