1. Radiant Technologies, Inc. March 29, 2018
The Radiant D2850C Multiplexer and 8-Position High Temperature Test Fixture for at-Temperature Testing
Radiant Technologies, Inc.
March 29, 2018

2. Summary
This document describes the function and features of Radiant’s D2850C multiplexer. The unit mounts to the side or on the door of lab ovens, a Delta chamber, or other hot/cold temperature chambers to allow Vision to stress and test multiple capacitors simultaneously in the chamber.

3. D2850 Multiplexer
The Radiant D2850C Multiplexer provides an interface between a Precision Materials Analyzer and multiple capacitors under test inside a thermal chamber or oven.
The multiplexer has two banks of 8 relays electrically isolated from each other with an SMA connector for each relay on the bottom of the enclosure.
The unit can be controlled either by I2C from a tester or directly by USB without a tester.
Vision can control all channels individually as well as measure the chamber temperature with an embedded Type-T thermocouple.
Each channel is rated to 500 volts.

5. Instrument Connectors
I2C or
USB
Instrument Connectors
Sample Connectors
Internal Controller 16
Type-T Thermocouple

6. Any combination of relays from both banks may be set from QuikLook or inside a Test Definition during execution.
The Mux Control Task may also be configured to cycle through the channels inside a Vision Branch Loop.

7. The reading of the Type-T thermocouple is accessed through the Read Temperature Task available in the Vision Library.

8. Multiplexer Specifications
2 isolated 8x1 multiplexors
500V maximum per channel
7.4pF parasitic capacitance per room temperature
Integrated T-type thermocouple controller
USB or I2C control
Fully integrated with the Vision Operating System
May operate with or without a Radiant tester attached
Fits on the door of multiple oven and temperature chamber models.

9. 8-Position High Temperature Sample Holder
Radiant offers a Teflon/Nickel high voltage test fixture suitable for use in ovens up to 230C.
The fixture will mount on a shelf inside the door of a Delta chamber or lab oven and connect with the D2850 Multiplexer through the door.
This image is of the HT 8xHT Fixture mounted on the inside of the door for a Delta 2850C Temperature Chamber with the D2850 Multiplexer mounted to the door’s front face.

10. Built-in Thermocouple.
Disk samples are held in place by spring-loaded nickel plungers over nickel bottom plates.
A twist-lock system will hold the plunger above the sample for loading.
A Type T thermocouple is attached to the bottom nickel plate of position 1.
Radiant provides a mounting shelf compatible with the fixture for mounting inside chamber doors.

11. Sample Fixture Specifications
Eight sample positions accessible independently through the D2850 under Vision control.
500V maximum voltage rating
230C maximum temperature rating.
7.4pF parasitic capacitance per room temperature
Integrated T-type thermocouple accessible to Vision
Mechanical load/unload locks
Nickel contact surfaces

12. Complexity of Test
The Vision Library contains multiple tasks that enable the user to create custom Test Definitions to conduct hysteresis, pulse, small signal capacitance, and leakage tests simultaneously on multiple capacitors in a temperature chamber over a custom temperature profile stretching for days or weeks.
Applications:
Incoming Inspection
Quality Assurance
Time-to-Failure Testing
Process Control

13. Quality Assurance Testing
Vision controls an Agilent and a Wayne-Kerr LCR meter.
The D2850C coupled to an Agilent or Wayne-Kerr LCR meter where both are controlled from Vision allows the creation and execution of classic PZT and PMN-PT product qualification or quality assurance tests profiles.
Radiant’s new Precision pMEMS tester with built-in LCR impedance measurement capability will be compatible with the D2850 Multiplexer.

14. Test Regime
Connecting a Radiant Precision tester or an commercial LCR meter to the D2850 Multiplexer and its HV fixture allows the following tests of up to eight samples in parallel over a range of computer-controlled temperatures up to 230C:
Hysteresis, PUND, Leakage, IV, and CV up to 500V
Retention, Ageing, Imprint, Fatigue of ferroelectric or dielectric properties versus temperature and time-on-shelf.
Impedance capacitance and impedance tan  versus temperature
HV poling up to 500V and 230C.
Lot uniformity and yield vs temperature.
Product assurance.
Periodic lifetime quality assessments over temperature.