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Date of download: 10/7/2017 Copyright © ASME. All rights reserved.

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Presentation on theme: "Date of download: 10/7/2017 Copyright © ASME. All rights reserved."— Presentation transcript:

1 Date of download: 10/7/2017 Copyright © ASME. All rights reserved. From: Study on Microgratings Using Imaging, Spectroscopic, and Fourier Lens Scatterometry J. Micro Nano-Manuf. 2017;5(3): doi: / Figure Legend: BRDF measurements obtained with the Fourier lens system at a wavelength of 550 nm: (a) 1D grating with a pitch of 4 μm and a height of around 500 nm and (b) quadratic 2D grating with a pitch of 2 μm. The different diffraction orders are indicated. The parasitic light arises from multiple reflections in the optics and is avoided in the data analysis.


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