1. OTA Testing For MIMO Based Devices – Run-to-Run Variation in Data
2/23/2019
doc.: IEEE /1158r0
July 2006
OTA Testing For MIMO Based Devices – Run-to-Run Variation in Data
Date: July 2006
Authors:
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Neeraj Sharma, Intel
Lemberger Uriel, Intel

2. 2/23/2019
doc.: IEEE /1158r0
July 2006
Abstract
In this presentation, results are presented to show the run-to-run variation in data collected for MIMO based devices in an indoor OTA LOS and NLOS test environments
The test methodology and test environments used for collecting data is the same as described in IEEE P /D0.8 draft
Neeraj Sharma, Intel
Lemberger Uriel, Intel

3. Agenda Purpose Test Results Conclusions July 2006 2/23/2019
doc.: IEEE /1158r0
July 2006
Agenda
Purpose
Test Results
Conclusions
Neeraj Sharma, Intel
Lemberger Uriel, Intel

4. Purpose of OTA Testing For MIMO Based Devices
July 2006
Purpose of OTA Testing For MIMO Based Devices
The purpose of this presentation is to demonstrate that the currently proposed methodologies and test environments defined in IEEE P /D0.8 draft are applicable to MIMO based devices (DUT and WLCP)
This objective is achieved by providing run-to-run variation in data collected for indoor LOS and NLOS test environments
Neeraj Sharma, Intel

5. Motivation
July 2006
The test results provided for OTA in the past in this forum were limited to SISO based a/b/g devices
Need to ensure the test methodologies and environments applicable to SISO based devices are applicable to MIMO based devices
Neeraj Sharma, Intel

6. Test Environment Setup
July 2006
Test Environment Setup
The test uses OTA Indoor LOS and NLOS test environments [IEEE P D0.8 sections 5.5 and 5.6, respectively]
Neeraj Sharma, Intel

7. Configuration Setup Parameters
2/23/2019
doc.: IEEE /1158r0
July 2006
Configuration Setup Parameters
Maximum Tx power setting for DUT and WLCP
Both the DUT and WLCP in maximum data rate MIMO mode in 2.4GHz band.
No security (Open System)
DUT and WLCP on AC power with all power saving features disabled
DUT rotating at 1 rpm
All fluorescent lights kept constant throughout testing
Neeraj Sharma, Intel
Lemberger Uriel, Intel

8. Run-to-run Data Variation
July 2006
Run-to-run Data Variation
Data collected on a off-the-shelf MIMO based b/g NIC
Product claims to be a MIMO based solution though not able to confirm
Data collected 5 times at 4 different locations
Mode
Location 1 (6 meters linear distance from AP, no obstructions)
Location 2
(26 meters linear distance from AP with 2 walls and 1 cube as obstructions)
Location 3
(34 meters linear distance from AP with no walls and 4 cubes as obstructions)
Location 4
(60 meters linear distance from AP with no walls and 10 cubes as obstructions)
Max Rx
1.0%
3.8%
1.6%
5.0%
Max Tx
0.6%
0.9%
1.3%
5.5%
Neeraj Sharma, Intel

9. July 2006
Conclusions
Presented test results using MIMO based devices in Indoor OTA LOS and NLOS test environments using test methodologies in IEEE P /D0.8
Data shows low % variation in run-to-run tests
OTA Test methodologies and test environments in the draft are suitable for MIMO based devices
Neeraj Sharma, Intel

10. References [1] IEEE 802.11-1999 [2] IEEE P802.11.2/D0.8 July 2006
Neeraj Sharma, Intel