1. ECE 658: Semiconductor Material and Device Characterization Peide (Peter) Ye Office: Birck Tel: Course website: /~yep/courses.htm Location: EE 226 Time: MWF 8:30-9:20 am Office Hour: 10:00am-noon MWF

2. Fundamentals State-of-the-art Course Description:
An examination of modern characterization techniques routinely employed
to determine semiconductor material and device parameters.
Concepts and theory underlying the techniques are reviewed, and sample
experimental results are presented.
Emphasis is on techniques employing electrical measurements.
Course Objectives: This course is intended for graduate students in MN and 
related areas who are either i) interested in pursuing research in semiconductor
materials, structures or devices, or ii) seeking the broad device background on
the-state-of-the-art technologies for a future R&D career in the microelectronic
industry. 
Fundamentals
State-of-the-art

3. Teaching Philosophy for ECE 658
Motto “Durch Messung zu Wissen”(German)
“During or through measurement to understand” (English)
The best way to learn ECE 658 is to measure the devices in the lab and understand what you are measuring.
4 lectures + 2 hours (lab or discussion sessions) every two weeks

5. Required Textbook:
$65 at Amazon

6. Everyone is asked to prominently include the student-initiated Purdue Honors Pledge on their syllabus, as well as exams and key assignments.  The statement as written by our own students is “As a boilermaker pursuing academic excellence, I pledge to be honest and true in all that I do. Accountable together - we are Purdue.”  You may use this link to a web page for Purdue’s Honor Pledge in your syllabi.
Our instructors treat various materials that appear on commercial web pages very differently, causing confusion among students. Examples include web pages like Course Hero, Chegg, or Quizlet.   It is not uncommon to find answer keys to old exams or homework.  In the worst case, students can find online services to complete the work for them.
In general, notes are “considered to be ‘derivative works’ of the instructor's presentations and materials, and they are thus subject to the instructor's copyright in such presentations and materials.”  As such, they cannot be sold or bartered without your express written permission.  See the policy with regard to commercial note taking in classes which you may wish to include in your syllabus (see part J). 
Thus, be clear in your syllabus as to whether your materials may posted or considered to be derivative works.

7. (1)Resistivity
(2)Carrier/Doping Density
(3) Rc and Schottky Barries
(4) Rs,Lg,VT
(5) Defects
(6) Oxide integrity
(7) Carrier lifetime
(8) Mobility

8. Course Grading Final Exam : 100% Home work / attendance/
literature research / discussion:
determining the final grade in
borderline cases

9. yep/
From 612--Prof. M.Lundstrom

10. Lecture 1: Resistivity
metal
semiconductor
easy
Insulator
DOS
Mobility

11. Lecture 1: Resistivity
1.1 Introduction
DOS
Mobility

12. Lecture 1: Resistivity 1.2 The Four-Point Probe
Big difference: two point and four
point measurements

14. Big difference

17. Homework: Reading relevant pages
For an arbitrarily shaped sample,
What decides F, next Lecture
Homework: Reading relevant pages