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Published byCandace Summers Modified over 6 years ago
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: (a) Schematic illustration of the experimental setup for scanning Joule expansion microscopy imaging of an SWNT device, and (b) the SJEM image of an SWNT device collected at Vds=4 V, f=30 kHz and a PMMA thickness ∼25 nm
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: Schematic illustration of the analytically modeled system
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: Schematic illustration of the thermomechanical model
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: Surface temperature distribution along the cross sections given by the analytical model of the accurate and approximate solutions and the FEA for the power density Q0=1 W/m at f=30 kHz
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: Expansion profiles along the cross sections given by the analytical model of the accurate and approximate solutions and the FEA with the power density determined as Q0=7.7 W/m at f=30 kHz
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Date of download: 3/4/2018 Copyright © ASME. All rights reserved. From: Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices J. Appl. Mech. 2013;80(4): doi: / Figure Legend: The normalized FWHM (FWHM/r) versus the normalized PMMA thickness (h0/r) at different normalized SiO2 thicknesses (h1/r)
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