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The Making of The Perfect MOSFET

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Presentation on theme: "The Making of The Perfect MOSFET"— Presentation transcript:

1 The Making of The Perfect MOSFET
Alan Elbanhawy Fairchild Semiconductor PESC June 21, 2006

2 Outline MOSFET Components Silicon Losses Packaging Related losses
Gate Driver Losses Integration and Design Optimization Conclusion

3 MOSFET Components Silicon Package Gate Driver Conduction Losses
Dynamic Losses Distributed Parameters Effects, Rg Shoot Through Reverse Recovery Losses Price Rise and Fall Times Sink and Source Currents Source Resistance Parasitic Inductances Thermal Resistance Footprint Price Package Parasitic Inductances Parasitic Resistances Skin Effect Thermal Resistance Footprint Price

4 Optimum Range for RDS(ON)
Conduction Losses Optimum Range for RDS(ON) Optimum on Resistance RDS(ON) as a function of load current and input voltage for the top MOSFET Power dissipation as a function of the on resistance RDS(ON) and the load current

5 Distributed and segmented parameters model
MOSFET Outlines Gate lead

6 Effect of distributed Rg-Cgs and die current Density
The first and last segment currents for different combinations of Rg and Cgs Gate voltage and drain currents at different Segments Vgth Uneven Power dissipation across the die during turn on!

7 Effect of Rg on Current Rise Time
Clearly tri = Rg*Cgs*Constant. This equation shows that the current rise time is directly proportional to Rg*Cgs which dictates that both parameters must be minimized for better performance Current Fall time, tif Current Rise time, tri

8 Effect of Rg on MOSFET Vds Rise and Fall Times
VDS Fall time VDS Rise time

9 Lab Verification, tri, trv
Vds Rise time Vds Rise time Rg = 0 Ohm, Current Rise time Rg=4.7 Ohm, Current rise time

10 Shoot Through in Synchronous Buck Converter
Conduction Losses Dynamic Losses Distributed Parameters Effects, Rg Shoot Through Reverse Recovery Losses Price

11 Distributed Parameters Model Solution, Voltages and Currents
Gate Threshold Voltage Segments Currents Gate-Source Voltage Segments gate-source voltage Segment Instantaneous Power

12 Distributed Rg Influence on Shoot Through Current
Drain Current Gate threshold Voltage Gate-Source Voltage

13 Distributed CGD Influence on Shoot Through Current
Drain current Gate threshold voltage Vgth Gate to source voltage

14 Distributed CGS Influence on Shoot Through Current
Drain Current Gate threshold Voltage Gate-Source Voltage

15 Lumped parameters Model with Parasitics
Full parasitic model Added source and gate inductances only Simple model

16 Loop Inductance Effects on Shoot Through

17 Loop Inductance Effects on Reverse Recovery
Loop Inductance 0nH – 10nH

18 Source Inductance Effects
Parasitics, Current rise and fall times Fall time as a function of the Source inductance Ls and Load Current IL Vgth=1.5, gm=30 Parasitics, Current sharing

19 Source Inductance Effects
Low Drain Current High Drain Current Fall time Rise time Power Dissipation

20 Parasitic Resistance and Skin Effect
The Fourier series for a square wave for n=20 and n=200 Square wave Frequency Spectrum Square wave synthesis

21 Package Effects, Parasitics and Skin Effects
BGA Parasitic resistance as a function of frequency

22 Skin Effect and Power Loss for HS MOSFET
SO8 Package Conduction loss (z-axes) as a function of the fundamental switching frequency f and the silicon on-resistance for an The percentage error (z-axes) as a function of the switching frequency f and the silicon on-resistance for a BGA 5 x 5.5 mm Package

23 Package Thermals Power Ball Grid Array BGA package is an example of the modern packages to address all the requirements of high frequency and high power densities modern DC-DC converters JC = 0.46 C/W Heat sinking from the top of the package Very low footprint and profile

24 Gate Driver Influence on Losses
Rg = 2 Rg = 6 Uneven current distribution Rg = 4 Rise Time Rg = 6 Rg = 2 Optimum gate Drive voltage Rg = 4 Fall Time

25 Current as a function of L and time
Parasitic Drain Inductance Effects Vdrain Iind Ls is PCB trace and package inductance, Cp is MOSFET Coss and stray capacitance For tr & tf >> tres : Overstress voltage = Power Dissipation = For 20A, 10nH, 1nF and 1MHz: Overstress voltage = 60Volt Power Dissipation =4W = 4 Current as a function of L and time

26 Gate Driver Influence on Losses
Why match MOSFETs and gate drivers? Use one VRM board with three different drivers All MOSFETs, Inductors and Filter capacitors are identical in all three cases The very same PCB The same test setup and test condition on an ATE How will the efficiency curves be different?

27 Current Density (A/m^2) Current Density (A/m^2)
Integration and Design Optimization Current Density (A/m^2) Top MOSFET On Current Density (A/m^2) Bottom MOSFETs On

28 Conclusion The pursuit of the perfect MOSFET must be launched simultaneously on three fronts, silicon, package and gate driver. The optimization of the MOSFET parameters requires an extremely careful consideration of the individual parameter and its effect on all the loss mechanisms in a given power MOSFET and all of these in conjunction with each other and the effect of a given combination of these parameters on the overall performance of the device in the intended application which in our case is a synchronous buck converter

29 Thanks for your attention
Questions?


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