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EE 5340 Semiconductor Device Theory Lecture 19 – Spring 2011

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Presentation on theme: "EE 5340 Semiconductor Device Theory Lecture 19 – Spring 2011"— Presentation transcript:

1 EE 5340 Semiconductor Device Theory Lecture 19 – Spring 2011
Professor Ronald L. Carter

2 Test 2 – Tuesday 05Apr11 11 AM Room 129 ERB Covering Lectures 11 to19
Open book - 1 legal text or ref., only. You may write notes in your book. Calculator allowed A cover sheet will be included with full instructions. For examples see ©rlc L19-31Mar2011

3 npn BJT currents in the forward active region ©RLC
IC = JCAC IB=-(IE+IC ) JnE JnC IE = -JEAE JRB=JnE-JnC JpE JGC JRE JpC ©rlc L19-31Mar2011

4 E current equations mode npn BJT (w/o gen/rec)
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5 C current equations in npn BJT (w/o gen/rec)
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6 Ebers-Moll Model (Neglecting G-R curr)
(Fig. 9.30*) -JEAE=IE JCAC=IC ©rlc L19-31Mar2011

7 Source of Ebers-Moll Equations (E)
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8 Source of Ebers-Moll Equations (C)
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9 E-M model equations ©rlc L19-31Mar2011

10 Ebers-Moll Model (Neglecting G-R curr)
Fig. 9.30* aFIF aRIR -JEAE = IE JCAC = IC E C B ©rlc L19-31Mar2011

11 E-M linking current model
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12 E-M linking current model (cont)
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13 E-M linking current model (cont)
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14 More non-ideal effects in BJTs
Base-width modulation (FA: xB changes with changes in VBC) Current crowding in 2-dim base High-level injection (minority carriers g.t. dopant - especially in the base). Emitter Bandgap narrowing (NE ~ density of states at cond. band. edge) Junction breakdown at BC junction ©rlc L19-31Mar2011

15 Recombination/Generation Currents (FA)
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16 FA npn figure of merit – emitter efficiency
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17 FA npn figure of merit – base transport factor
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18 FA npn figure of merit – recombination factor
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19 Common base current gain, aF
aT d ©rlc L19-31Mar2011

20 Common base current gain, aF (continued)
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21 Common emitter current gain, bF
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22 Common base current gain, aF (cont.)
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23 Common emitter current gain, bF
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24 References * Semiconductor Physics and Devices, 2nd ed., by Neamen, Irwin, Boston, 1997. **Device Electronics for Integrated Circuits, 2nd ed., by Muller and Kamins, John Wiley, New York, 1986. ©rlc L19-31Mar2011


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