1. Maki KUROSAWA VTX Group 2014 Feb 20
VTX Status
Maki KUROSAWA
VTX Group
2014 Feb 20

2. Run 14 We will have a 22 week run. 15 GeV/n AuAu is running (3 weeks).
First collision on 13th Feb
200 GeV/n AuAu will start second week of Mar (~Jul 7th).

3. VTX Status Commissioning started on Feb 3rd.
Found one ladder (B1-L11) didn’t work.
Current consumption is low. It was working before the installation of VTX
FEM is working.
Optical cable connection is good. No broken cables.
We inspected visually the connection of connectors except for bus connector at detector side.
There were no loose connectors. Out put voltage of LV cable was nominal voltage.
Possible cause
Bus connector were loose.
Regulator on SPIRO board. …
For more inspection, it is required to disassemble barrel. Nothing to do for this ladder for now.

4. No Change from Run13 and a test at Chemistry Lab
Chip Map of WEST (Commissioning in Run )
Pulse Test (sent pulse to col10 and 20)
Good Chip
50% Dead Chip
100% Dead Chip 50
CNT acceptance
LADDER
SPIRO
WEST
South
North 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 49
Barrel 0
B0-L4 58 51
B0-L3 59 71
B0-L2 27 36 48
B0-L1 28 17 47
B0-L0 29 34 37
Barrel 1
B1-L9 30 31
B1-L8 16 35 38
B1-L7 78 32 46
B1-L6 24 39
B1-L5 61 53
B1-L4 18 40
B1-L3 56 55
B1-L2 20 41
B1-L1 57 60
B1-L0 67
Col 0 is always hot for two chips. should be masked.
No Change from Run13 and a test at Chemistry Lab

5. No Change from a test at Chemistry Lab except for B1-L11
Chip Map of EAST (Commissioning in Run )
Pulse Test (sent pulse to col10 and 20)
Good Chip
50% Dead Chip
100% Dead Chip 50
CNT acceptance
 LADDER
SPIRO
EAST
North
South 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 25
Barrel 0
B0-L5 72 39
B0-L6 73
B0-L7 74 23 69
B0-L8 76 19 68
B0-L9 77
18  32
Barrel 1
B1-L10 21 30 54
B1-L11 62 33
B1-L12 22 31 52
B1-L13 63 70
B1-L14 24 27 50
B1-L15 64 35
B1-:16 26 43
B1-L17 65
 14 36
 B1-L18
 21 42
 B1-L19 66
No Change from a test at Chemistry Lab except for B1-L11
current of B1-L11 is less than 2A before and after initialization of read out chips.
Ordinal current consumption of ladder is from 3 to 4A.

6. What we have done at commissioning
Optimization of operation parameters for all readout chip.
Making of mask file to mask noise pixels.
Threshold scan with noise trigger.
Setting of threshold level.
Noise level is < 0.1%
Noise level for most of readout chips is < 0.01%

7. Hit Map of Barrel 0 (Zero Field RUN402340-0000)
low rate
SOUTH
NORTH
WEST
The efficiency of B0-L8-South is quite low.
Bias voltage for sensor modules of B0-L8-S was applied and we could see leak current.  Not bias issue.
Need to check the response from test pulse by changing some setting values on Wed.
NORTH
SOUTH
EAST

8. Hit Map of Barrel 1 (Zero Field RUN402340-0000)
We will check some operation parameters for ladders whose efficiency is low.
low rate
WEST
EAST
Connector of bias cable were broken
 Fixed
LV is OFF

9. BBCZ vs VTXZ (RUN402336-0000-0004 336k events)
Reconstructed with VTX standalone
bbcz vs vtxz
bbc_z (cm)
vtx_y (cm)
vtx_z (cm)
vtx_x (cm)
vtx_x (cm)
Mean = -0.2
vtx_z-bbc_z (cm)
Event Sequence

10. Event Number Dependence of Mean Multiplicity (VTXS)
Sampling Event Number
ADC sum is dropping around 10k events.
X vertex is correlated with the dropping mean multiplicity of VTXS.
Strip group is now working on this readout issue.
GTM file was updated.
The issue is supposed to be fixed.

11. Cluster Number vs bbc q(RUN402389-0000-0004 645k events)
VTXP-B0
VTXP-B1
number of cluster (B0)
number of cluster (B1)
bbcq
bbcq
VTXS-B2
VTXS-B3
number of cluster (B2)
number of cluster (B3)
bbcq
bbcq

12. Summary 15 GeV AuAu run started. VTXP is working.
Operation parameters were optimized.
There are no additional dead area except for one ladder (B1-L11)
We have a read out issue for VTXS.
The issue is supposed to be fixed today.

13. BACK UP SLIDES

14. Hit Rate chip by chip (RUN14 – Zero Field RUN402340)
Hit rate is decreased to half for B0-WEST.
B0-WEST B0-EAST B1-WEST B1-EAST
average hit rate
hit rate = 0 is removed for a average calculation
Hit Rate (hit / chip / total event)
1.3
0.9
0.4
0.3
Chip Number

15. (Noise counts/chip) / (Total Number of Events (100k))
Noise-pixel-rate/chip is less than 0.1%
B1-L5 chip8 and 9
B0-West B0-East B1-West B1-East
1 count / chip / 100k events

16. Leave B1-L5-chip8 and 9 chip0 chip1 chip2 chip3
Hit/Total events
Threshold DACs
chip chip5 chip chip7
Threshold level 1/3 x MIP (electrons)
B1-L5 chip8 and 9
There exist unstable pixels.
chip chip9 chip chip11
chip chip13 chip chip15
Probably unstable pixels cannot be removed with threshold
Keep threshold level as 170

17. Cluster Number vs bbc q(RUN402389-0000-0004 645k events)
VTXP-B0
VTXP-B1
Number of Clusters (EAST B0)
Number of Clusters (EAST B0)
Number of Clusters (WEST B0)
Number of Clusters (WEST B0)
VTXS-B2
VTXS-B3
Number of Clusters (EAST B0)
Number of Clusters (EAST B0)
Number of Clusters (WEST B0)
Number of Clusters (WEST B0)